Patents by Inventor Yasuaki Takada
Yasuaki Takada has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20250016371Abstract: An arithmetic coding scheme is provided for coding and decoding 3D data and improves coding efficiency for mesh displacements and high-quality coding, and decoding of the 3D data. A 3D data decoding apparatus is also provided for decoding coded data. The apparatus contains an arithmetic decoder that is configured to arithmetically decode a mesh displacement from the coded data. The arithmetic decoder decodes, from the coded data, a first flag indicating whether a coefficient of the mesh displacement has an absolute value greater than 0, a second flag indicating whether the coefficient has an absolute value greater than 1, and a third flag indicating whether the coefficient has an absolute value greater than 2.Type: ApplicationFiled: February 22, 2024Publication date: January 9, 2025Inventors: YASUAKI TOKUMO, Keiichiro TAKADA, TOMOHIRO IKAI, TAKESHI CHUJOH, TOMOKO AONO
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Publication number: 20250005803Abstract: A video coding scheme for encoding and decoding 3D data encodes and decodes a mesh displacement image as an image in a 4:2:0 format, reduces distortion caused by encoding, and encodes and decodes 3D data with high quality. A 3D data decoding apparatus includes a video decoder that is configured to decode a mesh displacement image decoded from a geometry video stream in which a Unit Type of coded data is V3C_GVD and a displacement unmapper that is configured to derive a mesh displacement per position pos and component compIdx from the mesh displacement image. The displacement unmapper is further configured to derive a Y coordinate of a geometry image from a product of a height and a variable from 0 to a value indicating a number of dimensions of geometry minus 1 to derive the mesh displacement in a case that the geometry image is in a 4:2:0 format.Type: ApplicationFiled: February 22, 2024Publication date: January 2, 2025Inventors: Yasuaki Tokumo, Keiichiro Takada, Tomohiro Ikai, Takeshi Chujoh, Tomoko Aono
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Patent number: 12177490Abstract: Object There is the problem in the related art that the relationship between a patch size which is a unit of processing of a neural network and the sizes of input and output pictures is not clearly defined.Type: GrantFiled: April 10, 2023Date of Patent: December 24, 2024Assignee: SHARP KABUSHIKI KAISHAInventors: Takeshi Chujoh, Tomohiro Ikai, Yukinobu Yasugi, Yasuaki Tokumo, Tomonori Hashimoto, Tomoko Aono, Keiichiro Takada
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Publication number: 20240420378Abstract: A 3D data decoding apparatus for decoding coded data and decoding 3D data including attribute information includes a header decoder that decodes characteristics information of refinement and activation information of the refinement, and a refiner that performs refinement processing of an attribute frame or an geometry frame. Refinement target information indicating which of an occupancy, a geometry, or an attribute is to be used is decoded from coded data of the characteristics information and the refinement is performed using an image specified according to the refinement target information.Type: ApplicationFiled: February 26, 2024Publication date: December 19, 2024Inventors: Keiichiro TAKADA, YASUAKI TOKUMO, TOMOHIRO IKAI, TAKESHI CHUJOH, TOMOKO AONO
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Patent number: 11776800Abstract: A substance analyzer that includes, to enhance selectivity of substance analysis, the following: a heater that heats a medium for collecting a chemical substance adhering to a surface of an inspection object; a mass spectrometer that performs tandem mass spectrometry of vapor derived from the chemical substance heated and vaporized by the heater from the medium; and a control device that causes the mass spectrometer to perform, based on a temperature of the medium in the heater, tandem mass spectrometry for the chemical substance that is vaporized at the temperature of the medium using the vapor sent from the heater to the mass spectrometer.Type: GrantFiled: June 20, 2019Date of Patent: October 3, 2023Assignee: Hitachi High-Tech CorporationInventors: Yasuaki Takada, Shun Kumano, Masuyuki Sugiyama, Tsukasa Shishika, Shinji Yoshioka, Akimasa Osaka
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Publication number: 20220373434Abstract: An attached substance collection device comprising, a nozzle configured to jet gas upward, a surface equipped with an opening portion through which the gas jets, a collection opening through which the gas jetted toward an inspection object is collected, and a contact detection sensor configured to detect whether or not the inspection object has come into contact with the upper surface, wherein an attached substance attached to the inspection object is collected by using the gas, a height of a distal end of the nozzle is substantially equal to a height of the surface; or equal to or less than a height of the surface, the surface includes a recess portion, and, relative to a jet opening of the nozzle, the recess portion is closer to the collection opening, and is in contact with the jet opening of the nozzle or includes the jet opening of the nozzle.Type: ApplicationFiled: June 17, 2020Publication date: November 24, 2022Inventors: Shun KUMANO, Yasuaki TAKADA, Tatsuo NOJIRI, Hisashi NAGANO, Hiroki MIZUNO, Takayuki FUJII
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Publication number: 20220359182Abstract: A substance analyzer that includes, to enhance selectivity of substance analysis, the following: a heater that heats a medium for collecting a chemical substance adhering to a surface of an inspection object; a mass spectrometer that performs tandem mass spectrometry of vapor derived from the chemical substance heated and vaporized by the heater from the medium; and a control device that causes the mass spectrometer to perform, based on a temperature of the medium in the heater, tandem mass spectrometry for the chemical substance that is vaporized at the temperature of the medium using the vapor sent from the heater to the mass spectrometer.Type: ApplicationFiled: June 20, 2019Publication date: November 10, 2022Applicant: Hitachi High-Tech CorporationInventors: Yasuaki TAKADA, Shun KUMANO, Masuyuki SUGIYAMA, Tsukasa SHISHIKA, Shinji YOSHIOKA, Akimasa OSAKA
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Patent number: 10989632Abstract: An object of the invention is to improve uniformity of a standard sample used for evaluating a gas flow type analysis system. The invention includes weighing a background into a container; adding a sample solution to the background; drying the sample solution; adding a solvent that can dissolve the sample into the container; and drying the solvent added to the container. The invention is also characterized in that the solvent is an organic solvent, in particular, acetone.Type: GrantFiled: November 27, 2017Date of Patent: April 27, 2021Assignee: Hitachi, Ltd.Inventors: Yasuaki Takada, Shun Kumano, Masuyuki Sugiyama, Hisashi Nagano, Tatsuo Nojiri, Hiroki Mizuno, Yuichiro Hashimoto
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Publication number: 20200193545Abstract: To achieve inspection with both a high security level and high throughput, the present invention comprises: a step of acquiring personal information of a subject; a step of calculating a terrorism risk of the subject by referring the acquired personal information to a database storing a relationship between the personal information and the terrorism risk; and a step of using an inspection device for collecting an adhered matter on the subject or on an inspection object carried by the subject and/or a vapor from the adhered matter, ionizing and analyzing the collected matter, and determining whether or not the adhered matter is a dangerous material by referring the analysis result to the database; wherein inspection condition and/or judgement condition of the inspection device is changed on a per-subject basis so that a true positive rate of an inspection is varied according to a level of the calculated terrorism risk.Type: ApplicationFiled: January 16, 2018Publication date: June 18, 2020Inventors: Shun KUMANO, Yuichiro HASHIMOTO, Masuyuki SUGIYAMA, Yasuaki TAKADA
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Patent number: 10048172Abstract: In order to save a space for an apparatus for inspecting a substance and reduce a cost thereof, a particle testing apparatus includes a plurality of collection ports for collecting substances to be inspected, centrifuges for concentrating particles collected in the collection ports, the centrifuges being connected to the respective collection ports in pairs, and a common analysis apparatus for acquiring the concentrated particles from the centrifuges and analyzing the particles, the analysis apparatus being connected to the centrifuges.Type: GrantFiled: March 24, 2014Date of Patent: August 14, 2018Assignee: Hitachi, Ltd.Inventors: Masakazu Sugaya, Hideo Kashima, Koichi Terada, Yasuaki Takada, Hisashi Nagano
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Publication number: 20180149563Abstract: An object of the invention is to improve uniformity of a standard sample used for evaluating a gas flow type analysis system. The invention includes weighing a background into a container; adding a sample solution to the background; drying the sample solution; adding a solvent that can dissolve the sample into the container; and drying the solvent added to the container. The invention is also characterized in that the solvent is an organic solvent, in particular, acetone.Type: ApplicationFiled: November 27, 2017Publication date: May 31, 2018Inventors: Yasuaki TAKADA, Shun KUMANO, Masuyuki SUGIYAMA, Hisashi NAGANO, Tatsuo NOJIRI, Hiroki MIZUNO, Yuichiro HASHIMOTO
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Patent number: 9850696Abstract: In a conventional fine particle detection device that vaporizes fine particles attached to the object of examination by heating, processing capability decreases as the processing time elapses due to the influence of deposition of fine particles other than the object of examination, dirt/dust, a residue of the fine particles as the object of examination, or residual matter.Type: GrantFiled: April 30, 2013Date of Patent: December 26, 2017Assignee: Hitachi, Ltd.Inventors: Masakazu Sugaya, Koichi Terada, Hideo Kashima, Yasuaki Takada, Hisashi Nagano
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Patent number: 9696288Abstract: Provided is a technique to identify a sample substance attached to an inspection target easily and precisely, while improving the rate of operation and reducing the number of persons required for inspection. A trace detecting system includes detection means to detect the size (vertical and horizontal dimensions) of an inspection target, and selects an air nozzle capable of spraying air jet at 15 m/s or more to the surface of the inspection target for air jet spraying.Type: GrantFiled: October 2, 2012Date of Patent: July 4, 2017Assignee: HITACHI, LTD.Inventors: Hideo Kashima, Masakazu Sugaya, Koichi Terada, Yasunori Doi, Yasutaka Suzuki, Hisashi Nagano, Yuichiro Hashimoto, Yasuaki Takada
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Publication number: 20170102296Abstract: In order to save a space for an apparatus for inspecting a substance and reduce a cost thereof, a particle testing apparatus includes a plurality of collection ports for collecting substances to be inspected, centrifuges for concentrating particles collected in the collection ports, the centrifuges being connected to the respective collection ports in pairs, and a common analysis apparatus for acquiring the concentrated particles from the centrifuges and analyzing the particles, the analysis apparatus being connected to the centrifuges.Type: ApplicationFiled: March 24, 2014Publication date: April 13, 2017Applicant: Hitachi, Ltd.Inventors: Masakazu SUGAYA, Hideo KASHIMA, Koichi TERADA, Yasuaki TAKADA, Hisashi NAGANO
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Patent number: 9423388Abstract: An explosive detection apparatus capable of maintaining high availability even in an environment containing a large amount of foreign substances is achieved. The explosive detection apparatus includes means for sequentially replacing a plurality of collection thermal vaporization filters 2 for collecting, heating, vaporizing particles, which have been prepared in advance. The explosive detection apparatus also includes a preheating unit 52 for preheating an unused filter, and sealing is performed by a seal portion between the plurality of filters.Type: GrantFiled: October 28, 2013Date of Patent: August 23, 2016Assignee: Hitachi, Ltd.Inventors: Koichi Terada, Masakazu Sugaya, Hideo Kashima, Hisashi Nagano, Yasuaki Takada, Hiromi Satou
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Patent number: 9417163Abstract: Provided is an analyzer for a substance, including: a first particle holding unit having a tubular shape; a first intake pipe for sucking a gas from an upper side of the first particle holding unit to cause a cyclonic phenomenon inside the first particle holding unit; a first supply pipe for supplying a sample containing particles, the first supply pipe being connected to a side surface of the first particle holding unit; a first flow control unit for controlling a flow rate of a gas flowing into the first particle holding unit to hold the rotationally moving particles inside the first particle holding unit for a predetermined time period and then cause the particles to settle, the first flow control unit being connected to a lower part of the first particle holding unit; a first collection heating unit for collecting and heating the settled particles; and an analysis unit for analyzing a substance vaporized from the particles through the heating by the first collection heating unit, the analysis unit being cType: GrantFiled: February 27, 2014Date of Patent: August 16, 2016Assignee: HITACHI, LTD.Inventors: Hisashi Nagano, Yasuaki Takada, Yuichiro Hashimoto, Masakazu Sugaya, Hideo Kashima, Koichi Terada, Yasutaka Suzuki
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Patent number: 9261437Abstract: Sample fine particles attached to an inspection object are identified simply and with high accuracy, and an increase in operation rate and a decrease in device size are achieved. The inspection object is transported into a sampling chamber defined by a pair of side walls and an upper wall enclosing a part of a transport route of a transport unit. The inspection object is sprayed with compressed gas from an air nozzle, the peeled sample fine particles are aspirated into a collector, and the sample fine particles are separated from the aspirated gas for analysis. The air nozzle is disposed on one of the side walls defining the sampling chamber. The collector is disposed under the other side wall as a container independent from the sampling chamber.Type: GrantFiled: June 12, 2013Date of Patent: February 16, 2016Assignee: Hitachi, Ltd.Inventors: Hideo Kashima, Masakazu Sugaya, Koichi Terada, Yasutaka Suzuki, Hisashi Nagano, Yasuaki Takada, Yuichiro Hashimoto
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Publication number: 20150377851Abstract: An explosive detection apparatus capable of maintaining high availability even in an environment containing a large amount of foreign substances is achieved. The explosive detection apparatus includes means for sequentially replacing a plurality of collection thermal vaporization filters 2 for collecting, heating, vaporizing particles, which have been prepared in advance. The explosive detection apparatus also includes a preheating unit 52 for preheating an unused filter, and sealing is performed by a seal portion between the plurality of filters.Type: ApplicationFiled: October 28, 2013Publication date: December 31, 2015Applicant: Hitachi, Ltd.Inventors: Koichi TERADA, Masakazu SUGAYA, Hideo KASHIMA, Hisashi NAGANO, Yasuaki TAKADA, Hiromi SATOU
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Publication number: 20150233796Abstract: Sample fine particles attached to an inspection object are identified simply and with high accuracy, and an increase in operation rate and a decrease in device size are achieved. The inspection object is transported into a sampling chamber defined by a pair of side walls and an upper wall enclosing a part of a transport route of a transport unit. The inspection object is sprayed with compressed gas from an air nozzle, the peeled sample fine particles are aspirated into a collector, and the sample fine particles are separated from the aspirated gas for analysis. The air nozzle is disposed on one of the side walls defining the sampling chamber. The collector is disposed under the other side wall as a container independent from the sampling chamber.Type: ApplicationFiled: June 12, 2013Publication date: August 20, 2015Inventors: Hideo Kashima, Masakazu Sugaya, Koichi Terada, Yasutaka Suzuki, Hisashi Nagano, Yasuaki Takada, Yuichiro Hashimoto
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Publication number: 20150136975Abstract: In a conventional fine particle detection device that vaporizes fine particles attached to the object of examination by heating, processing capability decreases as the processing time elapses due to the influence of deposition of fine particles other than the object of examination, dirt/dust, a residue of the fine particles as the object of examination, or residual matter.Type: ApplicationFiled: April 30, 2013Publication date: May 21, 2015Inventors: Masakazu Sugaya, Koichi Terada, Hideo Kashima, Yasuaki Takada, Hisashi Nagano