Abstract: A fault detection apparatus includes an image capture module and a detection module, and the fault detection apparatus is configured to capturing an image of the photovoltaic module in a light emitting state, and performing fault detection on the photovoltaic module based on the image when a signal-to-noise ratio of the image is maximized, to identify a fault type of the photovoltaic module.

Abstract: An integrated circuit with memory elements is provided. The memory elements may have memory element transistors with body terminals. Body bias control circuitry may supply body bias voltages that strengthen or weaken memory element transistors to improve read and write margins. The body bias control circuitry may dynamically control body bias voltages so that time-varying body bias voltages are supplied to memory element transistors. Address transistors and latch transistors in the memory elements may be selectively strengthened and weakened. Process variations may be compensated by weakening fast transistors and strengthening slow transistors with body bias adjustments.