Patents by Inventor Yasuhiro Edo

Yasuhiro Edo has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Semiconductor device capable of decreasing an internal voltage in period of acceleration test
    Patent number: 5923157
    Abstract: In a semiconductor device comprises an internal circuit and which is supplied with an external voltage, the internal circuit is operated in an internal voltage having a high internal level and a low internal level. A voltage decreasing circuit decreases the high internal level of the internal voltage. A controlling circuit controls decrease of the internal voltage in response to an external control signal OEB.
    Type: Grant
    Filed: May 15, 1997
    Date of Patent: July 13, 1999
    Assignee: NEC Corporation
    Inventor: Yasuhiro Edo
  • Semiconductor integrated circuit device equipped with answer system for teaching optional functions to diagnostic system
    Patent number: 5487042
    Abstract: An answer system incorporated in a dynamic random access memory device informs user's options to a diagnostic system in a diagnostic mode, and allows the diagnostic system to automatically proceed to appropriate test programs stored therein, thereby causing the test programs to be shared between different models of the dynamic random access memory device.
    Type: Grant
    Filed: March 3, 1994
    Date of Patent: January 23, 1996
    Assignee: NEC Corporation
    Inventor: Yasuhiro Edo