Patents by Inventor Yarkin YIGIT

Yarkin YIGIT has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11387531
    Abstract: A method for minimizing center frequency shift and linearity errors encountered in YIG filters, comprising the following steps: automatically generating data packages in test unit depending on the user request or containing all filter characteristic states and transmitting them to the driver circuit, adjusting the desired voltage level by means of the digital to analog converters contained in the structure of the data packages received by the driver circuit, and transmitting the adjusted voltage level to the YIG filter, measuring filter characteristics (scattering parameters) corresponding to the data packages transmitted to the YIG filter in the analyser, in order to calculate the center frequency shift of the filter, determining the center frequency and linearity calculations, and recording the characteristic features measured by the analyser in the test unit.
    Type: Grant
    Filed: May 18, 2020
    Date of Patent: July 12, 2022
    Assignee: ASELSAN ELEKTRONIK SANAYI VE TICARET ANONIM SIRKETI
    Inventor: Yarkin Yigit
  • Publication number: 20200373645
    Abstract: A method for minimizing center frequency shift and linearity errors encountered in YIG filters, comprising the following steps: automatically generating data packages in test unit depending on the user request or containing all filter characteristic states and transmitting them to the driver circuit, adjusting the desired voltage level by means of the digital to analog converters contained in the structure of the data packages received by the driver circuit, and transmitting the adjusted voltage level to the YIG filter, measuring filter characteristics (scattering parameters) corresponding to the data packages transmitted to the YIG filter in the analyser, in order to calculate the center frequency shift of the filter, determining the center frequency and linearity calculations, and recording the characteristic features measured by the analyser in the test unit.
    Type: Application
    Filed: May 18, 2020
    Publication date: November 26, 2020
    Applicant: ASELSAN ELEKTRONIK SANAYI VE TICARET ANONIM SIRKETI
    Inventor: Yarkin YIGIT