Patents by Inventor Yang Yen-Ni

Yang Yen-Ni has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and system for centrally-controlled semiconductor wafer correlation
    Patent number: 7403864
    Abstract: A centrally-controlled correlation system for testing a correlation wafer and comparing the testing results with the wafer's reference data that has been determined previously. The testing instructions and the correlation criteria are stored and transmitted from a central database. Such centrally-controlled correlation system improves the reliability of the correlation results and reduces the time to correlate a correlation wafer.
    Type: Grant
    Filed: November 6, 2006
    Date of Patent: July 22, 2008
    Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
    Inventors: Hsing Ya Huo, Chung-Lin Hsieh, Tsung-Yu Lee, Yang Yen-Ni
  • Method and system for centrally-controlled semiconductor wafer correlation
    Publication number: 20080106278
    Abstract: A centrally-controlled correlation system for testing a correlation wafer and comparing the testing results with the wafer's reference data that has been determined previously. The testing instructions and the correlation criteria are stored and transmitted from a central database. Such centrally-controlled correlation system improves the reliability of the correlation results and reduces the time to correlate a correlation wafer.
    Type: Application
    Filed: November 6, 2006
    Publication date: May 8, 2008
    Applicant: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
    Inventors: Hsing Ya Huo, Chung-Lin Hsieh, Tsung-Yu Lee, Yang Yen-Ni