Patents by Inventor Yasuhiko Iguchi

Yasuhiko Iguchi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20070216435
    Abstract: An apparatus of measuring characteristics of a plurality of semiconductor devices with a plurality of measurement units is disclosed. The apparatus includes a parallel measurement executability determination section and a plurality of measurement function sections. The parallel measurement executability determination section identifies sets of a semiconductor device and a measurement function, which are able to be measured in parallel based on connection information of the semiconductor devices. The plurality of measurement function sections use a first abstractive name which abstractively identifies the plurality of measurement units for the sets of the measurement functions and the semiconductor device which are able to be measured in parallel by the parallel measurement executability determination section.
    Type: Application
    Filed: March 14, 2007
    Publication date: September 20, 2007
    Inventor: Yasuhiko Iguchi
  • Patent number: 7053897
    Abstract: A data analysis method, apparatus, and storage medium having computer readable program instructions embodied therein for use on a spreadsheet software having a plurality of cells displayed as a two-dimensional table on a computer including assigning to a first cell a definition of array representation data including a single array or multiple arrays of data, displaying to the first cell a first array display button, and selectively displaying the array representation data in a graphical or table format using an array data display device when the array display button is selected.
    Type: Grant
    Filed: June 18, 2003
    Date of Patent: May 30, 2006
    Assignee: Agilent Technologies, Inc.
    Inventor: Yasuhiko Iguchi
  • Patent number: 7035752
    Abstract: A semiconductor test data analysis system (1) automatically recording, during an analysis operation, operation information of the analysis operation, including analysis conditions or an analysis procedure for input test data, or analysis information obtained by the analysis operation. The analysis system includes a processing means (101), an analysis target data storage means (109), which stores the test data as analysis target data, a historical data storage means (107), which stores as historical data either operation information of the analysis operation or analysis information obtained by the analysis operation, and a display data storage means (112), which stores analysis information obtained by the analysis operation, which stores analysis display data generated by the processing means for the purpose of displaying the analysis information obtained by the analysis operation.
    Type: Grant
    Filed: January 4, 2005
    Date of Patent: April 25, 2006
    Assignee: Agilent Technologies, Inc.
    Inventors: Yasuhiko Iguchi, Hiroshi Tamura, Mitsuhiro Enokida, Earl Louis Dombroski, Thomas Robert Claus
  • Publication number: 20050119852
    Abstract: A semiconductor test data analysis system (1) automatically recording, during an analysis operation, operation information of the analysis operation, including analysis conditions or an analysis procedure for input test data, or analysis information obtained by the analysis operation. The analysis system includes a processing means (101), an analysis target data storage means (109), which stores the test data as analysis target data, a historical data storage means (107), which stores as historical data either operation information of the analysis operation or analysis information obtained by the analysis operation, and a display data storage means (112), which stores analysis information obtained by the analysis operation, which stores analysis display data generated by the processing means for the purpose of displaying the analysis information obtained by the analysis operation.
    Type: Application
    Filed: January 4, 2005
    Publication date: June 2, 2005
    Inventors: Yasuhiko Iguchi, Hiroshi Tamura, Mitsuhiro Enokida, Earl Dombroski, Thomas Claus
  • Patent number: 6898545
    Abstract: A semiconductor test data analysis system (1) automatically recording, during an analysis operation, operation information of the analysis operation, including analysis conditions or an analysis procedure for input test data, or analysis information obtained by the analysis operation. The analysis system includes a processing means (101), an analysis target data storage means (109), which stores the test data as analysis target data, a historical data storage means (107), which stores as historical data either operation information of the analysis operation or analysis information obtained by the analysis operation, and a display data storage means (112), which stores analysis information obtained by the analysis operation, which stores analysis display data generated by the processing means for the purpose of displaying the analysis information obtained by the analysis operation.
    Type: Grant
    Filed: June 28, 2002
    Date of Patent: May 24, 2005
    Assignees: Agilent Technologies Inc, Sandia Technologies, Inc
    Inventors: Yasuhiko Iguchi, Hiroshi Tamura, Mitsuhiro Enokida, Earl Louis Dombroski, Thomas Robert Claus
  • Publication number: 20040002829
    Abstract: A semiconductor test data analysis system (1) automatically recording, during an analysis operation, operation information of the analysis operation, including analysis conditions or an analysis procedure for input test data, or analysis information obtained by the analysis operation. The analysis system includes a processing means (101), an analysis target data storage means (109), which stores the test data as analysis target data, a historical data storage means (107), which stores as historical data either operation information of the analysis operation or analysis information obtained by the analysis operation, and a display data storage means (112), which stores analysis information obtained by the analysis operation, which stores analysis display data generated by the processing means for the purpose of displaying the analysis information obtained by the analysis operation.
    Type: Application
    Filed: June 28, 2002
    Publication date: January 1, 2004
    Applicant: Agilent technologies, Inc. and Sandia Technologies, Inc.
    Inventors: Yasuhiko Iguchi, Hiroshi Tamura, Enokida Mitsuhiro, Earl Louis Dombroski, Thomas Robert Claus
  • Publication number: 20040001096
    Abstract: A data analysis apparatus having a graph display device that displays a graph of data that are the subject of display, a map display device pertaining to the test position of data that are the subject of display, and a graph element selection device, with which the desired graphed data on the graph display device are selected and the mapped data on the map display device relating to the data that have been selected are displayed in highlighted form, or a data analysis apparatus further comprising a map element selection device, with which the desired data on the map display device are selected and graphed data on the graph display device related to the mapped data that have been selected are displayed in highlighted form.
    Type: Application
    Filed: June 19, 2003
    Publication date: January 1, 2004
    Inventors: Hiroshi Tamura, Yasuhiko Iguchi, Mitsuhiro Enokida
  • Publication number: 20040002827
    Abstract: A data analysis method, apparatus, and storage medium having computer readable program instructions embodied therein for use on a spreadsheet software having a plurality of cells displayed as a two-dimensional table on a computer including assigning to a first cell a definition of array representation data including a single array or multiple arrays of data, displaying to the first cell a first array display button, and selectively displaying the array representation data in a graphical or table format using an array data display device when the array display button is selected.
    Type: Application
    Filed: June 18, 2003
    Publication date: January 1, 2004
    Applicant: AGILENT TECHNOLOGIES, INC.
    Inventor: Yasuhiko Iguchi