Patents by Inventor YANLING QU

YANLING QU has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10089747
    Abstract: This disclosure presents an image processing method and related X-ray imaging device The method comprises: calculating a relative displacement between two first images that are already in auto registration as a first displacement vector; calculating a difference between position information fed back by a position sensor on the X-ray imaging device when imaging exposure is performed on the two first images respectively as a second displacement vector; calculating a first error of the first displacement vector relative to the second displacement vector; calculating a registration level corresponding to the first error in accordance with a pre-stored training model which is a mathematical distribution model of second errors between a plurality of third displacement vectors and a plurality of corresponding fourth displacement vectors; and labeling the registration level on the two first images that are already in auto registration.
    Type: Grant
    Filed: December 16, 2016
    Date of Patent: October 2, 2018
    Assignee: General Electric Company
    Inventors: Dejun Wang, Yanling Qu
  • Publication number: 20180061067
    Abstract: This disclosure presents an image processing method and related X-ray imaging device The method comprises: calculating a relative displacement between two first images that are already in auto registration as a first displacement vector; calculating a difference between position information fed back by a position sensor on the X-ray imaging device when imaging exposure is performed on the two first images respectively as a second displacement vector; calculating a first error of the first displacement vector relative to the second displacement vector; calculating a registration level corresponding to the first error in accordance with a pre-stored training model which is a mathematical distribution model of second errors between a plurality of third displacement vectors and a plurality of corresponding fourth displacement vectors; and labeling the registration level on the two first images that are already in auto registration.
    Type: Application
    Filed: December 16, 2016
    Publication date: March 1, 2018
    Inventors: Dejun Wang, Yanling Qu
  • Patent number: 9715744
    Abstract: The present invention relates to a method and device of obtaining a beam hardening correction coefficient for carrying out beam hardening correction on computed tomography data. The method includes the steps of: firstly, acquiring an original reconstructed image and an original sinogram of an object of a particular size; secondly, obtaining an error-reduced sinogram after processing the original reconstructed image by error reduction; thirdly, sampling and calculating an average value of the original sinogram and an average value of the error-reduced sinogram; fourthly, optimizing the original sinogram according to the error-reduced sinogram to determine a coefficient vector of optimization function for the object of the particular size; and finally fitting the coefficient vector of the optimization function of the original sinogram to obtain the beam hardening correction coefficient for the object of the particular size.
    Type: Grant
    Filed: December 11, 2014
    Date of Patent: July 25, 2017
    Assignee: General Electric Company
    Inventors: Dan Liu, Xueli Wang, Yanling Qu
  • Patent number: 9380991
    Abstract: A computerized tomography (CT) method and CT system. The method comprises projecting a beam from a radiation source within a display field of view (DFOV) toward a subject to be imaged; receiving, at a detector, the projected beam to collect projection data; determining whether in the projection a truncation occurs in which the subject exceeds the DFOV; and recording a truncated location of the projection if truncation occurs.
    Type: Grant
    Filed: January 28, 2014
    Date of Patent: July 5, 2016
    Assignee: GE MEDICAL SYSTEMS GLOBAL TECHNOLOGY COMPANY, LLC
    Inventors: Xueli Wang, Zhenhua Xu, Yanling Qu, Ximiao Cao
  • Publication number: 20160171725
    Abstract: The present invention relates to a method and device of obtaining a beam hardening correction coefficient for carrying out beam hardening correction on computed tomography data. The method includes the steps of: firstly, acquiring an original reconstructed image and an original sinogram of an object of a particular size; secondly, obtaining an error-reduced sinogram after processing the original reconstructed image by error reduction; thirdly, sampling and calculating an average value of the original sinogram and an average value of the error-reduced sinogram; fourthly, optimizing the original sinogram according to the error-reduced sinogram to determine a coefficient vector of optimization function for the object of the particular size; and finally fitting the coefficient vector of the optimization function of the original sinogram to obtain the beam hardening correction coefficient for the object of the particular size.
    Type: Application
    Filed: December 11, 2014
    Publication date: June 16, 2016
    Inventors: Dan Liu, Xueli Wang, Yanling Qu
  • Publication number: 20140211912
    Abstract: A computerized tomography (CT) method and CT system. The method comprises projecting a beam from a radiation source within a display field of view (DFOV) toward a subject to be imaged; receiving, at a detector, the projected beam to collect projection data; determining whether in the projection a truncation occurs in which the subject exceeds the DFOV; and recording a truncated location of the projection if truncation occurs.
    Type: Application
    Filed: January 28, 2014
    Publication date: July 31, 2014
    Applicant: GE MEDICAL SYSTEMS GLOBAL TECHNOLOGY COMPANY, LLC
    Inventors: XUELI WANG, ZHENHUA XU, YANLING QU, XIMIAO CAO