Abstract: A high-definition map creation method includes: obtaining point cloud data collected with respect to a target region, the point cloud data including K frames of point clouds and an initial pose of each frame of point cloud, K being an integer greater than 1; associating the K frames of point clouds with each other in accordance with the initial pose to obtain a first point cloud relation graph of the K frames of point clouds; performing point cloud registration on the K frames of point clouds in accordance with the first point cloud relation graph and the initial pose to obtain a target relative pose of each frame of point cloud in the K frames of point clouds; and splicing the K frames of point clouds in accordance with the target relative pose to obtain a point cloud map of the target region.

Abstract: The present application provides a method for testing a memory, including the steps of: providing a database, the database including a deviation value between a data strobe signal and a clock signal and a corresponding relationship between the deviation value and a memory parameter; searching the database for a deviation value corresponding to a preset memory parameter when a read command is applied to the memory under the preset memory parameter; acquiring a time value at which an output signal is to be captured according to the deviation value; and capturing the output signal at the time value to perform the testing for the memory.

Abstract: A high-definition map creation method includes: obtaining point cloud data collected with respect to a target region, the point cloud data including K frames of point clouds and an initial pose of each frame of point cloud, K being an integer greater than 1; associating the K frames of point clouds with each other in accordance with the initial pose to obtain a first point cloud relation graph of the K frames of point clouds; performing point cloud registration on the K frames of point clouds in accordance with the first point cloud relation graph and the initial pose to obtain a target relative pose of each frame of point cloud in the K frames of point clouds; and splicing the K frames of point clouds in accordance with the target relative pose to obtain a point cloud map of the target region.

Abstract: An integrated circuit (IC) power-up testing method, an IC power-up testing device, a storage medium and an electronic equipment are disclosed. The IC power-up testing method includes: obtaining power-up testing parameters for an IC; obtaining a plurality of power-up testing waveforms; generating a plurality of power-up test instances by conducting parameter assignments for the power-up testing waveforms based on the power-up testing parameters; and performing power-up tests on the IC using the plurality of power-up test instances. The method allows simulating various IC power-up scenarios through a plurality of power-up test instances.

Abstract: The present application provides a method for forming a database for memory test and a method for testing a memory. The method includes: testing the memory multiple times at a set timestep taking a preset time value as a starting point under a memory parameter, a result including passed or failed; taking, as a subgroup, the testing results in which consecutive tests are passed under the memory parameter, the testing results being capable of forming at least one subgroup; taking the subgroup with the largest number of testing results as a calibration group, and acquiring a selected time value within a testing time range of the calibration group; taking a difference between the selected time value and the preset time value as a deviation value between a data strobe signal and a clock signal, which corresponds to the memory parameter; and changing the memory parameter and repeating the above steps.

Abstract: The present application provides a method for testing a memory, including the steps of: providing a database, the database including a deviation value between a data strobe signal and a clock signal and a corresponding relationship between the deviation value and a memory parameter; searching the database for a deviation value corresponding to a preset memory parameter when a read command is applied to the memory under the preset memory parameter; acquiring a time value at which an output signal is to be captured according to the deviation value; and capturing the output signal at the time value to perform the testing for the memory.

Abstract: An integrated circuit (IC) power-up testing method, an IC power-up testing device, a storage medium and an electronic equipment are disclosed. The IC power-up testing method includes: obtaining power-up testing parameters for an IC; obtaining a plurality of power-up testing waveforms; generating a plurality of power-up test instances by conducting parameter assignments for the power-up testing waveforms based on the power-up testing parameters; and performing power-up tests on the IC using the plurality of power-up test instances. The method allows simulating various IC power-up scenarios through a plurality of power-up test instances.

Abstract: An abrasive grain includes a granular porous body in which many primary grains are bonded with each other partially, and in a state where pores are formed, and a functionalizing material which is constituted of a material which is different from the primary grains is contained within the abrasive grain.