Abstract: A semiconductor device includes an insulating layer, wherein the insulating layer has a via opening and a conductive line opening. The semiconductor device further includes a via in the via opening. The semiconductor device further includes a conductive line in the conductive line opening. The conductive line includes a first liner layer, wherein a first thickness of the first liner layer over the via is less than a second thickness of the first liner layer over the insulating layer, and a conductive fill, wherein the first liner layer surrounds the conductive fill.

Abstract: Three-dimensional integrated circuit (3DIC) structures and methods of forming the same are provided. A 3DIC structure includes a semiconductor package, a first package substrate, a molded underfill layer and a thermal interface material. The semiconductor package is disposed over and electrically connected to the first package substrate through a plurality of first bumps. The semiconductor package includes at least one semiconductor die and an encapsulation layer aside the semiconductor die. The molded underfill layer surrounds the plurality of first bumps and a sidewall of the semiconductor package, and has a substantially planar top surface. The CTE of the molded underfill layer is different from the CTE of the encapsulation layer of the semiconductor package. The thermal interface material is disposed over the semiconductor package.

Abstract: In an electronic device provided in the disclosure, an external antenna device includes at least one directional antenna, a wireless communication module is electrically connected to the external antenna device, and a processing circuit is electrically connected to the wireless communication module.

Abstract: An optical image system surface resolution calibration method is provided herein, which utilizes a calibration standard and an image sensor device. The surface of the calibration standard is provided with a plurality of interleaving bright lines and dark lines, the calibration standard is disposed in a plane to be measured, and the image sensor device is provided with an imaging means, a memory means, and a logic-arithmetic means, that is used to fetch the image information of the calibration standard and store the image information thus obtained. Meanwhile, the image sensor device is used to select and calculate the linear equations of the bright lines, and finally calculate the magnification factor of the image fetched by the image sensor device through the geometric mathematical means by making use of the slope and intersection distance of the linear equation and the average distance between the adjacent bright lines calculated from the intersection distance.

Abstract: An integrated interference scanning method, mainly used to integrate the respective advantages of VSI and PSI measurements, hereby achieving the characteristic of high precision and limitless measurement range. In particular, the slope correction factor and the displacement correction factor between the VSI measurement and PSI measurement may be utilized to execute the integration calculation of the height data arrays of the VSI and PSI, so that the scanning procedure may be achieved through merely using the wideband light source of the interference scanning system, as such reducing the errors and complexity of the interference scanning system.

Abstract: An interference measurement system self-alignment method, which can be realized through an optical image interference measurement system. The method comprises the following steps of: utilizing the imaging device to get the optical information of the object to be measured and store the optical information thus obtained; performing the inclination adjustment of the first direction rotation axis of the object platform based on the direction of the interference fringe in the optical information until the interference fringes are adjusted to a defined orthogonal direction, thus eliminating the inclination of the first direction rotation axis; and performing the inclination adjustment of the second direction rotation axis of the object platform based on the expansion direction of the interference fringe in the optical information until the spacing of the interference fringes are adjusted to the maximum, thus eliminating the inclination of the second direction rotation axis.

Abstract: An integrated interference scanning method, mainly used to integrate the respective advantages of VSI and PSI measurements, hereby achieving the characteristic of high precision and limitless measurement range. In particular, the slope correction factor and the displacement correction factor between the VSI measurement and PSI measurement may be utilized to execute the integration calculation of the height data arrays of the VSI and PSI, so that the scanning procedure may be achieved through merely using the wideband light source of the interference scanning system, as such reducing the errors and complexity of the interference scanning system.

Abstract: An optical image system surface resolution calibration method is provided herein, which utilizes a calibration standard and an image sensor device. The surface of the calibration standard is provided with a plurality of interleaving bright lines and dark lines, the calibration standard is disposed in a plane to be measured, and the image sensor device is provided with an imaging means, a memory means, and a logic-arithmetic means, that is used to fetch the image information of the calibration standard and store the image information thus obtained. Meanwhile, the image sensor device is used to select and calculate the linear equations of the bright lines, and finally calculate the magnification factor of the image fetched by the image sensor device through the geometric mathematical means by making use of the slope and intersection distance of the linear equation and the average distance between the adjacent bright lines calculated from the intersection distance.

Abstract: An automatic focusing method is provided, which is realized through an imaging device as based on the multi-stage search principle and a focusing function. Thus the focusing position search is implemented in three stages of: the optimal focusing position gross search, the wave packet interval search, and the optimal focusing position minute search, with the respective stages having different search-step-magnitudes. Wherein, the integer times of one half the wavelength of the incident light of the imaging device is utilized as the search-step-magnitude to search for the maximum value of the focusing function in the wave packet interval, and define the focusing position corresponding to the maximum value of the focusing function as the optimal focusing position, hereby obtaining the optimal focusing position in a speedy and efficient manner.

Abstract: An approaching apparatus based on spectral shift is disclosed, which includes a broadband light source, an optical-guide unit, and an optical receiving unit. The broadband light source emits a broadband light with the first central wavelength to the optical-guide unit and illuminates a sample via a probe within the optical-guide unit. A generated broadband light of the second central wavelength goes back the optical-guide unit via the original optical path to reach the optical receiving unit. Then, the receiving unit calculates the distance between the probe and the sample based on the characteristic curve of the approaching distance vs. the deviation of the first central wavelength. The deviation is used for feedback control so that the displacement driver moves the probe to adjust the distance between the probe and the sample.

Abstract: A position micro-perturbation device is disclosed, comprising two wedge-shaped lenses mounted coaxially and rotatable with respect to each other to change the light path of an image and bring about position micro-perturbation. A photodetector is used to pick up the image as a result of the position micro-perturbation, and an image-processing algorithm is further used for calculation. The amount of displacement and direction of the light path of the image is freely adjustable so that the position micro-perturbation can be occurred at any position. Hence, the resolution of the photodetector is high. Furthermore, because fewer wedge-shaped lenses mounted coaxially are used, the size of the position micro-perturbation device, as a whole, can be small and achieved at reasonable cost.

Abstract: An approaching apparatus based on spectral shift is disclosed, which includes a broadband light source, an optical-guide unit, and an optical receiving unit. The broadband light source emits a broadband light with the first central wavelength to the optical-guide unit and illuminates a sample via a probe within the optical-guide unit. A generated broadband light of the second central wavelength goes back the optical-guide unit via the original optical path to reach the optical receiving unit. Then, the receiving unit calculates the distance between the probe and the sample based on the characteristic curve of the approaching distance vs. the deviation of the first central wavelength. The deviation is used for feedback control so that the displacement driver moves the probe to adjust the distance between the probe and the sample.

Abstract: The present invention provides an apparatus and method for enhancing image resolution by a position perfurbation modulation which changes optical imaging paths by a rotatable wedge lens turntable. The imaging positions on an image detector is periodically changed so as to obtain the effect of the displacement disturbance and to breach the resolution limitation of the image detector. The present invention could further cooperate with the design of an optical imaging system and image processing to increase the image resolution and detect where a questionable pixel situates.

Abstract: An inspection apparatus for gas detectors is disclosed which comprises an open-feasibly air-tight testing reservoir in which gas detectors to be tested can be positioned, an air-tight dispensing reservoir for mixing the gas to be tested, a vacuum device for making the testing reservoir and the dispensing reservoir in vacuum, a gas supply device for supplying at least a standard gas and a diluting gas to the dispensing reservoir, and a controlling means for controlling the dispensation of the gases to each of the above-described components of the invention. By means of the invention, the executions of the mixing of the gases and the detection of the gas detector are substantially simultaneous and thus the time consumption as well as the amount of required gas are reduced. Moreover, an automatic control is available when the inspection apparatus of the invention is equipped with a computer.

Abstract: The present invention relates to an improved gas sampling device comprising a pair of hollow rectangular chambers having diffusion apertures, a heat insulating plate, a reflecting element, a light source and a light detector; wherein the pair of rectangular chambers are arranged one over the other, with the heat insulating element being placed therebetween, the reflecting element having two reflecting surfaces at right angle with respect to each other, one end of the rectangular chambers being secured to the reflecting element with each end thereof being aligned with a reflecting surface, the light source and the light detector being placed at the other end respectively of the rectangular chambers.

Abstract: A gas sampling device comprises an elongated tube having a plurality of holes on the wall thereof a porous mesh surrounding the outer surface of said tube, a light source located at one end of said tube, a light sensor located at the other end of said tube, a first housing mounted at the one side of the tube for holding said light source, a second housing mounted on the other end of the tube for holding said light sensor, and a gas flowing channel formed in at least one of said first and second housing for communicating the interior and said the exterior of the tube thereby producing an action of thermal convection to promote the concentration of the gas in the interior of the tube to reach a stable balance condition rapidly.