Patents by Inventor Yanpei Deng

Yanpei Deng has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6967172
    Abstract: A colloidal suspension of nanoparticles composed of a dense material dispersed in a solvent is used in forming a gap-filling dielectric material with low thermal shrinkage. The dielectric material is particularly useful for pre-metal dielectric and shallow trench isolation applications. According to the methods of forming a dielectric material, the colloidal suspension is deposited on a substrate and dried to form a porous intermediate layer. The intermediate layer is modified by infiltration with a liquid phase matrix material, such as a spin-on polymer, followed by curing, by infiltration with a gas phase matrix material, followed by curing, or by curing alone, to provide a gap-filling, thermally stable, etch resistant dielectric material.
    Type: Grant
    Filed: October 7, 2003
    Date of Patent: November 22, 2005
    Assignee: Honeywell International Inc.
    Inventors: Roger Leung, Denis Endisch, Songyuan Xie, Nigel Hacker, Yanpei Deng
  • Publication number: 20040228967
    Abstract: A colloidal suspension of nanoparticles composed of a dense material dispersed in a solvent is used in forming a gap-filling dielectric material with low thermal shrinkage. The dielectric material is particularly useful for pre-metal dielectric and shallow trench isolation applications. According to the methods of forming a dielectric material, the colloidal suspension is deposited on a substrate and dried to form a porous intermediate layer. The intermediate layer is modified by infiltration with a liquid phase matrix material, such as a spin-on polymer, followed by curing, by infiltration with a gas phase matrix material, followed by curing, or by curing alone, to provide a gap-filling, thermally stable, etch resistant dielectric material.
    Type: Application
    Filed: October 7, 2003
    Publication date: November 18, 2004
    Inventors: Roger Leung, Denis Endisch, Songyuan Xie, Nigel Hacker, Yanpei Deng
  • Publication number: 20040046148
    Abstract: Chemical mechanical planarization or spin etch planarization of surfaces of copper, tantalum and tantalum nitride is accomplished by means of the chemical formulations of the present invention. The chemical formulations may optionally include abrasive particles and which may be chemically reactive or inert. Contact or non-contact CMP may be performed with the present chemical formulations. Substantially 1:1 removal rate selectivity for Cu and Ta/TaN is achieved.
    Type: Application
    Filed: May 27, 2003
    Publication date: March 11, 2004
    Inventors: Fan Zhang, Dan Towery, Joseph Levert, Shyama Mukherjee, Yanpei Deng
  • Patent number: 6653718
    Abstract: A colloidal suspension of nanoparticles composed of a dense material dispersed in a solvent is used in forming a gap-filling dielectric material with low thermal shrinkage. The dielectric material is particularly useful for pre-metal dielectric and shallow trench isolation applications. According to the methods of forming a dielectric material, the colloidal suspension is deposited on a substrate and dried to form a porous intermediate layer. The intermediate layer is modified by infiltration with a liquid phase matrix material, such as a spin-on polymer, followed by curing, by infiltration with a gas phase matrix material, followed by curing, or by curing alone, to provide a gap-filling, thermally stable, etch resistant dielectric material.
    Type: Grant
    Filed: July 3, 2002
    Date of Patent: November 25, 2003
    Assignee: Honeywell International, Inc.
    Inventors: Roger Leung, Denis Endisch, Songyuan Xie, Nigel Hacker, Yanpei Deng
  • Publication number: 20030087485
    Abstract: A colloidal suspension of nanoparticles composed of a dense material dispersed in a solvent is used in forming a gap-filling dielectric material with low thermal shrinkage. The dielectric material is particularly useful for pre-metal dielectric and shallow trench isolation applications. According to the methods of forming a dielectric material, the colloidal suspension is deposited on a substrate and dried to form a porous intermediate layer. The intermediate layer is modified by infiltration with a liquid phase matrix material, such as a spin-on polymer, followed by curing, by infiltration with a gas phase matrix material, followed by curing, or by curing alone, to provide a gap-filling, thermally stable, etch resistant dielectric material.
    Type: Application
    Filed: July 3, 2002
    Publication date: May 8, 2003
    Inventors: Roger Leung, Denis Endisch, Songyuan Xie, Nigel Hacker, Yanpei Deng
  • Publication number: 20020137260
    Abstract: A colloidal suspension of nanoparticles composed of a dense material dispersed in a solvent is used in forming a gap-filling dielectric material with low thermal shrinkage. The dielectric material is particularly useful for pre-metal dielectric and shallow trench isolation applications. According to the methods of forming a dielectric material, the colloidal suspension is deposited on a substrate and dried to form a porous intermediate layer. The intermediate layer is modified by infiltration with a liquid phase matrix material, such as a spin-on polymer, followed by curing, by infiltration with a gas phase matrix material, followed by curing, or by curing alone, to provide a gap-filling, thermally stable, etch resistant dielectric material.
    Type: Application
    Filed: January 11, 2001
    Publication date: September 26, 2002
    Inventors: Roger Leung, Denis Endisch, Songyuan Xie, Nigel Hacker, Yanpei Deng
  • Patent number: 6444495
    Abstract: A colloidal suspension of nanoparticles composed of a dense material dispersed in a solvent is used in forming a gap-filling dielectric material with low thermal shrinkage. The dielectric material is particularly useful for pre-metal dielectric and shallow trench isolation applications. According to the methods of forming a dielectric material, the colloidal suspension is deposited on a substrate and dried to form a porous intermediate layer. The intermediate layer is modified by infiltration with a liquid phase matrix material, such as a spin-on polymer, followed by curing, by infiltration with a gas phase matrix material, followed by curing, or by curing alone, to provide a gap-filling, thermally stable, etch resistant dielectric material.
    Type: Grant
    Filed: January 11, 2001
    Date of Patent: September 3, 2002
    Assignee: Honeywell International, Inc.
    Inventors: Roger Leung, Denis Endisch, Songyuan Xie, Nigel Hacker, Yanpei Deng