Patents by Inventor Yasuaki Takada

Yasuaki Takada has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20250016371
    Abstract: An arithmetic coding scheme is provided for coding and decoding 3D data and improves coding efficiency for mesh displacements and high-quality coding, and decoding of the 3D data. A 3D data decoding apparatus is also provided for decoding coded data. The apparatus contains an arithmetic decoder that is configured to arithmetically decode a mesh displacement from the coded data. The arithmetic decoder decodes, from the coded data, a first flag indicating whether a coefficient of the mesh displacement has an absolute value greater than 0, a second flag indicating whether the coefficient has an absolute value greater than 1, and a third flag indicating whether the coefficient has an absolute value greater than 2.
    Type: Application
    Filed: February 22, 2024
    Publication date: January 9, 2025
    Inventors: YASUAKI TOKUMO, Keiichiro TAKADA, TOMOHIRO IKAI, TAKESHI CHUJOH, TOMOKO AONO
  • Publication number: 20250005803
    Abstract: A video coding scheme for encoding and decoding 3D data encodes and decodes a mesh displacement image as an image in a 4:2:0 format, reduces distortion caused by encoding, and encodes and decodes 3D data with high quality. A 3D data decoding apparatus includes a video decoder that is configured to decode a mesh displacement image decoded from a geometry video stream in which a Unit Type of coded data is V3C_GVD and a displacement unmapper that is configured to derive a mesh displacement per position pos and component compIdx from the mesh displacement image. The displacement unmapper is further configured to derive a Y coordinate of a geometry image from a product of a height and a variable from 0 to a value indicating a number of dimensions of geometry minus 1 to derive the mesh displacement in a case that the geometry image is in a 4:2:0 format.
    Type: Application
    Filed: February 22, 2024
    Publication date: January 2, 2025
    Inventors: Yasuaki Tokumo, Keiichiro Takada, Tomohiro Ikai, Takeshi Chujoh, Tomoko Aono
  • Patent number: 12177490
    Abstract: Object There is the problem in the related art that the relationship between a patch size which is a unit of processing of a neural network and the sizes of input and output pictures is not clearly defined.
    Type: Grant
    Filed: April 10, 2023
    Date of Patent: December 24, 2024
    Assignee: SHARP KABUSHIKI KAISHA
    Inventors: Takeshi Chujoh, Tomohiro Ikai, Yukinobu Yasugi, Yasuaki Tokumo, Tomonori Hashimoto, Tomoko Aono, Keiichiro Takada
  • Publication number: 20240420378
    Abstract: A 3D data decoding apparatus for decoding coded data and decoding 3D data including attribute information includes a header decoder that decodes characteristics information of refinement and activation information of the refinement, and a refiner that performs refinement processing of an attribute frame or an geometry frame. Refinement target information indicating which of an occupancy, a geometry, or an attribute is to be used is decoded from coded data of the characteristics information and the refinement is performed using an image specified according to the refinement target information.
    Type: Application
    Filed: February 26, 2024
    Publication date: December 19, 2024
    Inventors: Keiichiro TAKADA, YASUAKI TOKUMO, TOMOHIRO IKAI, TAKESHI CHUJOH, TOMOKO AONO
  • Patent number: 11776800
    Abstract: A substance analyzer that includes, to enhance selectivity of substance analysis, the following: a heater that heats a medium for collecting a chemical substance adhering to a surface of an inspection object; a mass spectrometer that performs tandem mass spectrometry of vapor derived from the chemical substance heated and vaporized by the heater from the medium; and a control device that causes the mass spectrometer to perform, based on a temperature of the medium in the heater, tandem mass spectrometry for the chemical substance that is vaporized at the temperature of the medium using the vapor sent from the heater to the mass spectrometer.
    Type: Grant
    Filed: June 20, 2019
    Date of Patent: October 3, 2023
    Assignee: Hitachi High-Tech Corporation
    Inventors: Yasuaki Takada, Shun Kumano, Masuyuki Sugiyama, Tsukasa Shishika, Shinji Yoshioka, Akimasa Osaka
  • Publication number: 20220373434
    Abstract: An attached substance collection device comprising, a nozzle configured to jet gas upward, a surface equipped with an opening portion through which the gas jets, a collection opening through which the gas jetted toward an inspection object is collected, and a contact detection sensor configured to detect whether or not the inspection object has come into contact with the upper surface, wherein an attached substance attached to the inspection object is collected by using the gas, a height of a distal end of the nozzle is substantially equal to a height of the surface; or equal to or less than a height of the surface, the surface includes a recess portion, and, relative to a jet opening of the nozzle, the recess portion is closer to the collection opening, and is in contact with the jet opening of the nozzle or includes the jet opening of the nozzle.
    Type: Application
    Filed: June 17, 2020
    Publication date: November 24, 2022
    Inventors: Shun KUMANO, Yasuaki TAKADA, Tatsuo NOJIRI, Hisashi NAGANO, Hiroki MIZUNO, Takayuki FUJII
  • Publication number: 20220359182
    Abstract: A substance analyzer that includes, to enhance selectivity of substance analysis, the following: a heater that heats a medium for collecting a chemical substance adhering to a surface of an inspection object; a mass spectrometer that performs tandem mass spectrometry of vapor derived from the chemical substance heated and vaporized by the heater from the medium; and a control device that causes the mass spectrometer to perform, based on a temperature of the medium in the heater, tandem mass spectrometry for the chemical substance that is vaporized at the temperature of the medium using the vapor sent from the heater to the mass spectrometer.
    Type: Application
    Filed: June 20, 2019
    Publication date: November 10, 2022
    Applicant: Hitachi High-Tech Corporation
    Inventors: Yasuaki TAKADA, Shun KUMANO, Masuyuki SUGIYAMA, Tsukasa SHISHIKA, Shinji YOSHIOKA, Akimasa OSAKA
  • Patent number: 10989632
    Abstract: An object of the invention is to improve uniformity of a standard sample used for evaluating a gas flow type analysis system. The invention includes weighing a background into a container; adding a sample solution to the background; drying the sample solution; adding a solvent that can dissolve the sample into the container; and drying the solvent added to the container. The invention is also characterized in that the solvent is an organic solvent, in particular, acetone.
    Type: Grant
    Filed: November 27, 2017
    Date of Patent: April 27, 2021
    Assignee: Hitachi, Ltd.
    Inventors: Yasuaki Takada, Shun Kumano, Masuyuki Sugiyama, Hisashi Nagano, Tatsuo Nojiri, Hiroki Mizuno, Yuichiro Hashimoto
  • Publication number: 20200193545
    Abstract: To achieve inspection with both a high security level and high throughput, the present invention comprises: a step of acquiring personal information of a subject; a step of calculating a terrorism risk of the subject by referring the acquired personal information to a database storing a relationship between the personal information and the terrorism risk; and a step of using an inspection device for collecting an adhered matter on the subject or on an inspection object carried by the subject and/or a vapor from the adhered matter, ionizing and analyzing the collected matter, and determining whether or not the adhered matter is a dangerous material by referring the analysis result to the database; wherein inspection condition and/or judgement condition of the inspection device is changed on a per-subject basis so that a true positive rate of an inspection is varied according to a level of the calculated terrorism risk.
    Type: Application
    Filed: January 16, 2018
    Publication date: June 18, 2020
    Inventors: Shun KUMANO, Yuichiro HASHIMOTO, Masuyuki SUGIYAMA, Yasuaki TAKADA
  • Patent number: 10048172
    Abstract: In order to save a space for an apparatus for inspecting a substance and reduce a cost thereof, a particle testing apparatus includes a plurality of collection ports for collecting substances to be inspected, centrifuges for concentrating particles collected in the collection ports, the centrifuges being connected to the respective collection ports in pairs, and a common analysis apparatus for acquiring the concentrated particles from the centrifuges and analyzing the particles, the analysis apparatus being connected to the centrifuges.
    Type: Grant
    Filed: March 24, 2014
    Date of Patent: August 14, 2018
    Assignee: Hitachi, Ltd.
    Inventors: Masakazu Sugaya, Hideo Kashima, Koichi Terada, Yasuaki Takada, Hisashi Nagano
  • Publication number: 20180149563
    Abstract: An object of the invention is to improve uniformity of a standard sample used for evaluating a gas flow type analysis system. The invention includes weighing a background into a container; adding a sample solution to the background; drying the sample solution; adding a solvent that can dissolve the sample into the container; and drying the solvent added to the container. The invention is also characterized in that the solvent is an organic solvent, in particular, acetone.
    Type: Application
    Filed: November 27, 2017
    Publication date: May 31, 2018
    Inventors: Yasuaki TAKADA, Shun KUMANO, Masuyuki SUGIYAMA, Hisashi NAGANO, Tatsuo NOJIRI, Hiroki MIZUNO, Yuichiro HASHIMOTO
  • Patent number: 9850696
    Abstract: In a conventional fine particle detection device that vaporizes fine particles attached to the object of examination by heating, processing capability decreases as the processing time elapses due to the influence of deposition of fine particles other than the object of examination, dirt/dust, a residue of the fine particles as the object of examination, or residual matter.
    Type: Grant
    Filed: April 30, 2013
    Date of Patent: December 26, 2017
    Assignee: Hitachi, Ltd.
    Inventors: Masakazu Sugaya, Koichi Terada, Hideo Kashima, Yasuaki Takada, Hisashi Nagano
  • Patent number: 9696288
    Abstract: Provided is a technique to identify a sample substance attached to an inspection target easily and precisely, while improving the rate of operation and reducing the number of persons required for inspection. A trace detecting system includes detection means to detect the size (vertical and horizontal dimensions) of an inspection target, and selects an air nozzle capable of spraying air jet at 15 m/s or more to the surface of the inspection target for air jet spraying.
    Type: Grant
    Filed: October 2, 2012
    Date of Patent: July 4, 2017
    Assignee: HITACHI, LTD.
    Inventors: Hideo Kashima, Masakazu Sugaya, Koichi Terada, Yasunori Doi, Yasutaka Suzuki, Hisashi Nagano, Yuichiro Hashimoto, Yasuaki Takada
  • Publication number: 20170102296
    Abstract: In order to save a space for an apparatus for inspecting a substance and reduce a cost thereof, a particle testing apparatus includes a plurality of collection ports for collecting substances to be inspected, centrifuges for concentrating particles collected in the collection ports, the centrifuges being connected to the respective collection ports in pairs, and a common analysis apparatus for acquiring the concentrated particles from the centrifuges and analyzing the particles, the analysis apparatus being connected to the centrifuges.
    Type: Application
    Filed: March 24, 2014
    Publication date: April 13, 2017
    Applicant: Hitachi, Ltd.
    Inventors: Masakazu SUGAYA, Hideo KASHIMA, Koichi TERADA, Yasuaki TAKADA, Hisashi NAGANO
  • Patent number: 9423388
    Abstract: An explosive detection apparatus capable of maintaining high availability even in an environment containing a large amount of foreign substances is achieved. The explosive detection apparatus includes means for sequentially replacing a plurality of collection thermal vaporization filters 2 for collecting, heating, vaporizing particles, which have been prepared in advance. The explosive detection apparatus also includes a preheating unit 52 for preheating an unused filter, and sealing is performed by a seal portion between the plurality of filters.
    Type: Grant
    Filed: October 28, 2013
    Date of Patent: August 23, 2016
    Assignee: Hitachi, Ltd.
    Inventors: Koichi Terada, Masakazu Sugaya, Hideo Kashima, Hisashi Nagano, Yasuaki Takada, Hiromi Satou
  • Patent number: 9417163
    Abstract: Provided is an analyzer for a substance, including: a first particle holding unit having a tubular shape; a first intake pipe for sucking a gas from an upper side of the first particle holding unit to cause a cyclonic phenomenon inside the first particle holding unit; a first supply pipe for supplying a sample containing particles, the first supply pipe being connected to a side surface of the first particle holding unit; a first flow control unit for controlling a flow rate of a gas flowing into the first particle holding unit to hold the rotationally moving particles inside the first particle holding unit for a predetermined time period and then cause the particles to settle, the first flow control unit being connected to a lower part of the first particle holding unit; a first collection heating unit for collecting and heating the settled particles; and an analysis unit for analyzing a substance vaporized from the particles through the heating by the first collection heating unit, the analysis unit being c
    Type: Grant
    Filed: February 27, 2014
    Date of Patent: August 16, 2016
    Assignee: HITACHI, LTD.
    Inventors: Hisashi Nagano, Yasuaki Takada, Yuichiro Hashimoto, Masakazu Sugaya, Hideo Kashima, Koichi Terada, Yasutaka Suzuki
  • Patent number: 9261437
    Abstract: Sample fine particles attached to an inspection object are identified simply and with high accuracy, and an increase in operation rate and a decrease in device size are achieved. The inspection object is transported into a sampling chamber defined by a pair of side walls and an upper wall enclosing a part of a transport route of a transport unit. The inspection object is sprayed with compressed gas from an air nozzle, the peeled sample fine particles are aspirated into a collector, and the sample fine particles are separated from the aspirated gas for analysis. The air nozzle is disposed on one of the side walls defining the sampling chamber. The collector is disposed under the other side wall as a container independent from the sampling chamber.
    Type: Grant
    Filed: June 12, 2013
    Date of Patent: February 16, 2016
    Assignee: Hitachi, Ltd.
    Inventors: Hideo Kashima, Masakazu Sugaya, Koichi Terada, Yasutaka Suzuki, Hisashi Nagano, Yasuaki Takada, Yuichiro Hashimoto
  • Publication number: 20150377851
    Abstract: An explosive detection apparatus capable of maintaining high availability even in an environment containing a large amount of foreign substances is achieved. The explosive detection apparatus includes means for sequentially replacing a plurality of collection thermal vaporization filters 2 for collecting, heating, vaporizing particles, which have been prepared in advance. The explosive detection apparatus also includes a preheating unit 52 for preheating an unused filter, and sealing is performed by a seal portion between the plurality of filters.
    Type: Application
    Filed: October 28, 2013
    Publication date: December 31, 2015
    Applicant: Hitachi, Ltd.
    Inventors: Koichi TERADA, Masakazu SUGAYA, Hideo KASHIMA, Hisashi NAGANO, Yasuaki TAKADA, Hiromi SATOU
  • Publication number: 20150233796
    Abstract: Sample fine particles attached to an inspection object are identified simply and with high accuracy, and an increase in operation rate and a decrease in device size are achieved. The inspection object is transported into a sampling chamber defined by a pair of side walls and an upper wall enclosing a part of a transport route of a transport unit. The inspection object is sprayed with compressed gas from an air nozzle, the peeled sample fine particles are aspirated into a collector, and the sample fine particles are separated from the aspirated gas for analysis. The air nozzle is disposed on one of the side walls defining the sampling chamber. The collector is disposed under the other side wall as a container independent from the sampling chamber.
    Type: Application
    Filed: June 12, 2013
    Publication date: August 20, 2015
    Inventors: Hideo Kashima, Masakazu Sugaya, Koichi Terada, Yasutaka Suzuki, Hisashi Nagano, Yasuaki Takada, Yuichiro Hashimoto
  • Publication number: 20150136975
    Abstract: In a conventional fine particle detection device that vaporizes fine particles attached to the object of examination by heating, processing capability decreases as the processing time elapses due to the influence of deposition of fine particles other than the object of examination, dirt/dust, a residue of the fine particles as the object of examination, or residual matter.
    Type: Application
    Filed: April 30, 2013
    Publication date: May 21, 2015
    Inventors: Masakazu Sugaya, Koichi Terada, Hideo Kashima, Yasuaki Takada, Hisashi Nagano