Abstract: An imaging system with real-time digital testing capabilities verifies the functionality of image processing circuitry used to process pixel data signals read out from a pixel array during imaging operations. Image processing circuitry may process a data frame read from an imaging array that includes multiple regions of imaging and non-imaging data. Digital test patterns may be generated to test the functionality of specific image processing blocks. Test patterns may correspond to or represent imaging data or non-imaging data from regions of the output readout frame. A checksum generator generates a test pattern checksum for output of a subset of the image processing blocks that were provided with a given test pattern. The test pattern checksum may be compared to a predetermined checksum of the output of properly functioning image processing blocks provided with test patterns equivalent to the given test pattern.

Abstract: An imaging system with real-time digital testing capabilities verifies the functionality of image processing circuitry used to process pixel data signals read out from a pixel array during imaging operations. Image processing circuitry may process a data frame read from an imaging array that includes multiple regions of imaging and non-imaging data. Digital test patterns may be generated to test the functionality of specific image processing blocks. Test patterns may correspond to or represent imaging data or non-imaging data from regions of the output readout frame. A checksum generator generates a test pattern checksum for output of a subset of the image processing blocks that were provided with a given test pattern. The test pattern checksum may be compared to a predetermined checksum of the output of properly functioning image processing blocks provided with test patterns equivalent to the given test pattern.

Abstract: Disclosed are various embodiments of methods and corresponding devices for effecting such methods that permit integrated circuits, sensors, chips or dies to be identified. Imperfections or irregularities in pixels or memory cells are used to generate identification codes for integrated circuits, sensors, chips or dies. Addresses or data locations of selected defective pixels or memory cells may be used to generate such identification codes.

Abstract: A method for compensating for dark current in an image sensor array. In a representative embodiments, the method includes determining a nominal average dark current for the image sensor array, determining location of each pixel in the image sensor array, obtaining a nominal dark current associated with each pixel based on the nominal average dark current and on the location of the pixel, and subtracting the associated nominal dark current from the image signal for each pixel. At least two of the pixels have differing associated nominal dark currents. In other representative embodiments compensation values for dark currents and for differences in channel processing are determined during the same time period.

Abstract: A system and method for generating dynamically modifiable timing control signals. Timing waveforms can be changed, for each phase of control, by changing the contents of memory locations and start/stop indices. Parallel signals are generated from the output of the memory locations. The memory locations are accessed in a user-selected order by an index value. This technique of generating timing waveforms, and thus control signals, can be applied to, for example, pixel array development.

Abstract: An image sensor device is provided that has an uncovered imaging array of pixels and a covered global reference non-imaging array of pixels. The pixel samples of the global reference non-imaging array are used to remove noise from the pixel samples of the imaging array. The control signals and control lines that are used to sample the pixels of the imaging array are separate from and independent of the control signals and control lines that are used to sample the pixels of the global reference non-imaging array of pixels. For each row of pixels of the imaging array that is sampled, the same row of pixels of the global reference non-imaging array is sampled. The global reference row has no or very few offsets or variations to ensure that noise removal is performed effectively.

Abstract: An imaging system implements digital correlated double sampling (CDS) using dual channels. One channel converts reset voltages from pixel sensors to digital reset values, while the other channel converts integrated voltages from pixel sensors to digital integrated values. Timing of an imaging process with digital CDS can accordingly be the same as the timing for an imaging process without digital CDS, regardless of the length of the exposure time. Accordingly, the imaging time and the frame rate for moving images do not suffer when digital CDS is used to improve image quality.

Abstract: An image sensor device is provided that has an uncovered imaging array of pixels and a covered global reference non-imaging array of pixels. The pixel samples of the global reference non-imaging array are used to remove noise from the pixel samples of the imaging array. The control signals and control lines that are used to sample the pixels of the imaging array are separate from and independent of the control signals and control lines that are used to sample the pixels of the global reference non-imaging array of pixels. For each row of pixels of the imaging array that is sampled, the same row of pixels of the global reference non-imaging array is sampled. The global reference row has no or very few offsets or variations to ensure that noise removal is performed effectively.