Patents by Inventor Yana Zhang Williams

Yana Zhang Williams has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8797395
    Abstract: An automated system for inspecting a porous substrate using a sample, comprising, a delivery device positioned to apply the sample to a target point on the porous substrate along a sample axis; an imaging device and one or more lenses, positioned so that the imaging device and the lens each has a focus axis that is offset from the sample axis, and have a viewing focal point that is substantially the same as the target point; a light source that is offset from the delivery device to illuminate the surface target; and a processor comprising a data acquisition and control system that coordinates timing and automation of the delivery and imaging devices, and determines one or more characteristics of the porous substrate.
    Type: Grant
    Filed: December 17, 2010
    Date of Patent: August 5, 2014
    Assignee: General Electric Company
    Inventors: Kevin George Harding, Yana Zhang Williams, Esmaeil Heidari
  • Patent number: 8643849
    Abstract: A measurement system comprising a light source unit, a projection unit and an optics unit is disclosed. The light source unit is configured to generate a plurality of modulated phase shifted light beams. The projection unit is configured to reflect the modulated phase shifted light beams onto an object surface. The optics unit is configured to capture the modulated phase shifted light beams from the object surface. The measurement system further comprises a photodetector and a processor. The photodetector is configured to receive the modulated phase shifted light beams from the optics unit to generate electrical signals. The processor is configured to retrieve position information of the object surface based on the electrical signals from the photodetector. A measurement method is also presented.
    Type: Grant
    Filed: December 6, 2011
    Date of Patent: February 4, 2014
    Assignee: General Electric Company
    Inventors: Li Tao, Guiju Song, Xinjun Wan, Kevin George Harding, Steven Robert Hayashi, James Joseph Hoffman, Charles Walter Muekmore, Yana Zhang Williams, Shukuan Xu
  • Publication number: 20120154560
    Abstract: An automated system for inspecting a porous substrate using a sample, comprising, a delivery device positioned to apply the sample to a target point on the porous substrate along a sample axis; an imaging device and one or more lenses, positioned so that the imaging device and the lens each has a focus axis that is offset from the sample axis, and have a viewing focal point that is substantially the same as the target point; a light source that is offset from the delivery device to illuminate the surface target; and a processor comprising a data acquisition and control system that coordinates timing and automation of the delivery and imaging devices, and determines one or more characteristics of the porous substrate.
    Type: Application
    Filed: December 17, 2010
    Publication date: June 21, 2012
    Applicant: GENERAL ELECTRIC COMPANY
    Inventors: Kevin George Harding, Yana Zhang Williams, Esmaeil Heidari
  • Publication number: 20120147383
    Abstract: A measurement system comprising a light source unit, a projection unit and an optics unit is disclosed. The light source unit is configured to generate a plurality of modulated phase shifted light beams. The projection unit is configured to reflect the modulated phase shifted light beams onto an object surface. The optics unit is configured to capture the modulated phase shifted light beams from the object surface. The measurement system further comprises a photodetector and a processor. The photodetector is configured to receive the modulated phase shifted light beams from the optics unit to generate electrical signals. The processor is configured to retrieve position information of the object surface based on the electrical signals from the photodetector. A measurement method is also presented.
    Type: Application
    Filed: December 6, 2011
    Publication date: June 14, 2012
    Inventors: Li TAO, Guiju Song, Xinjun Wan, Kevin George Harding, Steven Robert Hayashi, James Joseph Hoffman, Charles Walter Muekmore, Yana Zhang Williams, Shukuan Xu