Patents by Inventor Yanhao Lai

Yanhao Lai has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • High throughput measurement of DNA base lesion repair capacity
    Patent number: 9809843
    Abstract: The invention pertains to methods for measuring DNA repair capacity of a test solution, for example, a cell lysate. The method can comprise incubating the test solution with a damaged DNA molecule and measuring the damaged DNA remaining at the end of the incubation. The damaged DNA used in the method comprises a marker attached to a first strand of the damaged DNA and a quencher attached to a second strand of the damaged DNA, characterized in that the quencher inhibits the release of a detectable signal from the marker when damaged DNA is in a double stranded form and the marker emits the detectable signal when at least a portion of the damaged DNA is in a single stranded form. The invention also provides screening assays for identifying one or more compounds from a plurality of compounds as an inhibitor of DNA repair mechanism.
    Type: Grant
    Filed: August 31, 2016
    Date of Patent: November 7, 2017
    Assignee: THE FLORIDA INTERNATIONAL UNIVERSITY BOARD OF TRUSTEES
    Inventors: Yuan Liu, Yanhao Lai, Ruipeng Lei