Abstract: A test circuitry and a method for testing the same and a test system are provided. The test circuitry includes: a test signal input end, configured to input an initial test signal; a signal output end, configured to output a target test signal; and a signal shaping circuitry coupled to the test signal input end and the signal output end, configured to remove a noise signal from the initial test signal to obtain the target test signal.

Abstract: A set of measurement voltages having different voltage values are subsequently inputted to a measurement voltage input terminal of the pixel driving circuit, a light emitting state of a light emitting device under each measurement voltage is detected, and it is determined whether a storage capacitor in the pixel driving circuit is normal based on the light emitting state of the light emitting device.

Abstract: A method for manufacturing an OLED panel is provided by embodiments of the present disclosure, including following steps of: manufacturing an OLED motherboard which comprises a plurality of OLED panel areas spaced apart from one another, each comprising a display region and a frit package region which is located on a periphery of the display region and is to encapsulate the display region by a frit; and cutting the OLED motherboard along a cutting line to obtain separated OLED panels; and the cutting line is located within the frit package region and at a predetermined distance inwards from an edge of the periphery of the frit package region.

Abstract: A test circuitry and a method for testing the same and a test system are provided. The test circuitry includes: a test signal input end, configured to input an initial test signal; a signal output end, configured to output a target test signal; and a signal shaping circuitry coupled to the test signal input end and the signal output end, configured to remove a noise signal from the initial test signal to obtain the target test signal.

Abstract: A set of measurement voltages having different voltage values are subsequently inputted to a measurement voltage input terminal of the pixel driving circuit, a light emitting state of a light emitting device under each measurement voltage is detected, and it is determined whether a storage capacitor in the pixel driving circuit is normal based on the light emitting state of the light emitting device.

Abstract: A method for manufacturing an OLED panel is provided by embodiments of the present disclosure, including following steps of: manufacturing an OLED motherboard which comprises a plurality of OLED panel areas spaced apart from one another, each comprising a display region and a frit package region which is located on a periphery of the display region and is to encapsulate the display region by a frit; and cutting the OLED motherboard along a cutting line to obtain separated OLED panels areas; and the cutting line is located within the frit package region and at a predetermined distance inwards from an edge of the periphery of the frit package region.

Abstract: A method and an apparatus are provided for detecting and classifying an active matrix organic light emitting diode panel. The method includes: comparing images to be compared which are collected from the active matrix organic light emitting diode panel with template images in a preset template image library; classifying the active matrix organic light emitting diode panel depending on results of the comparing.

Abstract: The present disclosure provides a method and an apparatus for detecting and classifying an active matrix organic light emitting diode panel. The method includes: comparing images to be compared which are collected from the active matrix organic light emitting diode panel with template images in a preset template image library; classifying the active matrix organic light emitting diode panel depending on the comparing results.