Patents by Inventor Yanina Shkel

Yanina Shkel has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Batch authentication of materials for automated anti counterfeiting
    Patent number: 10551524
    Abstract: Systems and methods for authenticating material samples are provided. Characteristic features are measured for a batch of material samples that comprise substantially the same composition and are produced by substantially the same process. The measured characteristic features have respective variability that is analyzed to extract statistical parameters. In some cases, reference ranges are determined based on the extracted statistical parameters for the batch of material samples. The corresponding statistical parameters of a test material sample are compared to the reference ranges to verify whether the test material sample is authentic.
    Type: Grant
    Filed: December 7, 2015
    Date of Patent: February 4, 2020
    Assignee: 3M INNOVATIVE PROPERTY COMPANIES
    Inventors: Anthony J. Sabelli, Jennifer F. Shumacher, Yanina Shkel, Brian J. Stankiewicz, Glenn E. Casner, John A. Wheatley, Andrew P. Bonifas, Ravishankar Sivalingam
  • Systems and methods for generating random numbers using physical variations present in material samples
    Patent number: 10331411
    Abstract: Systems and methods for generating random bits by using physical variations present in material samples are provided. Initial random bit streams are derived from measured material properties for the material samples. In some cases, secondary random bit streams are generated by applying a randomness extraction algorithm to the derived initial random bit streams.
    Type: Grant
    Filed: December 1, 2015
    Date of Patent: June 25, 2019
    Assignee: 3M INNOVATIVE PROPERTIES COMPANY
    Inventors: Jennifer F. Schumacher, Glenn E. Casner, Yanina Shkel, Andrew P. Bonifas, Anthony J. Sabelli, Brian J. Stankiewicz, John A. Wheatley, Ravishankar Sivalingam, Robert W. Shannon
  • SYSTEMS AND METHODS FOR GENERATING RANDOM NUMBERS USING PHYSICAL VARIATIONS PRESENT IN MATERIAL SAMPLES
    Publication number: 20180364984
    Abstract: Systems and methods for generating random bits by using physical variations present in material samples are provided. Initial random bit streams are derived from measured material properties for the material samples. In some cases, secondary random bit streams are generated by applying a randomness extraction algorithm to the derived initial random bit streams.
    Type: Application
    Filed: December 1, 2015
    Publication date: December 20, 2018
    Inventors: Jennifer F. Schumacher, Glenn E. Casner, Yanina Shkel, Andrew P. Bonifas, Anthony J. Sabelli, Brian J. Stankiewicz, John A. Wheatley, Ravishankar Sivalingam, Robert W. Shannon
  • BATCH AUTHENTICATION OF MATERIALS FOR AUTOMATED ANTI COUNTERFEITING
    Publication number: 20170363772
    Abstract: Systems and methods for authenticating material samples are provided. Characteristic features are measured for a batch of material samples that comprise substantially the same composition and are produced by substantially the same process. The measured characteristic features have respective variability that is analyzed to extract statistical parameters. In some cases, reference ranges are determined based on the extracted statistical parameters for the batch of material samples. The corresponding statistical parameters of a test material sample are compared to the reference ranges to verify whether the test material sample is authentic.
    Type: Application
    Filed: December 7, 2015
    Publication date: December 21, 2017
    Inventors: Anthony J. Sabelli, Jennifer F. Shumacher, Yanina Shkel, Brian J. Stankiewicz, Glenn E. Casner, John A. Wheatley, Andrew P. Bonifas, Ravishankar Sivalingam