Abstract: A method for inspecting a semiconductor device includes carrying out a first test for inspecting characteristics of semiconductor devices under a shielded (dark) condition to discriminate non-defective devices; and carrying out a second test on the semiconductor devices which have passed the first test as non-defective devices, for inspecting characteristics of the semiconductor devices. The second test is carried out while a predetermined color of light is applied to the semiconductor devices.

Abstract: According to the present invention, a method for inspecting a semiconductor device includes the steps of carrying out a first test for inspecting characteristic of semiconductor devices under a shielded (dark) condition to discriminate non-defective devices; and carrying out a second test to semiconductor devices, which have been passed the first test as non-defective devices, for inspecting characteristic of the semiconductor devices. The second test is carried out while a predetermined color of light is applied to semiconductor devices.

Abstract: A multi chip package includes a first semiconductor chip, a second semiconductor chip and a spacer. The spacer is formed between the first semiconductor chip and the second semiconductor chip. The second semiconductor chip is fixed on the first semiconductor chip by an adhesive material that is formed on the first semiconductor chip. Since the spacer is formed between the first semiconductor chip and the second semiconductor chip, the space between the first semiconductor chip and the second semiconductor chip is even.

Abstract: The invention relates to a substrate detectors ng a substrate presence/absence regardless of substrate material and also of reducing the size increase in the apparatus. There are included a light emitter for emitting light toward a transport path of the substrate such that the light is obliquely incident upon a surface of the substrate, and a light receiver arranged in a position to receive the light passed the transport path of the substrate. The light receiver includes at least a plurality of sensors arranged in series.

Abstract: A ball electrode forming method comprises steps of: preparing a semiconductor apparatus having a plurality of electrode pads; arranging a mask having an upper surface and a lower surface, an area in the lower surface being larger than an area in the upper surface, and a plurality of openings extended from the upper surface to the lower surface, on a surface of the semiconductor apparatus having the electrode pads formed thereon so that the surface and the lower surface can face each other; arranging solder balls on the electrode pads arranged in the openings from the upper surface side of the mask; and electrically connecting the solder balls to the electrode pads to form ball electrodes. Thus, regarding a method for forming a ball electrode in a semiconductor apparatus having a BGA structure, an efficient ball electrode forming method is employed to prevent omission of a ball electrode.

Abstract: A ball electrode forming method comprises steps of: preparing a semiconductor apparatus having a plurality of electrode pads; arranging a mask having an upper surface and a lower surface, an area in the lower surface being larger than an area in the upper surface, and a plurality of openings extended from the upper surface to the lower surface, on a surface of the semiconductor apparatus having the electrode pads formed thereon so that the surface and the lower surface can face each other; arranging solder balls on the electrode pads arranged in the openings from the upper surface side of the mask; and electrically connecting the solder balls to the electrode pads to form ball electrodes. Thus, regarding a method for forming a ball electrode in a semiconductor apparatus having a BGA structure, an efficient ball electrode forming method is employed to prevent omission of a ball electrode.

Abstract: A multi chip package includes a first semiconductor chip, a second semiconductor chip and a spacer. The spacer is formed between the first semiconductor chip and the second semiconductor chip. The second semiconductor chips is fixed on the first semiconductor chip by an adhesive material that is formed on the first semiconductor chip. Since the spacer is formed between the first semiconductor chip and the second semiconductor chip, the space between the first semiconductor chip and the second semiconductor chip is evenly.

Abstract: A method of screening for a non-volatile memory device, including the steps of: controlling the temperature of a memory device at a first level to carry out a first stage of screening; and then, controlling the temperature of a memory device at a second level, which is different from the first level to carry out a second stage of screening.

Abstract: A method of screening for a non-volatile memory device, including the steps of: controlling the temperature of a memory device at a first level to carry out a first stage of screening; and then, controlling the temperature of a memory device at a second level, which is different from the first level to carry out a second stage of screening.

Abstract: A VLSI package assembly comprising a package substrate carrying thereon an IC chip, a mother board supporting thereon the package substrate, and a connection means for providing electric connection between the substrate and the mother board. The connections means has a high durability against stresses thereby to keep its electric connection even in the face of difference in thermal expansions appearing within the package substrate and mother board.