Patents by Inventor Yang-Tang Liu

Yang-Tang Liu has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Testing integrated circuit, testing method and electronic device
    Patent number: 10228416
    Abstract: An integrated circuit installed in an electronic device having an external connector, including: a monitor circuit and a control circuit. The monitor circuit coupled to the external connector is configured to monitor a code generated from a user's input and inputted via the external connector, the monitor circuit generating a control signal according to the code; and the control circuit coupled to the monitor circuit and at least a circuit block of the electronic device is configured to control the external connector to be coupled to the circuit block according to the control signal; wherein a testing operation is executed in response to a testing signal inputted to the control circuit via the external connector for checking and modifying a status of the circuit block of the electronic device after the external connector is coupled to the control circuit.
    Type: Grant
    Filed: October 27, 2016
    Date of Patent: March 12, 2019
    Assignee: Realtek Semiconductor Corp.
    Inventor: Yang-Tang Liu
  • TESTING INTEGRATED CIRCUIT, TESTING METHOD AND ELECTRONIC DEVICE
    Publication number: 20180120375
    Abstract: An integrated circuit installed in an electronic device having an external connector, including: a monitor circuit and a control circuit. The monitor circuit coupled to the external connector is configured to monitor a code generated from a user's input and inputted via the external connector, the monitor circuit generating a control signal according to the code; and the control circuit coupled to the monitor circuit and at least a circuit block of the electronic device is configured to control the external connector to be coupled to the circuit block according to the control signal; wherein a testing operation is executed in response to a testing signal inputted to the control circuit via the external connector for checking and modifying a status of the circuit block of the electronic device after the external connector is coupled to the control circuit.
    Type: Application
    Filed: October 27, 2016
    Publication date: May 3, 2018
    Inventor: Yang-Tang Liu