Patents by Inventor Yantian Zhang

Yantian Zhang has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Process for rapid sample trajectory calibration for magnetic resonance imaging
    Patent number: 6239598
    Abstract: A k-space trajectory measurement method is disclosed with applications in magnetic resonance spectroscopy. Phase shift values associated with magnetic resonance signals from multiple sample regions are compared to rapidly extract k-space trajectory measurements. The efficiency of the present invention for image gradients to be measured immediately before test imaging.
    Type: Grant
    Filed: May 7, 1999
    Date of Patent: May 29, 2001
    Assignee: The UAB Reasearch Foundation
    Inventor: Yantian Zhang