Abstract: A sensor is provided, including a substrate, a chip and a sensing element. The substrate has a plate-like shape and includes a surface and an interconnect structure disposed in the substrate. The chip is embedded in the substrate and is electrically connected to the interconnect structure. The sensing element is disposed on the surface of the substrate, and is electrically connected to the chip through the interconnect structure.

Abstract: An antennas-in-package (AiP) verification board is provided, which includes a carrier board configured for disposing an antenna array or an electronic circuit; and a plurality of SMPM connectors. The plurality of SMPM connectors are arranged in an array on the carrier board and electrically connected with the antenna array or the electronic circuit of the carrier board for testing the characteristics of the antenna array on the carrier board or the characteristics of the electronic circuit on the carrier board. The AiP verification board is fixed on a beamforming test platform. In addition to the aforementioned AiP verification board, an AiP verification board including a plurality of adaptor structures and an AiP verification board including a plurality of connectors and a plurality of adaptor structures are also provided.

Abstract: Provided is a rapid over-the-air (OTA) production line test platform, including a device under test (DUT), an antenna array and two reflecting plates. The DUT has a beamforming function. The antenna array is arranged opposite to the DUT, and emits beams with beamforming. Two reflecting plates are disposed opposite to each other, and are arranged between the DUT and the antenna array. The beam OTA test of the DUT is carried out by propagation of the beams between the antenna array, the DUT and the two reflecting plates. Accordingly, the test time can be greatly shortened and the cost of test can be effectively reduced. In addition to the above-mentioned rapid OTA production line test platform, platforms for performing the OTA production line test by using horn antenna arrays together with bending waveguides and using a 3D elliptic curve are also provided.

Abstract: The disclosure provides an ultra-wideband non-metal horn antenna, which includes three combinable non-metal elements such as an impedance matching member, a field adjustment member and an outer cover member. The impedance matching member and the field adjustment member are respectively disposed with a first and second groove structures. The field adjustment member is connected between the impedance matching member and the outer cover member. Therefore, the horn antenna of the disclosure can have a more symmetrical radiation pattern, a smaller antenna size, and ultra-wideband performance.

Abstract: An apparatus for use in an automated optical inspection in a production line, the apparatus including a frame accommodating a plurality of illumination units surrounding an integrated optical imaging unit, wherein each illumination unit is rotatable in a synchronized manner relative to each unit, in use, to vary an illumination angle at an intended target, to enhance the visualization of the intended target captured by the optical imaging unit.

Abstract: A device includes a first semiconductor fin, a second semiconductor fin, a source/drain epitaxial structure, a semiconductive cap, and a contact. The first semiconductor fin and the second semiconductor fin are over a substrate. The source/drain epitaxial structure is connected to the first semiconductor fin and the second semiconductor fin. The source/drain epitaxial structure includes a first protruding portion and a second protruding portion aligned with the first semiconductor fin and the second semiconductor fin, respectively. The semiconductive cap is on and in contact with the first protruding portion and the second protruding portion. A top surface of the semiconductive cap is lower than a top surface of the first protruding portion of the source/drain epitaxial structure. The contact is electrically connected to the source/drain epitaxial structure and covers the semiconductive cap.

Abstract: An optical and electrical hybrid beamforming transmitter, receiver, and signal processing method are provided. The transmitter includes, but is not limited to, two photoelectric converters, two adjusting circuits, and an antenna array. The photoelectric converter converts an optical signal into an initial electric signal, respectively. The adjusting circuit is coupled to the photoelectric converter, and are adapted for delaying the initial electric signal according to an expected beam pattern formed by the antenna array, respectively, to output an adjusted electric signal. The antenna array includes two antennas that are coupled to the adjusting circuit. The antenna radiates electromagnetic wave according to the adjusted electric signal. Accordingly, a phase of the signal may be adjusted, and the number of the elements may be reduced.

Abstract: A measuring-robot device for fully mechanized coal mining faces and an automatic measuring system are provided. The measuring robot includes a suspension cage, a total station, a prism and an industrial computer. Firstly, the suspension cage with automatic leveling function is fixed on the top beam of a hydraulic support, then the total station and the industrial computer are fixed in the suspension cage, and finally the prism with a plug connector is installed under the base of the total station, forming a measuring-robot device. According to the fluctuations of the fully mechanized coal mining face, several measuring robots will be deployed along the fully mechanized coal mining face, and the adjacent measuring robots are line of sight to each other, forming the automatic measuring system covering the fully mechanized coal mining.

Abstract: A method includes etching a semiconductor substrate to form a plurality of semiconductor fins. The semiconductor fins are etched to form a recess. An epitaxy structure is grown in the recess. The epitaxy structure has a W-shape cross section. A capping layer is formed over the epitaxy structure. The capping layer is at least conformal to a sidewall of the epitaxy structure. The capping layer is etched to expose a top surface of the epitaxy structure. A first portion of the capping layer remains over the sidewall of the epitaxy structure after etching the capping layer. A contact is formed in contact with the exposed top surface of the epitaxy structure and the first portion of the capping layer.

Abstract: A measuring-robot device for fully mechanized coal mining faces and an automatic measuring system are provided. The measuring robot includes a suspension cage, a total station, a prism and an industrial computer. Firstly, the suspension cage with automatic leveling function is fixed on the top beam of a hydraulic support, then the total station and the industrial computer are fixed in the suspension cage, and finally the prism with a plug connector is installed under the base of the total station, forming a measuring-robot device. According to the fluctuations of the fully mechanized coal mining face, several measuring robots will be deployed along the fully mechanized coal mining face, and the adjacent measuring robots are line of sight to each other, forming the automatic measuring system covering the fully mechanized coal mining.

Abstract: An optical and electrical hybrid beamforming transmitter, receiver, and signal processing method are provided. The transmitter includes, but is not limited to, two photoelectric converters, two adjusting circuits, and an antenna array. The photoelectric converter converts an optical signal into an initial electric signal, respectively. The adjusting circuit is coupled to the photoelectric converter, and are adapted for delaying the initial electric signal according to an expected beam pattern formed by the antenna array, respectively, to output an adjusted electric signal. The antenna array includes two antennas that are coupled to the adjusting circuit. The antenna radiates electromagnetic wave according to the adjusted electric signal. Accordingly, a phase of the signal may be adjusted, and the number of the elements may be reduced.

Abstract: A broadband linear polarization antenna structure, including a reference conductive layer, a first patch antenna, a second patch antenna, and a feeding portion, is provided. The reference conductive layer includes through holes. A first short pin is connected between the reference conductive layer and the first patch antenna, and a second short pin is connected between the first patch antenna and the second patch antenna. Each feeding portion penetrates the reference conductive layer through the through hole and is coupled to the first patch antenna.

Abstract: The disclosure provides a coplanar inductor, which includes a first spiral arm, a second spiral arm and a conductive patch. The first spiral arm has a first end and a second end, wherein the first spiral arm spirally extends from the first end of the first spiral arm toward the second end of the first spiral arm from inside to outside. The second spiral arm has a first end and a second end. The second spiral arm extends spirally from the first end of the second spiral arm toward the second end of the second spiral arm from inside to outside. The first end of the second spiral arm is coupled to the first end of the first spiral arm through the conductive patch, and the first spiral arm and the second spiral arm are coplanar.

Abstract: The disclosure provides an ultra-wideband non-metal horn antenna, which includes three combinable non-metal elements such as an impedance matching member, a field adjustment member and an outer cover member. The impedance matching member and the field adjustment member are respectively disposed with a first and second groove structures. The field adjustment member is connected between the impedance matching member and the outer cover member. Therefore, the horn antenna of the disclosure can have a more symmetrical radiation pattern, a smaller antenna size, and ultra-wideband performance.

Abstract: A transition structure for millimeter wave is provided. The transition structure includes a first layer signal element coupled to an end of a first transmission line and a plurality of first layer ground elements surrounding the end of the first transmission line equidistantly from the end of the first transmission line and disposed along two opposite sides of a strip body of the first transmission line equidistantly from the strip body of the first transmission line. The transition structure further includes an intermediate layer signal element coupled to the first layer signal element and a plurality of intermediate layer ground elements surrounding the intermediate layer signal element quasi-coaxially. A multilayer transition structure including a multilayer structure and the transition structure is also provided. Therefore, the problem of operating frequency caused by the thickness of the multilayer structure can be overcome, thereby increasing the resonance frequency of the multilayer structure.

Abstract: Provided is a rapid over-the-air (OTA) production line test platform, including a device under test (DUT), an antenna array and two reflecting plates. The DUT has a beamforming function. The antenna array is arranged opposite to the DUT, and emits beams with beamforming. Two reflecting plates are disposed opposite to each other, and are arranged between the DUT and the antenna array. The beam OTA test of the DUT is carried out by propagation of the beams between the antenna array, the DUT and the two reflecting plates. Accordingly, the test time can be greatly shortened and the cost of test can be effectively reduced. In addition to the above-mentioned rapid OTA production line test platform, platforms for performing the OTA production line test by using horn antenna arrays together with bending waveguides and using a 3D elliptic curve are also provided.

Abstract: An apparatus for use in an automated optical inspection in a production line, the apparatus including a frame accommodating a plurality of illumination units surrounding an integrated optical imaging unit, wherein each illumination unit is rotatable in a synchronized manner relative to each unit, in use, to vary an illumination angle at an intended target, to enhance the visualization of the intended target captured by the optical imaging unit.

Abstract: Provided is a rapid over-the-air (OTA) production line test platform, including a device under test (DUT), an antenna array and two reflecting plates. The DUT has a beamforming function. The antenna array is arranged opposite to the DUT, and emits beams with beamforming. Two reflecting plates are disposed opposite to each other, and are arranged between the DUT and the antenna array. The beam OTA test of the DUT is carried out by propagation of the beams between the antenna array, the DUT and the two reflecting plates. Accordingly, the test time can be greatly shortened and the cost of test can be effectively reduced. In addition to the above-mentioned rapid OTA production line test platform, platforms for performing the OTA production line test by using horn antenna arrays together with bending waveguides and using a 3D elliptic curve are also provided.

Abstract: A transition structure for millimeter wave is provided. The transition structure includes a first layer signal element coupled to an end of a first transmission line and a plurality of first layer ground elements surrounding the end of the first transmission line equidistantly from the end of the first transmission line and disposed along two opposite sides of a strip body of the first transmission line equidistantly from the strip body of the first transmission line. The transition structure further includes an intermediate layer signal element coupled to the first layer signal element and a plurality of intermediate layer ground elements surrounding the intermediate layer signal element quasi-coaxially. A multilayer transition structure including a multilayer structure and the transition structure is also provided. Therefore, the problem of operating frequency caused by the thickness of the multilayer structure can be overcome, thereby increasing the resonance frequency of the multilayer structure.

Abstract: Provided is a rapid over-the-air (OTA) production line test platform, including a device under test (DUT), an antenna array and two reflecting plates. The DUT has a beamforming function. The antenna array is arranged opposite to the DUT, and emits beams with beamforming. Two reflecting plates are disposed opposite to each other, and are arranged between the DUT and the antenna array. The beam OTA test of the DUT is carried out by propagation of the beams between the antenna array, the DUT and the two reflecting plates. Accordingly, the test time can be greatly shortened and the cost of test can be effectively reduced. In addition to the above-mentioned rapid OTA production line test platform, platforms for performing the OTA production line test by using horn antenna arrays together with bending waveguides and using a 3D elliptic curve are also provided.