Patents by Inventor Yasuhiro Takahama

Yasuhiro Takahama has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20220412727
    Abstract: An illumination device has a light source unit, a lens unit, and a filter unit An imaging device receives object light, generated by the illumination light, from the measurement object at a predetermined observation solid angle, and pixels of the imaging device can each identify the different light wavelength ranges. A processing device includes an arithmetic unit configured to obtain a normal vector at each point of the measurement object corresponding to each pixel from inclusion relation between the plurality of solid angle regions, constituting the object light, and the predetermined observation solid angle, and a shape reconstruction unit configured to reconstruct the shape of the measurement object.
    Type: Application
    Filed: November 26, 2020
    Publication date: December 29, 2022
    Applicants: Machine Vision Lighting Inc., MITUTOYO CORPORATION
    Inventors: Shigeki MASUMURA, Yasuhiro TAKAHAMA, Jyota MIYAKURA, Masaoki YAMAGATA
  • Patent number: 10578414
    Abstract: An inner-wall measuring instrument includes: a placement surface on which an object to be measured is placed; a base relatively movable with respect to the placement surface in three axis directions orthogonal to one another; a touch probe that is disposed at a first position of the base and brought into contact with the object; an image probe that is disposed at a second position of the base and capable of imaging the object with a direction parallel to the placement surface being an imaging direction; a rotational drive unit that rotates the image probe around an axis extending in a direction perpendicular to the placement surface; a linear drive unit that moves the image probe in the imaging direction; and a calculator that calculates an offset amount between the touch probe disposed at the first position and the image probe disposed at the second position.
    Type: Grant
    Filed: February 22, 2017
    Date of Patent: March 3, 2020
    Assignee: MITUTOYO CORPORATION
    Inventor: Yasuhiro Takahama
  • Patent number: 10551174
    Abstract: The present invention includes a preparatory step of providing a calibration work piece having a flat reflecting surface as a work piece, and arranging the reflecting surface to be parallel to a standard optical axis and orthogonal or parallel to pixel array directions of an image capture element; a rotation step of rotating a prism centered on the standard optical axis; a brightness detection step of detecting the brightness of an image captured by the image capture element at each of a plurality of rotation positions of the prism; and a positioning step of aligning the prism at a rotation position where the brightness detected by the brightness detection step is greatest.
    Type: Grant
    Filed: October 16, 2018
    Date of Patent: February 4, 2020
    Assignee: MITUTOYO CORPORATION
    Inventor: Yasuhiro Takahama
  • Publication number: 20190220185
    Abstract: The present invention relates to an image measurement apparatus images an object to be measured, and measures dimensions and shape of the object to be measured based on an image of the object to be measured displayed on the touch-sensitive panel display. The apparatus comprising: an controller that identifies a command corresponding to a gesture contact-input with respect to the touch-sensitive panel display from a signal output from the touch-sensitive panel display in response to the gesture, and executes the command with respect to a part in the image measurement apparatus, the part being the target of the execution of such command. The gesture is a gesture performed in the state in which the simultaneous touch is made at two or more points.
    Type: Application
    Filed: January 9, 2019
    Publication date: July 18, 2019
    Inventors: Gyokubu Cho, Koichi Komatsu, Yasuhiro Takahama, Hiraku Ishiyama, Barry Saylor, Dahai Yu, Ryan Northrup
  • Patent number: 10274313
    Abstract: According to an embodiment of the present invention, a method of measuring a surface of an object having a curved shape by measuring a distance from a measurement head to the object, includes: setting a measuring region of the object and a threshold value of concave and convex; acquiring shape reference data including the curved shape of the object; acquiring three-dimensional data of the surface of the object by measuring the distance between the object in the measuring region and the measurement head; acquiring curve removed data by removing the shape reference data from the three-dimensional data; calculating second reference data by calculating first reference data based on the curve removed data, by removing data exceeding the threshold value with respect to the first reference data, from the curve removed data, and by averaging the curve removed data; and calculating shape data of the concave and convex.
    Type: Grant
    Filed: February 23, 2017
    Date of Patent: April 30, 2019
    Assignee: MITUTOYO CORPORATION
    Inventors: Hiroshi Sakai, Yutaka Watanabe, Yasuhiro Takahama, Harumasa Ito, Yuji Kudo
  • Publication number: 20190113333
    Abstract: The present invention includes a preparatory step of providing a calibration work piece having a flat reflecting surface as a work piece, and arranging the reflecting surface to be parallel to a standard optical axis and orthogonal or parallel to pixel array directions of an image capture element; a rotation step of rotating a prism centered on the standard optical axis; a brightness detection step of detecting the brightness of an image captured by the image capture element at each of a plurality of rotation positions of the prism; and a positioning step of aligning the prism at a rotation position where the brightness detected by the brightness detection step is greatest.
    Type: Application
    Filed: October 16, 2018
    Publication date: April 18, 2019
    Applicant: MITUTOYO CORPORATION
    Inventor: Yasuhiro TAKAHAMA
  • Publication number: 20170248410
    Abstract: According to an embodiment of the present invention, a method of measuring a surface of an object having a curved shape by measuring a distance from a measurement head to the object, includes: setting a measuring region of the object and a threshold value of concave and convex; acquiring shape reference data including the curved shape of the object; acquiring three-dimensional data of the surface of the object by measuring the distance between the object in the measuring region and the measurement head; acquiring curve removed data by removing the shape reference data from the three-dimensional data; calculating second reference data by calculating first reference data based on the curve removed data, by removing data exceeding the threshold value with respect to the first reference data, from the curve removed data, and by averaging the curve removed data; and calculating shape data of the concave and convex.
    Type: Application
    Filed: February 23, 2017
    Publication date: August 31, 2017
    Applicant: MITUTOYO CORPORATION
    Inventors: Hiroshi SAKAI, Yutaka WATANABE, Yasuhiro TAKAHAMA, Harumasa ITO, Yuji KUDO
  • Publication number: 20170248399
    Abstract: An inner-wall measuring instrument includes: a placement surface on which an object to be measured is placed; a base relatively movable with respect to the placement surface in three axis directions orthogonal to one another; a touch probe that is disposed at a first position of the base and brought into contact with the object; an image probe that is disposed at a second position of the base and capable of imaging the object with a direction parallel to the placement surface being an imaging direction; a rotational drive unit that rotates the image probe around an axis extending in a direction perpendicular to the placement surface; a linear drive unit that moves the image probe in the imaging direction; and a calculator that calculates an offset amount between the touch probe disposed at the first position and the image probe disposed at the second position.
    Type: Application
    Filed: February 22, 2017
    Publication date: August 31, 2017
    Applicant: MITUTOYO CORPORATION
    Inventor: Yasuhiro TAKAHAMA
  • Patent number: 9341460
    Abstract: A double cone stylus includes a shank and a double cone-shaped tip attached to the tip end of the shank, the double cone-shaped tip being a rotationally symmetric body obtained by rotating a triangle having a base extending along the shank around the shank as the symmetric rotation axis. The double cone stylus allows the shape of an inner wall surface of a measurement object with the inner wall surface retracted from an upper reference plane to be measured from above.
    Type: Grant
    Filed: October 17, 2013
    Date of Patent: May 17, 2016
    Assignee: MITUTOYO CORPORATION
    Inventors: Masaki Kurihara, Yasuhiro Takahama, Masanori Arai, Tomoyuki Miyazaki
  • Publication number: 20140109420
    Abstract: A double cone stylus includes a shank and a double cone-shaped tip attached to the tip end of the shank, the double cone-shaped tip being a rotationally symmetric body obtained by rotating a triangle having a base extending along the shank around the shank as the symmetric rotation axis. The double cone stylus allows the shape of an inner wall surface of a measurement object with the inner wall surface retracted from an upper reference plane to be measured from above.
    Type: Application
    Filed: October 17, 2013
    Publication date: April 24, 2014
    Applicant: MITUTOYO CORPORATION
    Inventors: Masaki KURIHARA, Yasuhiro TAKAHAMA, Masanori ARAI, Tomoyuki MIYAZAKI
  • Patent number: 8416426
    Abstract: A calibrating jig comprises a reference sphere, and a reflecting plate configured to support the reference sphere from a lower side thereof and mirror-reflect light in a case that the reference sphere is illuminated from an upper side thereof.
    Type: Grant
    Filed: February 8, 2012
    Date of Patent: April 9, 2013
    Assignee: Mitutoyo Corporation
    Inventors: Masaoki Yamagata, Yasuhiro Takahama, Hiraku Ishiyama, Kentaro Nemoto
  • Publication number: 20120188558
    Abstract: A calibrating jig comprises a reference sphere, and a reflecting plate configured to support the reference sphere from a lower side thereof and mirror-reflect light in a case that the reference sphere is illuminated from an upper side thereof.
    Type: Application
    Filed: February 8, 2012
    Publication date: July 26, 2012
    Applicant: MITUTOYO CORPORATION
    Inventors: Masaoki YAMAGATA, Yasuhiro TAKAHAMA, Hiraku ISHIYAMA, Kentaro NEMOTO
  • Patent number: 8139229
    Abstract: A calibrating jig comprises a reference sphere, and a reflecting plate configured to support the reference sphere from a lower side thereof and mirror-reflect light in a case that the reference sphere is illuminated from an upper side thereof.
    Type: Grant
    Filed: June 22, 2009
    Date of Patent: March 20, 2012
    Assignee: Mitutoyo Corporation
    Inventors: Masaoki Yamagata, Yasuhiro Takahama, Hiraku Ishiyama, Kentaro Nemoto
  • Patent number: 7882723
    Abstract: A form measuring mechanism (100) which measures form of an object (102) by bringing a probe (124) into direct contact with the object includes a plurality of reference spheres (130a, 130b) for calibrating the probe, a judging system/controller (154) for judging form abnormal values common in position and size to each other and form abnormal values not common to each other obtained by measuring the reference spheres, and a notifying display unit (156) for notifying at least any one of a contamination or dust adhering state of the probe judged from the common form abnormal values and a worn state and contamination or dust adhering states of the reference spheres judged from the form abnormal values not common to each other.
    Type: Grant
    Filed: May 21, 2008
    Date of Patent: February 8, 2011
    Assignee: Mitutoyo Corporation
    Inventors: Yasuhiro Takahama, Masaoki Yamagata
  • Publication number: 20100007895
    Abstract: A calibrating jig comprises a reference sphere, and a reflecting plate configured to support the reference sphere from a lower side thereof and mirror-reflect light in a case that the reference sphere is illuminated from an upper side thereof.
    Type: Application
    Filed: June 22, 2009
    Publication date: January 14, 2010
    Applicant: MITUTOYO CORPORATION
    Inventors: Masaoki Yamagata, Yasuhiro Takahama, Hiraku Ishiyama, Kentaro Nemoto
  • Publication number: 20080295571
    Abstract: A form measuring mechanism 100 which measures a form of an object 102 to be measured by bringing a probe 124 into direct contact with the object 102, includes a plurality of reference spheres 130a and 130b for calibrating the form of the probe 124, a judging means 154 for judging form abnormal values common in position and size to each other and form abnormal values not common to each other obtained by measuring the reference spheres 130a and 130b, and a notifying means 156 for notifying at least anyone of a contamination or dust adhering state of the probe 124 judged from the common form abnormal values and a worn state and contamination or dust adhering states of the reference spheres 130a and 130b judged from the form abnormal values not common to each other.
    Type: Application
    Filed: May 21, 2008
    Publication date: December 4, 2008
    Applicant: MITUTOYO CORPORATION
    Inventors: Yasuhiro Takahama, Masaoki Yamagata