Abstract: An apparatus of measuring characteristics of a plurality of semiconductor devices with a plurality of measurement units is disclosed. The apparatus includes a parallel measurement executability determination section and a plurality of measurement function sections. The parallel measurement executability determination section identifies sets of a semiconductor device and a measurement function, which are able to be measured in parallel based on connection information of the semiconductor devices. The plurality of measurement function sections use a first abstractive name which abstractively identifies the plurality of measurement units for the sets of the measurement functions and the semiconductor device which are able to be measured in parallel by the parallel measurement executability determination section.

Abstract: A data analysis method, apparatus, and storage medium having computer readable program instructions embodied therein for use on a spreadsheet software having a plurality of cells displayed as a two-dimensional table on a computer including assigning to a first cell a definition of array representation data including a single array or multiple arrays of data, displaying to the first cell a first array display button, and selectively displaying the array representation data in a graphical or table format using an array data display device when the array display button is selected.

Abstract: A semiconductor test data analysis system (1) automatically recording, during an analysis operation, operation information of the analysis operation, including analysis conditions or an analysis procedure for input test data, or analysis information obtained by the analysis operation. The analysis system includes a processing means (101), an analysis target data storage means (109), which stores the test data as analysis target data, a historical data storage means (107), which stores as historical data either operation information of the analysis operation or analysis information obtained by the analysis operation, and a display data storage means (112), which stores analysis information obtained by the analysis operation, which stores analysis display data generated by the processing means for the purpose of displaying the analysis information obtained by the analysis operation.

Abstract: A semiconductor test data analysis system (1) automatically recording, during an analysis operation, operation information of the analysis operation, including analysis conditions or an analysis procedure for input test data, or analysis information obtained by the analysis operation. The analysis system includes a processing means (101), an analysis target data storage means (109), which stores the test data as analysis target data, a historical data storage means (107), which stores as historical data either operation information of the analysis operation or analysis information obtained by the analysis operation, and a display data storage means (112), which stores analysis information obtained by the analysis operation, which stores analysis display data generated by the processing means for the purpose of displaying the analysis information obtained by the analysis operation.

Abstract: A semiconductor test data analysis system (1) automatically recording, during an analysis operation, operation information of the analysis operation, including analysis conditions or an analysis procedure for input test data, or analysis information obtained by the analysis operation. The analysis system includes a processing means (101), an analysis target data storage means (109), which stores the test data as analysis target data, a historical data storage means (107), which stores as historical data either operation information of the analysis operation or analysis information obtained by the analysis operation, and a display data storage means (112), which stores analysis information obtained by the analysis operation, which stores analysis display data generated by the processing means for the purpose of displaying the analysis information obtained by the analysis operation.

Abstract: A data analysis method, apparatus, and storage medium having computer readable program instructions embodied therein for use on a spreadsheet software having a plurality of cells displayed as a two-dimensional table on a computer including assigning to a first cell a definition of array representation data including a single array or multiple arrays of data, displaying to the first cell a first array display button, and selectively displaying the array representation data in a graphical or table format using an array data display device when the array display button is selected.

Abstract: A semiconductor test data analysis system (1) automatically recording, during an analysis operation, operation information of the analysis operation, including analysis conditions or an analysis procedure for input test data, or analysis information obtained by the analysis operation. The analysis system includes a processing means (101), an analysis target data storage means (109), which stores the test data as analysis target data, a historical data storage means (107), which stores as historical data either operation information of the analysis operation or analysis information obtained by the analysis operation, and a display data storage means (112), which stores analysis information obtained by the analysis operation, which stores analysis display data generated by the processing means for the purpose of displaying the analysis information obtained by the analysis operation.

Abstract: A data analysis apparatus having a graph display device that displays a graph of data that are the subject of display, a map display device pertaining to the test position of data that are the subject of display, and a graph element selection device, with which the desired graphed data on the graph display device are selected and the mapped data on the map display device relating to the data that have been selected are displayed in highlighted form, or a data analysis apparatus further comprising a map element selection device, with which the desired data on the map display device are selected and graphed data on the graph display device related to the mapped data that have been selected are displayed in highlighted form.