Abstract: 34 P2418PC00 Abstract Optical diffraction tomography microscope (2) comprising an illumination system (4) configured for transmitting a sample beam through a sample observation zone, a detection 5 system (8) comprising at least one image sensor (54), and a wave collection system (6) comprising a lens (16) downstream of the sample observation zone configured for directing the sample beam towards the at least one image sensor.

Abstract: Optical diffraction tomography microscope (2) comprising an illumination system (4) configured for transmitting a sample beam through a sample observation zone, a detection system (8) comprising at least one image sensor (54), and a wave collection system (6) comprising a lens (16) downstream of the sample observation zone configured for directing the sample beam towards the at least one image sensor.

Abstract: A microscopic object characterization system comprises a computer system, a microscope with a computing unit connected to the computer system, and an object characterization program executable in the computer system configured to receive refractive index data representing at least a spatial distribution of measured values of refractive index (RI) or values correlated to refractive index of the microscopic object. The object characterization program is operable to execute an algorithm applying a plurality of transformations on the refractive index data. The transformations generate a distribution of two or more parameters used to characterize features of the microscopic object.

Abstract: A microscope comprising a coherent light source producing a coherent light beam, a light beam guide system comprising a beam splitter configured to split the coherent light beam into a reference beam and a sample illumination beam, a sample holder configured to hold a sample to be observed, a sample illumination device configured to direct the sample illumination beam through the sample and into a microscope objective, a beam reuniter configured to reunite the reference beam and sample illumination beam after passage of the sample illumination beam through the sample to be observed, and a light sensing system configured to capture at least phase and intensity values of the coherent light beam downstream of the beam reuniter.

Abstract: A microscopic object characterization system comprises a computer system, a microscope with a computing unit connected to the computer system, and an object characterization program executable in the computer system configured to receive refractive index data representing at least a spatial distribution of measured values of refractive index (RI) or values correlated to refractive index of the microscopic object. The object characterization program is operable to execute an algorithm applying a plurality of transformations on the refractive index data. The transformations generate a distribution of two or more parameters used to characterize features of the microscopic object.

Abstract: Microscopic object characterization system (1), comprising a computer system (2, 2a, 2b), a microscope (4) with a computing unit (5) connected to the computer system, and an object characterization program (17) executable in the computer system configured to receive refractive index data representing at least a spatial distribution of measured values of refractive index (RI) or values correlated to refractive index of said microscopic object. The object characterization program is operable to execute an algorithm applying a plurality of transformations on said refractive index data. The transformations generate a distribution of two or more parameters used to characterize features of the microscopic object.

Abstract: A microscope comprising a coherent light source producing a coherent light beam, a light beam guide system comprising a beam splitter configured to split the coherent light beam into a reference beam and a sample illumination beam, a sample holder configured to hold a sample to be observed, a sample illumination device configured to direct the sample illumination beam through the sample and into a microscope objective, a beam reuniter configured to reunite the reference beam and sample illumination beam after passage of the sample illumination beam through the sample to be observed, and a light sensing system configured to capture at least phase and intensity values of the coherent light beam downstream of the beam reuniter.

Abstract: Microscope (2) comprising a coherent light source (4) producing a coherent light beam (7), a light beam guide system (6) comprising a beam splitter (14) configured to split the coherent light beam (7) into a reference beam (7a) and a sample illumination beam (7b), a sample holder (18) configured to hold a sample (1) to be observed, a sample illumination device (28) configured to direct the sample illumination beam (7b) through the sample and into a microscope objective (37), a beam reuniter (16) configured to reunite the reference beam and sample illumination beam after passage of the sample illumination beam through the sample to be observed, and a light sensing system (8) configured to capture at least phase and intensity values of the coherent light beam downstream of the beam reuniter.

Abstract: Microscopic object characterization system (1), comprising a computer system (2, 2a, 2b), a microscope (4) with a computing unit (5) connected to the computer system, and an object characterization program (17) executable in the computer system configured to receive refractive index data representing at least a spatial distribution of measured values of refractive index (RI) or values correlated to refractive index of said microscopic object. The object characterization program is operable to execute an algorithm applying a plurality of transformations on said refractive index data. The transformations generate a distribution of two or more parameters used to characterize features of the microscopic object.

Abstract: Microscope (2) comprising a coherent light source (4) producing a coherent light beam (7), a light beam guide system (6) comprising a beam splitter (14) configured to split the coherent light beam (7) into a reference beam (7a) and a sample illumination beam (7b), a sample holder (18) configured to hold a sample (1) to be observed, a sample illumination device (28) configured to direct the sample illumination beam (7b) through the sample and into a microscope objective (37), a beam reuniter (16) configured to reunite the reference beam and sample illumination beam after passage of the sample illumination beam through the sample to be observed, and a light sensing system (8) configured to capture at least phase and intensity values of the coherent light beam downstream of the beam reuniter.

Abstract: A method for imaging a microscopic object with improved resolution including the steps of measuring a complex wavefield scattered by the microscopic object with an instrument or microscope, the complex wavefield being represented by phase and amplitude or by real and imaginary parts; and computing an image of the microscopic object with a resolution better than given by the Abbe diffraction limit, including deconvolving the complex wavefield scattered by the microscopic object with a complex coherent transfer function (CTF) applied to the complex wavefield.

Abstract: The present invention discloses a method to improve the image resolution of a microscope. This improvement is based on the mathematical processing of the complex field computed from the measurements with a microscope of the wave emitted or scattered by the specimen. This wave is, in a preferred embodiment, electromagnetic or optical for an optical microscope, but can be also of different kind like acoustical or matter waves. The disclosed invention makes use of the quantitative phase microscopy techniques known in the sate of the art or to be invented.