Abstract: A testing device for testing surface-mounted (SM) memory connectors on a circuit board is provided. The testing device includes a main control circuit storing standard pin information of the SM memory connectors. A data collecting circuit is connected to the main control circuit and to at least one SM memory connector of the circuit board. A display unit is connected to the main control unit. The main control circuit directs the at least one data collecting circuit to read pin information of the SM memory connector and transmit the pin information to the main control circuit. The main control circuit manages the collected pin information in accordance with the standard pin information and shows the results on the display unit.

Abstract: A test assembly includes a printed circuit board, a first subsidiary test chipset, a second subsidiary test chipset, and a main test chipset. The printed circuit board includes a first CPU socket and a second CPU socket. The first CPU socket includes a first socket pin. The second CPU socket includes a second socket pin. The first subsidiary test chipset connects to the first CPU socket. The second subsidiary test chipset connects to the second CPU socket. The main test chipset connects to the first subsidiary test chipset and the second subsidiary test chipset. The first subsidiary test chipset outputs a first signal to the first socket pin. The second subsidiary test chipset receives a second signal from the second socket pin. The main test chipset compares the first signal and the second signal to test a connection of the first socket pin and the second socket pin.

Abstract: A system for testing a matrix type connector includes a data collecting circuit, a control circuit, a storage unit, and a display unit. The data collecting circuit collects the connector pins' information, and transmits the collected pins' information to the control circuit. The storage unit is electrically coupled to the control circuit and stores a plurality of normal pins' information. The control circuit compares the collected pins' information with the plurality of stored normal pins' information, and outputs the comparison result to the display unit. The display unit receives the comparison result to indicate whether pins of the matrix type connector are normal.

Abstract: A testing device for testing surface-mounted (SM) memory connectors on a circuit board is provided. The testing device includes a main control circuit storing standard pin information of the SM memory connectors. A data collecting circuit is connected to the main control circuit and to at least one SM memory connector of the circuit board. A display unit is connected to the main control unit. The main control circuit directs the at least one data collecting circuit to read pin information of the SM memory connector and transmit the pin information to the main control circuit. The main control circuit manages the collected pin information in accordance with the standard pin information and shows the results on the display unit.

Abstract: A system for testing a matrix type connector includes a data collecting circuit, a control circuit, a storage unit, and a display unit. The data collecting circuit collects the connector pins' information, and transmits the collected pins' information to the control circuit. The storage unit is electrically coupled to the control circuit and stores a plurality of normal pins' information. The control circuit compares the collected pins' information with the plurality of stored normal pins' information, and outputs the comparison result to the display unit. The display unit receives the comparison result to indicate whether pins of the matrix type connector are normal.