Patents by Inventor Yan-Yang HSU

Yan-Yang HSU has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Optical tomography imaging system and imaging method for generating a reconstructed image according to plural disassembled sine waves
    Patent number: 11307088
    Abstract: An optical tomography imaging system includes a signal generator, at least one light emitter, at least one light receiver, a signal processor, and an image processor. The signal generator is configured to generate a periodic signal and a reference signal. The light emitter is configured to be activated by the periodic signal to generate an optical signal passing through an object under test. The light receiver is configured to receive and convert the optical signal passing through the object under test into an electrical signal. The signal processor is configured to generate a comparison signal according to the electrical signal and the reference signal. The image processor is configured to acquire a plurality of disassembled sine waves from the comparison signal and generate a reconstructed image according to the disassembled sine waves.
    Type: Grant
    Filed: November 27, 2019
    Date of Patent: April 19, 2022
    Assignees: National Central University
    Inventors: Min-Chun Pan, Ya-Fen Hsu, Yan-Yang Hsu
  • OPTICAL TOMOGRAPHY IMAGING SYSTEM AND IMAGING METHOD
    Publication number: 20210156738
    Abstract: An optical tomography imaging system includes a signal generator, at least one light emitter, at least one light receiver, a signal processor, and an image processor. The signal generator is configured to generate a periodic signal and a reference signal. The light emitter is configured to be activated by the periodic signal to generate an optical signal passing through an object under test. The light receiver is configured to receive and convert the optical signal passing through the object under test into an electrical signal. The signal processor is configured to generate a comparison signal according to the electrical signal and the reference signal. The image processor is configured to acquire a plurality of disassembled sine waves from the comparison signal and generate a reconstructed image according to the disassembled sine waves.
    Type: Application
    Filed: November 27, 2019
    Publication date: May 27, 2021
    Inventors: Min-Chun PAN, Ya-Fen HSU, Yan-Yang HSU