Abstract: The disclosure provides systems and methods for conducting and managing integrated laboratory experiments. The system includes a variety of laboratory instruments that are connected to conduct a large number of different types of experiments, and an interface for a user to design experiments and adjust parameters for the experiments. Given the integration, the system can further take data from related samples and instruments for determining or adjusting certain experimental parameters for optimized experimental efficiency and results.

Abstract: The disclosure provides systems and methods for data analysis of experimental data. The analysis can include reference data that are not directly generated from the present experiment, which reference data may be values of the experimental parameters that were either provided by a user, computed by the system with input from a user, or computed by the system without using any input from a user. Another example of such reference data may be information about the instrument, such as the calibration method of the instrument.

Abstract: The disclosure provides systems and methods for data analysis of experimental data. The analysis can include reference data that are not directly generated from the present experiment, which reference data may be values of the experimental parameters that were either provided by a user, computed by the system with input from a user, or computed by the system without using any input from a user. Another example of such reference data may be information about the instrument, such as the calibration method of the instrument.

Abstract: The disclosure provides systems and methods for conducting and managing integrated laboratory experiments. The system includes a variety of laboratory instruments that are connected to conduct a large number of different types of experiments, and an interface for a user to design experiments and adjust parameters for the experiments. Given the integration, the system can further take data from related samples and instruments for determining or adjusting certain experimental parameters for optimized experimental efficiency and results.

Abstract: The disclosure provides systems and methods for conducting and managing integrated laboratory experiments. The system includes a variety of laboratory instruments that are connected to conduct a large number of different types of experiments, and an interface for a user to design experiments and adjust parameters for the experiments. Given the integration, the system can further take data from related samples and instruments for determining or adjusting certain experimental parameters for optimized experimental efficiency and results.

Abstract: A thermally conductive polyamide compound is disclosed. The compound comprises a polyamide matrix, boron nitride, and a laser direct structuring additive dispersed in the matrix. The compound can be extruded, molded, calendered, thermoformed, or 3D-printed into a heat dissipating and laser direct structured article.

Abstract: The disclosure provides systems and methods for conducting and managing integrated laboratory experiments. The system includes a variety of laboratory instruments that are connected to conduct a large number of different types of experiments, and an interface for a user to design experiments and adjust parameters for the experiments. Given the integration, the system can further take data from related samples and instruments for determining or adjusting certain experimental parameters for optimized experimental efficiency and results.

Abstract: The disclosure provides systems and methods for data analysis of experimental data. The analysis can include reference data that are not directly generated from the present experiment, which reference data may be values of the experimental parameters that were either provided by a user, computed by the system with input from a user, or computed by the system without using any input from a user. Another example of such reference data may be information about the instrument, such as the calibration method of the instrument.

Abstract: A thermally conductive polyamide compound is disclosed. The compound comprises a polyamide matrix, boron nitride, and a laser direct structuring additive dispersed in the matrix. The compound can be extruded, molded, calendered, thermoformed, or 3D-printed into a heat dissipating and laser direct structured article.

Abstract: A light-emitting diode (LED) lighting device includes a cover member that is configured to expose a protruding portion of a connection terminal when pressure is applied to the cover member and to cover the protruding portion of the connection terminal when the pressure is removed. Thus, an electric and/or mechanical safety problem caused by the connection terminal that is exposed to the outside may be reduced.

Abstract: Described herein are polymers comprising a polyester and at least one polyhedral oligomeric silsesquioxane, wherein the polyester is capable of forming a stereocomplex with a polymer comprising a complimentary polyester and composites thereof.

Abstract: A method of manufacturing a power supply unit (PSU) is provided. The method includes providing at least one PSU supplying a dimming signal to at least one light source, performing a first test for electrical characteristics of the at least one PSU, detecting light emitted from the at least one light source, measuring a flicker of the at least one light source, and performing a second test for a state of the at least one PSU based on a flicker measurement result, and packing a PSU determined to be in a normal state among the at least one PSU, as a result of the first test and the second test.

Abstract: A test apparatus for a power supply unit is provided, which includes a body unit configured to define a space to receive a light emitting diode (LED) and to provide a test environment to test a supply state of power applied to the LED; and a test unit mounted in the body unit to face the LED and configured to detect flicker of the LED occurring when a power supply is abnormal. According to the foregoing structure, power supply with respect to the LED may be regularly detected and analyzed, thereby increasing quality of power supply with respect to the LED.

Abstract: A method of manufacturing a power supply unit (PSU) is provided. The method includes providing at least one PSU supplying a dimming signal to at least one light source, performing a first test for electrical characteristics of the at least one PSU, detecting light emitted from the at least one light source, measuring a flicker of the at least one light source, and performing a second test for a state of the at least one PSU based on a flicker measurement result, and packing a PSU determined to be in a normal state among the at least one PSU, as a result of the first test and the second test.

Abstract: A method of manufacturing a power supply unit (PSU) is provided. The method includes providing at least one PSU supplying a dimming signal to at least one light source, performing a first test for electrical characteristics of the at least one PSU, detecting light emitted from the at least one light source, measuring a flicker of the at least one light source, and performing a second test for a state of the at least one PSU based on a flicker measurement result, and packing a PSU determined to be in a normal state among the at least one PSU, as a result of the first test and the second test.

Abstract: A power supply apparatus, an apparatus, and a method of supplying power are provided. The power supply apparatus including a high voltage generating unit, which generates one or more output voltages by using an input voltage, and which is implemented as a chip. The one or more output terminals are on a same circuit board as the high voltage generating unit, to output the generated one or more output voltages. The chip includes a transforming unit to transform the input voltage into one or more transformed voltages that are different from one another, and a rectifying unit to rectify the transformed voltages into rectified voltages, and to determine the rectified voltages as the generated one or more output voltages.

Abstract: A power supply apparatus, an apparatus, and a method of supplying power are provided. The power supply apparatus including a high voltage generating unit, which generates one or more output voltages by using an input voltage, and which is implemented as a chip. The one or more output terminals are on a same circuit board as the high voltage generating unit, to output the generated one or more output voltages. The chip includes a transforming unit to transform the input voltage into one or more transformed voltages that are different from one another, and a rectifying unit to rectify the transformed voltages into rectified voltages, and to determine the rectified voltages as the generated one or more output voltages.

Abstract: A high voltage power supply apparatus comprising a first circuit disposed on a prepared substrate, and for receiving a first voltage and generating a second voltage that is previously set according to the first voltage, and a second circuit for amplifying and rectifying the second voltage to generate a plurality of high voltage signals, wherein the first circuit and the second circuit are embodied as a single module, wherein at least a portion of the single module is surrounded by an insulator.

Abstract: In a provided power supply unit, a plurality of circuit elements are integrated into a chip, wherein the circuit elements generate one or more output voltages by using an input voltage. Thus, although the number of voltages, which can be generated by the power supply apparatus, is remarkably large, the power supply apparatus can be miniaturized. In addition, an apparatus, in which the power supply apparatus is installed, can be miniaturized.

Abstract: A test apparatus for a power supply unit is provided, which includes a body unit configured to define a space to receive a light emitting diode (LED) and to provide a test environment to test a supply state of power applied to the LED; and a test unit mounted in the body unit to face the LED and configured to detect flicker of the LED occurring when a power supply is abnormal. According to the foregoing structure, power supply with respect to the LED may be regularly detected and analyzed, thereby increasing quality of power supply with respect to the LED.