Abstract: A scroll compressor includes a fixed scroll including a fixed mirror-like surface and a fixed wrap that is extended from the fixed mirror-like surface, formed in a hybrid curve, and includes a thick portion thicker than other portions; an orbiting scroll including an orbiting mirror-like surface and an orbiting wrap extended from the orbiting mirror-like surface and formed in a hybrid curve; and a rotating shaft configured to rotate the orbiting scroll, wherein the orbiting scroll revolves relative to the fixed scroll. A center of a curve of a center portion of the fixed wrap is located at a position offset by a predetermined distance in a direction of reducing a thickness of the thick portion of the fixed wrap from a center of the fixed mirror-like surface, and a center of a curve of a center portion of the orbiting wrap is offset to correspond to the fixed wrap.

Abstract: A scroll compressor includes a fixed scroll including a fixed mirror-like surface and a fixed wrap that is extended from the fixed mirror-like surface, formed in a hybrid curve, and includes a thick portion thicker than other portions; an orbiting scroll including an orbiting mirror-like surface and an orbiting wrap extended from the orbiting mirror-like surface and formed in a hybrid curve; and a rotating shaft configured to rotate the orbiting scroll, wherein the orbiting scroll revolves relative to the fixed scroll. A center of a curve of a center portion of the fixed wrap is located at a position offset by a predetermined distance in a direction of reducing a thickness of the thick portion of the fixed wrap from a center of the fixed mirror-like surface, and a center of a curve of a center portion of the orbiting wrap is offset to correspond to the fixed wrap.

Abstract: Disclosed is a communication system for selecting a PLMN (Public Land Mobile Network). In the communication system, an MS (Mobile Station) transmits an MIN (Mobile Identification Number) message, an ESN (Electronic Serial Number) message and a location update request signal containing location information such that the MS's location can be registered, and searches for the PLMN on the basis of an HPLMN search period value corresponding to the location update request signal. An MSC (Mobile Switching Center) performs an authentication procedure for the MS transmitting the location update request signal, and extracts the location information from the location update request signal. A VLR (Visitor Location Register) stores subscriber data of the MS provided from outside the MS and registers a location of the MS.

Abstract: A TFT substrate includes a transparent substrate, a scan line, a data line, a switching device and a pixel electrode. The scan line is formed on the transparent substrate. The data line is formed on the transparent substrate such that the data line is electrically insulated from the scan line. The switching device includes a gate electrode that is electrically connected to the scan line, a source electrode that is electrically connected to the data line, and a drain electrode. The pixel electrode is electrically connected to the drain electrode. At least one of the scan line and the data line includes a first metal layer, a metal oxide layer formed on the first metal layer, and a second metal layer formed on the metal oxide layer. Therefore, the metal oxide layer prevents corrosion of the first metal layer during manufacturing the TFT substrate.

Abstract: The Mo or MoW composition layer has a low resistivity of less than 15 ??cm and is etched to have a smooth taper angle using an Al alloy enchant or a Cr enchant, and the Mo or MoW layer is used for a wiring of a display or a semiconductor display along with an Al layer or a Cr layer. Since the Mo or MoW layer can be deposited so as to give low stress to the substrate by adjusting the deposition pressure, a single MoW layer can be used as a wiring by itself. When contact holes are formed in the passivation layer or the gate insulating layer, a lateral etch is reduced by using polymer layer, an etch gas system using CF4+O2 can prevent the etch of the Mo or MoW alloy layer, and an etch gas of SF6+HCl (+He) or SF6+Cl2 (+He) can form the edge profile of contact holes to be smoothed.

Abstract: A method for setting a general packet radio service attach mode in a mobile station (MS) for allowing the MS to be attached to a general packet radio service network. A public land mobile network broadcasts information related to the general packet radio service attach mode to the MS through a downlink carrier of a serving cell. The MS receives the information related to the general packet radio service attach mode broadcasted from the public land mobile network through the downlink carrier of the serving cell and checks the general packet radio service attach mode preset in the public land mobile network based on the information related to the general packet radio service attach mode. The general packet radio service attach mode is set in the MS. Thus, the general packet radio service attach of the MS is timely carried out in match with a request of the public land mobile network, so the MS is adaptively used in relation to a system environment of a network to which the MS is registered.

Abstract: Disclosed is a communication system for selecting a PLMN (Public Land Mobile Network). In the communication system, an MS (Mobile Station) transmits an MIN (Mobile Identification Number) message, an ESN (Electronic Serial Number) message and a location update request signal containing location information such that the MS's location can be registered, and searches for the PLMN on the basis of an HPLMN search period value corresponding to the location update request signal. An MSC (Mobile Switching Center) performs an authentication procedure for the MS transmitting the location update request signal, and extracts the location information from the location update request signal. A VLR (Visitor Location Register) stores subscriber data of the MS provided from outside the MS and registers a location of the MS.

Abstract: The Mo or MoW composition layer has a low resistivity of less than 15 &mgr;&OHgr;cm and is etched to have a smooth taper angle using an Al alloy enchant or a Cr enchant, and the Mo or MoW layer is used for a wiring of a display or a semiconductor display along with an Al layer or a Cr layer. Since the Mo or MoW layer can be deposited so as to give low stress to the substrate by adjusting the deposition pressure, a single MoW layer can be used as a wiring by itself. When contact holes are formed in the passivation layer or the gate insulating layer, a lateral etch is reduced by using polymer layer, an etch gas system using CF4+O2 can prevent the etch of the Mo or MoW alloy layer, and an etch gas of SF6+HCl (+He) or SF6+Cl2 (+He) can form the edge profile of contact holes to be smoothed.

Abstract: The Mo or MoW composition layer has a low resistivity of less than 15 &mgr;&OHgr;cm and is etched to have a smooth taper angle using an Al alloy enchant or a Cr enchant, and the Mo or MoW layer is used for a wiring of a display or a semiconductor display along with an Al layer or a Cr layer. Since the Mo or MoW layer can be deposited so as to give low stress to the substrate by adjusting the deposition pressure, a single MoW layer can be used as a wiring by itself. When contact holes are formed in the passivation layer or the gate insulating layer, a lateral etch is reduced by using polymer layer, an etch gas system using CF4+O2 can prevent the etch of the Mo or MoW alloy layer, and an etch gas of SF6+HCl (+He) or SF6+Cl2 (+He) can form the edge profile of contact holes to be smoothed.

Abstract: The Mo or MoW composition layer has a low resistivity of less than 15 &mgr;&OHgr;cm and is etched to have a smooth taper angle using an Al alloy enchant or a Cr enchant, and the Mo or MoW layer is used for a wiring of a display or a semiconductor display along with an Al layer or a Cr layer. Since the Mo or MoW layer can be deposited so as to give low stress to the substrate by adjusting the deposition pressure, a single MoW layer can be used as a wiring by itself. When contact holes are formed in the passivation layer or the gate insulating layer, a lateral etch is reduced by using polymer layer, an etch gas system using CF4+O2 can prevent the etch of the Mo or MoW alloy layer, and an etch gas of SF6+HCl (+He) or SF6+Cl2 (+He) can form the edge profile of contact holes to be smoothed.

Abstract: The Mo or MoW composition layer has a low resistivity of less than 15 &mgr;&OHgr;cm and is etched to have a smooth taper angle using an Al alloy enchant or a Cr enchant, and the Mo or MoW layer is used for a wiring of a display or a semiconductor display along with an Al layer or a Cr layer. Since the Mo or MoW layer can be deposited so as to give low stress to the substrate by adjusting the deposition pressure, a single MoW layer can be used as a wiring by itself. When contact holes are formed in the passivation layer or the gate insulating layer, a lateral etch is reduced by using polymer layer, an etch gas system using CF4+O2 can prevent the etch of the Mo or MoW alloy layer, and an etch gas of SF6+HCl (+He) or SF6+Cl2 (+He) can form the edge profile of contact holes to be smoothed.

Abstract: The Mo or MoW composition layer has a low resistivity of less than 15 &mgr;&OHgr;cm and is etched to have a smooth taper angle using an Al alloy enchant or a Cr enchant, and the Mo or MoW layer is used for a wiring of a display or a semiconductor display along with an Al layer or a Cr layer. Since the Mo or MoW layer can be deposited so as to give low stress to the substrate by adjusting the deposition pressure, a single MoW layer can be used as a wiring by itself. When contact holes are formed in the passivation layer or the gate insulating layer, a lateral etch is reduced by using polymer layer, an etch gas system using CF4+O2 can prevent the etch of the Mo or MoW alloy layer, and an etch gas of SF6+HCl (+He) or SF6+Cl2 (+He) can form the edge profile of contact holes to be smoothed.

Abstract: The Mo or MoW composition layer has a low resistivity of less than 15 &mgr;&OHgr;cm and is etched to have a smooth taper angle using an Al alloy enchant or a Cr enchant, and the Mo or MoW layer is used for a wiring of a display or a semiconductor display along with an Al layer or a Cr layer. Since the Mo or MoW layer can be deposited so as to give low stress to the substrate by adjusting the deposition pressure, a single MoW layer can be used as a wiring by itself. When contact holes are formed in the passivation layer or the gate insulating layer, a lateral etch is reduced by using polymer layer, an etch gas system using CF4+O2 can prevent the etch of the Mo or MoW alloy layer, and an etch gas of SF6+HCl (+He) or SF6+Cl2 (+He) can form the edge profile of contact holes to be smoothed.

Abstract: The Mo or MoW composition layer has a low resistivity of less than 15 &mgr;&OHgr;cm and is etched to have a smooth taper angle using an Al alloy enchant or a Cr enchant, and the Mo or MoW layer is used for a wiring of a display or a semiconductor display along with An Al layer or a Cr layer. Since the Mo or MoW layer can be deposited so as to give low stress to the substrate by adjusting the deposition pressure, a single MoW layer can be used as a wiring by itself. When contact holes are formed in the passivation layer or the gate insulating layer, a lateral etch is reduced by using polymer layer, an etch gas system using CF4+O2 can prevent the etch of the Mo or MoW alloy layer, and an etch gas of SF6+HCl (+He) or SF6+Cl2 (+He) can form the edge profile of contact holes to be smoothed.

Abstract: The Mo or MoW composition layer has a low resistivity of less than 15 &mgr;&OHgr;cm and is etched to have a smooth taper angle using an Al alloy enchant or a Cr enchant, and the Mo or MoW layer is used for a wiring of a display or a semiconductor display along with an Al layer or a Cr layer. Since the Mo or MoW layer can be deposited so as to give low stress to the substrate by adjusting the deposition pressure, a single MoW layer can be used as a wiring by itself. When contact holes are formed in the passivation layer or the gate insulating layer, a lateral etch is reduced by using polymer layer, an etch gas system using CF4+O2 can prevent the etch of the Mo or MoW alloy layer, and an etch gas of SF6+HCl(+He) or SF6+Cl2(+He) can form the edge profile of contact holes to be smoothed.

Abstract: The Mo or MoW composition layer has a low resistivity of less than 15 &mgr;&OHgr;cm and is etched to have a smooth taper angle using an Al alloy enchant or a Cr enchant, and the Mo or MoW layer is used for a wiring of a display or a semiconductor display along with an Al layer or a Cr layer. Since the Mo or MoW layer can be deposited so as to give low stress to the substrate by adjusting the deposition pressure, a single MoW layer can be used as a wiring by itself. When contact holes are formed in the passivation layer or the gate insulating layer, a lateral etch is reduced by using polymer layer, an etch gas system using CF4+O2 can prevent the etch of the Mo or MoW alloy layer, and an etch gas of SF6+HCl (+He) or SF6+Cl2 (+He) can form the edge profile of contact holes to be smoothed.

Abstract: The Mo or MoW composition layer has the low resistivity less than 15 &mgr;&OHgr;cm and is etched to have a smooth taper angle using an Al alloy etchant or a Cr etchant, and the Mo or MoW layer is used for a wiring of a display or a semiconductor device along with an Al layer and a Cr layer. Since the Mo or MoW layer can be deposited so as to give low stress to the substrate by adjusting the deposition pressure, a single MoW layer can used as a wiring by itself. When contact holes are formed in the passivation layer or the gate insulating layer, a lateral etch is reduced by using a polymer layer, an etch gas system CF4+O2 can prevent the etch of the Mo or MoW alloy layer, and an etch gas SF6+HCl(+He) or SF6+Cl2(+He) can form the edge profile of contact holes to be smoothed.

Abstract: The Mo or MoW composition layer has a low resistivity of less than 15 &mgr;&OHgr;cm and is etched to have a smooth taper angle using an Al alloy enchant or a Cr enchant, and the Mo or MoW layer is used for a wiring of a display or a semiconductor display along with an Al layer or a Cr layer. Since the Mo or MoW layer can be deposited so as to give low stress to the substrate by adjusting the deposition pressure, a single MoW layer can be used as a wiring by itself. When contact holes are formed in the passivation layer or the gate insulating layer, a lateral etch is reduced by using polymer layer, an etch gas system using CF4+O2 can prevent the etch of the Mo or MoW alloy layer, and an etch gas of SF6+HCl (+He) or SF6+Cl2 (+He) can form the edge profile of contact holes to be smoothed.

Abstract: The Mo or MoW composition layer has the low resistivity less than 15 &mgr;&OHgr;cm and is etched to have a smooth taper angle using an Al alloy etchant or a Cr etchant, and the Mo or MoW layer is used for a wiring of a display or a semiconductor device along with an Al layer and a Cr layer. Since the Mo or MoW layer can be deposited so as to give low stress to the substrate by adjusting the deposition pressure, a single MoW layer can used as a wiring by itself. When contact holes are formed in the passivation layer or the gate insulating layer, a lateral etch is reduced by using a polymer layer, an etch gas system CF4+O2 can prevent the etch of the Mo or MoW alloy layer, and an etch gas SF6+HCl(+He) or SF6+Cl2(+He) can form the edge profile of contact holes to be smoothed.

Abstract: A method for processing a calling message in a telecommunication system to restrict calls incoming through a telecommunication unit during a particular period of time. The method includes the steps of implementing a setting mode to reject calls incoming during the particular period of time, setting a rejection mode of incoming calls by inputting said particular period of time; detecting whether or not said rejection mode of incoming calls has been set if there is a call after said setting of the rejection; detecting whether or not the present time falls within the set particular period of time if said rejection mode of incoming calls has been set; and avoiding an incoming call if the call is made during said particular period of time.