Abstract: A control apparatus according to one or more embodiments generates poses of the measurement device to measure an object, determines, for the measurement device, a measurement path including the poses to cause the measurement device to move along the measurement path including the poses and to measure the object, instructs the robot to move the measurement device along a movement path including the measurement path and instructs the measurement device to measure the object in the poses, recognizes the object using obtained measurement data, and determines the measurement path for the measurement device for a next operating cycle.

Abstract: Provided is an inter-reflection detection apparatus including: an irradiation unit configured to emit light having variable-frequency sinusoidal patterns; an image acquisition unit configured to acquire an image of an object irradiated with the light from the irradiation unit; a phase determination unit configured to determine a phase at each position in the image; and a detection unit configured to detect a region in which inter-reflection occurs. The detection unit is configured to determine a phase difference between a phase acquired from an image generated by irradiation of a low-frequency sinusoidal pattern and a phase acquired from an image generated by irradiation of a high-frequency sinusoidal pattern for a plurality of combinations of low-frequency waves and high-frequency waves, and determine that inter-reflection occurs in a region in which the phase difference for any one of the plurality of combinations is equal or more than a threshold.

Abstract: The three-dimensional measurement apparatus includes a light projecting unit projects, onto a target, a pattern in which data is encoded, an image capturing unit captures an image of the target onto which the pattern is projected, and a calculation unit calculates positions of a three-dimensional point group based on positions of the feature points and the decoded data, in which the pattern includes unit patterns that each expresses at least two bits and are used in order to calculate the positions of the three-dimensional point group, the unit patterns each includes a first region and a second region that has an area that is larger than an area of the first region, and an area ratio between the first region and the second region is at least 0.3 and not more than 0.9.

Abstract: A three-dimensional measurement system capable of realizing high-speed processing while increasing measurement resolution are provided. The system includes: an image capture unit including a first and second image capture units that are spaced apart; a first calculation unit calculates a parallax at first feature points in the images using distance information of a three-dimensional measurement method other than a stereo camera method or information for calculating a distance, using at least one of the first and second image capture units; and a second calculation unit calculates a parallax at second feature points based on a corresponding point for the second feature point by using the stereo camera method using the first and second image capture units, and specifies a three-dimensional shape based on the parallax at the first and second feature points. The second calculation unit sets a search area based on the parallax at the first feature points.

Abstract: The three-dimensional measurement apparatus includes a light projecting unit projects, onto a target, a pattern in which data is encoded, an image capturing unit captures an image of the target onto which the pattern is projected, and a calculation unit calculates positions of a three-dimensional point group based on positions of the feature points and the decoded data, in which the pattern includes unit patterns that each expresses at least two bits and are used in order to calculate the positions of the three-dimensional point group, the unit patterns each includes a first region and a second region that has an area that is larger than an area of the first region, and an area ratio between the first region and the second region is at least 0.3 and not more than 0.9.

Abstract: A three-dimensional measurement system capable of realizing high-speed processing while increasing measurement resolution are provided. The system includes: an image capture unit including a first and second image capture units that are spaced apart; a first calculation unit calculates a parallax at first feature points in the images using distance information of a three-dimensional measurement method other than a stereo camera method or information for calculating a distance, using at least one of the first and second image capture units; and a second calculation unit calculates a parallax at second feature points based on a corresponding point for the second feature point by using the stereo camera method using the first and second image capture units, and specifies a three-dimensional shape based on the parallax at the first and second feature points. The second calculation unit sets a search area based on the parallax at the first feature points.

Abstract: A control device assumes that observation light observed by an imaging device is composite light of primary reflection light and secondary reflection light. The control device acquires three or more samples of a brightness amplitude value of the observation light, calculates a phase error caused by the secondary reflection light using these samples, calculates a corrected phase value by correcting a phase value of the observation light using the phase error, and calculates a three-dimensional position of the measurement point on the measurement object based on the corrected phase value.

Abstract: A robot control device executes: capturing, using a hand-eye camera, a first image for use in image processing for determining a first target motion of a robot, and a second image for use in image processing for determining a second target motion following the first target motion; performing the image processing for determining the first target motion and the second target motion based on the first image and the second image, respectively; controlling the motion of the robot based on the first target motion and the second target motion. The image processing for determining the second target motion based on the second image is performed while the robot is in motion based on the first target motion. An image capturing device 82 captures the second image before the motion of a robot 60 based on the first target motion is completed.

Abstract: A control device acquires a plurality of observation signals observed using a plurality of projection patterns having different spatial frequencies, as observation signals for a measurement point on a measurement object. The control device repeatedly executes processing for estimating two component signals included in each observation signal, so as to separate the observation signal into two component signals, and calculate a three-dimensional position of the measurement point based on the phases of the separated component signals.

Abstract: Provided is an inter-reflection detection apparatus including: an irradiation unit configured to emit light having variable-frequency sinusoidal patterns: an image acquisition unit configured to acquire an image of an object irradiated with the light from the irradiation unit; a phase determination unit configured to determine a phase at each position in the image, and a detection unit configured to detect a region in which inter-reflection occurs. The detection unit is configured to determine a phase difference between a phase acquired from an image generated by irradiation of a low-frequency sinusoidal pattern and a phase acquired from an image generated by irradiation of a high-frequency sinusoidal pattern for a plurality of combinations of low-frequency waves and high-frequency waves, and determine that inter-reflection occurs in a region in which the phase difference for any one of the plurality of combinations is equal or more than a threshold.

Abstract: A control device assumes that observation light observed by an imaging device is composite light of primary reflection light and secondary reflection light. The control device acquires three or more samples of a brightness amplitude value of the observation light, calculates a phase error caused by the secondary reflection light using these samples, calculates a corrected phase value by correcting a phase value of the observation light using the phase error, and calculates a three-dimensional position of the measurement point on the measurement object based on the corrected phase value.

Abstract: A control device acquires a plurality of observation signals observed using a plurality of projection patterns having different spatial frequencies, as observation signals for a measurement point on a measurement object. The control device repeatedly executes processing for estimating two component signals included in each observation signal, so as to separate the observation signal into two component signals, and calculate a three-dimensional position of the measurement point based on the phases of the separated component signals.

Abstract: A measurement target is captured using two types of illumination patterns set such that only color features of specular objects change, the two images that are obtained are compared, and objects are identified as being specular objects or diffuse objects depending on whether the color features change markedly. At this time, the emission intensity distribution of each illumination pattern is devised such that specular lobe components that are included in reflected light are canceled out.

Abstract: In an inspection apparatus having a projection device for projecting pattern light and an obliquely arranged camera, a technology is provided with which favorable measurement performance for measuring solder shapes is realized. If an illumination device is provided with openings for projection devices, then the openings are formed at azimuth directions that are from the X-axis direction and the Y-axis direction. If both an opening for a projection device and an opening for an obliquely arranged camera are provided, then they are arranged at different azimuth directions. Alternatively, it is also possible to provide a supplementary illumination device to supplement deficiencies in the illumination light due to the openings. Alternatively, it is also possible to match the optical axes of the projection device and the obliquely arranged camera and to provide a shared opening.

Abstract: A measurement target is captured using two types of illumination patterns set such that only color features of specular objects change, the two images that are obtained are compared, and objects are identified as being specular objects or diffuse objects depending on whether the color features change markedly. At this time, the emission intensity distribution of each illumination pattern is devised such that specular lobe components that are included in reflected light are canceled out.

Abstract: An observing apparatus includes a lighting device for irradiating a surface of a measuring target with light having a first light source distribution, and an imaging section for imaging the surface of the measuring target. Considering a first plane passing through a measurement point, the first light source distribution is set such that: (1) a radiance L11(?) changes in a continuous or stepwise manner according to an angle ?, and (2) the radiance L11(?) is not zero in a local region of a predetermined range of ±? having a point located at a predetermined angle ?c as a center on the first plane when viewed from the measurement point, and the following equation substantially holds for arbitrary a satisfying 0<a??; L11(?c?a)+L11(?c+a)=2×L11(?c).

Abstract: A surface state inspection apparatus has a lighting device that irradiates an inspection target placed on a stage with light, an imaging device that images the inspection target, and a detection device that detects a surface defect of the inspection target by analyzing a first inspection image obtained by the imaging device. The lighting device is a surface light source that includes a light emission region having a predetermined size and, in the lighting device, portions of light emitted from positions in the light emission region differ from each other in a spectral distribution. The detection device detects a portion in which a hue is different from that of its surrounding portion in the inspection target surface as a flaw. The detection device detects a portion in which the hue is substantially equal to that of its surrounding portion while brightness is different from that of its surrounding portion as a stain.

Abstract: The shape measurement apparatus calculates a characteristic amount for a plurality of points of interest on a surface of a measurement target object, based on an image obtained by image capturing with a camera, calculates an orientation of a normal line based on a value of the characteristic amount by referencing data stored in advance in a storage device, and restores the three-dimensional shape of the surface of the measurement target object based on a result of the calculation. The storage device stores a plurality of data sets generated respectively for a plurality of reference positions arranged in a field of view of the camera, and the data set to be referenced is switched depending on a position of a point of interest.

Abstract: A shape measuring apparatus that measures a three-dimensional shape of a measuring target has a lighting device that irradiates the measuring target placed on a stage with light, an imaging device that takes an image of the measuring target, a shape calculating device that calculates orientations of normals at a plurality of points on a surface of the measuring target from an image, the image being obtained by performing imaging with the imaging device while the lighting device irradiates the measuring target with the light, the shape calculating device calculating the three-dimensional shape of the surface of the measuring target from the calculation result of the orientations of the normals, a ranging device that measures a distance from a predetermined reference position with respect to at least one point on the surface of the measuring target, and a determination device that determines a spatial position of the three-dimensional shape of the surface of the measuring target, the three-dimensional shape bei

Abstract: A shape measuring apparatus that measures a three-dimensional shape of a measuring target has a lighting device that irradiates the measuring target placed on a stage with light, an imaging device that takes an image of the measuring target, a shape calculating device that calculates orientations of normals at a plurality of points on a surface of the measuring target from an image, the image being obtained by performing imaging with the imaging device while the lighting device irradiates the measuring target with the light, the shape calculating device calculating the three-dimensional shape of the surface of the measuring target from the calculation result of the orientations of the normals, a ranging device that measures a distance from a predetermined reference position with respect to at least one point on the surface of the measuring target, and a determination device that determines a spatial position of the three-dimensional shape of the surface of the measuring target, the three-dimensional shape bei