Abstract: There are provided an array substrate and method for manufacturing the same, a display panel and method for testing the same, and a display apparatus. The array substrate comprises a display region and at least one bond region located outside of the display region; wherein a plurality of signal lines are disposed within the display region, and a plurality of wiring terminals connected to multiple ones of the plurality of signal lines through a plurality of first lead wires are disposed within each bond region; the array substrate further comprises one or more test regions corresponding to arbitrary one or more of the at least one bond region; wherein a plurality of test terminals are disposed within each test region, and the plurality of test terminals within any one of the one or more test regions are connected with the plurality of wiring terminals within a respective one of the at least one bond region through a plurality of second lead wires.

Abstract: An inspection device for a substrate includes a support member, a turning table and a first drive device. The turning table includes: a carrier pivotally mounted on a pivot shaft, the carrier having an observation aperture through its thickness direction; and positioning clamps which are mounted on the carrier and are used to retain the display substrate in the range of the observation aperture. The first drive device is in transmission connection with the pivot shaft of the carrier in order to drive the turning table to rotate around the pivot shaft. In use, an omnidirectional inspection of the display substrate can be achieved by turning the turning table. Moreover, the contact between the inspector and the display substrate can be avoided, the risk of damaging the display substrate during appearance inspection can be decreased, and therefore defects of the display substrate caused by appearance inspection can be reduced.

Abstract: There are provided an array substrate and method for manufacturing the same, a display panel and method for testing the same, and a display apparatus. The array substrate comprises a display region and at least one bond region located outside of the display region; wherein a plurality of signal lines are disposed within the display region, and a plurality of wiring terminals connected to multiple ones of the plurality of signal lines through a plurality of first lead wires are disposed within each bond region; the array substrate further comprises one or more test regions corresponding to arbitrary one or more of the at least one bond region; wherein a plurality of test terminals are disposed within each test region, and the plurality of test terminals within any one of the one or more test regions are connected with the plurality of wiring terminals within a respective one of the at least one bond region through a plurality of second lead wires.

Abstract: The present disclosure relates to a technical field of display substrate inspection. The present disclosure discloses an inspection device and an inspection system for display substrate. The inspection device includes a support member, a turning table and a first drive device. The turning table includes: a carrier pivotally mounted on a pivot shaft, the carrier having an observation aperture through its thickness direction; and positioning clamps which are mounted on the carrier and are used to retain the display substrate in the range of the observation aperture. The first drive device is in transmission connection with the pivot shaft of the carrier in order to drive the turning table to rotate around the pivot shaft. When inspecting the appearance of the display substrate by the above mentioned inspection device, omnidirectional inspection of the display substrate can be achieved by turning the turning table.