Abstract: A burden on a user is reduced by referring to a measurement region set for a certain measurement tool among a plurality of measurement tools to be used by an appearance inspection device as a measurement region of another measurement tool. A reference point or a search region serving as a reference of measurement for a first measurement tool such as a connector dimension inspection tool is set for a basic image acquired by imaging a non-defective product. Next, a second measurement tool such as an area measurement tool that performs measurement separate from the first measurement tool is selected by the user. For coordinate data of a measurement region, which is a region to be measured by the second measurement tool, coordinate data of the reference point or the search region set for the first measurement tool is adjusted if necessary and referred to.

Abstract: A burden on a user is reduced by referring to a measurement region set for a certain measurement tool among a plurality of measurement tools to be used by an appearance inspection device as a measurement region of another measurement tool. A reference point or a search region serving as a reference of measurement for a first measurement tool such as a connector dimension inspection tool is set for a basic image acquired by imaging a non-defective product. Next, a second measurement tool such as an area measurement tool that performs measurement separate from the first measurement tool is selected by the user. For coordinate data of a measurement region, which is a region to be measured by the second measurement tool, coordinate data of the reference point or the search region set for the first measurement tool is adjusted if necessary and referred to.

Abstract: An image detecting device for executing a pattern matching using a pyramid structure search, comprises an input image storing portion for receiving image data from an external device to hold, a pattern image storing portion for storing a pattern image to be searched, an image processing portion connected to the input image storing portion and the pattern image storing portion, for reading respective image data to execute the pattern matching, a control portion for calculating set parameter candidates that are required to execute the pyramid structure search in the image processing portion, a display portion for displaying groups of set parameter candidates that are calculated in the control portion as a table, and an input portion used to change set parameter values based on the groups of set parameter candidates displayed on the display portion.

Abstract: An inspection system in which an inspection of a work is conducted by processing image data of the work. The inspection system includes a data processor for storing image data of the work in a memory and executing data processing of the image data stored in the memory, a set process storing section for dividing a plurality of inspection items, which need different data processing respectively, of the image data stored in the memory into a plurality of groups within performance of the data processor and storing the plurality of inspection items, and an execution controller for causing the data processor to execute sequentially data processing of the image data stored in the memory in unit of group which is stored in the set process storing section.

Abstract: An inspection system which includes a memory for storing image data provided by picking up an image of a workpiece, a monitor for displaying the image data stored in the memory on a display screen with pixels arranged in an X-axis direction and a Y-axis direction perpendicular to the X-axis direction, a control panel for setting a window with four sides along the X- or Y-axis direction on the display screen, and an edge detection section for integrating the lightness values of the pixels with respect to each pixel string arranged in the Y- or X-axis direction in the setup window, and detecting as an edge the position in the X- or Y-axis direction corresponding to the maximum value of the portion where the absolute value of the differential operation result in the X- or Y-axis direction, of the integration result is equal to or greater than a threshold value.

Abstract: A binarization method of binarizing an image by extracting lightness (brightness, density) as a feature amount from the image. When a pixel is selected in an image, a sensitivity is added to and/or subtracted from the value concerning the Y value of the selected pixel to set a threshold value range. Next, when another pixel is selected, the sensitivity is added to or subtracted from the value concerning the Y value of the selected pixel and a new threshold value range is set containing the calculation result and the already setup threshold value range. The pixel with the value concerning the Y value of any pixel in the image within the threshold value range is extracted as the same brightness as the selected pixel and the extraction result is displayed.

Abstract: An image detecting device for executing a pattern matching using a pyramid structure search, comprises an input image storing portion for receiving image data from an external device to hold, a pattern image storing portion for storing a pattern image to be searched, an image processing portion connected to the input image storing portion and the pattern image storing portion, for reading respective image data to execute the pattern matching, a control portion for calculating set parameter candidates that are required to execute the pyramid structure search in the image processing portion, a display portion for displaying groups of set parameter candidates that are calculated in the control portion as a table, and an input portion used to change set parameter values based on the groups of set parameter candidates displayed on the display portion.