Patents by Inventor Yasumasa Ueda

Yasumasa Ueda has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8341760
    Abstract: An atomic force microscope (AFM) (1) is one type of SPM, and detects a resonance frequency shift as an amount of interaction between a probe and a sample. The AFM (1) performs distance modulation control while performing feedback control of a probe-sample distance so as to keep the amount of interaction constant. The distance modulation control varies the probe-sample distance at a distance modulation frequency higher than a response speed of the feedback control. The AFM (1) further acquires the interaction amounts detected during the variation of the probe-sample distance by the distance modulation control while performing relative scanning between the probe and the sample, and detects a distribution of the interaction amounts in a three-dimensional space having a dimension within a scanning range and a thickness within a variation range of the probe-sample distance.
    Type: Grant
    Filed: January 14, 2010
    Date of Patent: December 25, 2012
    Assignees: National University Corporation
    Inventors: Takeshi Fukuma, Yasumasa Ueda
  • Publication number: 20120030845
    Abstract: An atomic force microscope (AFM) (1) is one type of SPM, and detects a resonance frequency shift as an amount of interaction between a probe and a sample. The AFM (1) performs distance modulation control while performing feedback control of a probe-sample distance so as to keep the amount of interaction constant. The distance modulation control varies the probe-sample distance at a distance modulation frequency higher than a response speed of the feedback control. The AFM (1) further acquires the interaction amounts detected during the variation of the probe-sample distance by the distance modulation control while performing relative scanning between the probe and the sample, and detects a distribution of the interaction amounts in a three-dimensional space having a dimension within a scanning range and a thickness within a variation range of the probe-sample distance.
    Type: Application
    Filed: January 14, 2010
    Publication date: February 2, 2012
    Inventors: Takeshi Fukuma, Yasumasa Ueda
  • Patent number: 5391094
    Abstract: A card-type line interface device is provided with good portability and low-price. The line interface device includes an adapter unit 1 and a card unit 2 for inserting into the card slot of a communication terminal device. The adapter unit 1 has a card connecting connector 11 on a part of the boxlike body, a line connector 12 on another part thereof, and an interface circuit 14. The adapter unit 1 is connected to the card unit 2 in use, and detached from it on carrying. With no troublesome cable, the line interface device can provide good portability. The reduced number of components and reduced number of assembling steps lead to low price.
    Type: Grant
    Filed: November 12, 1993
    Date of Patent: February 21, 1995
    Assignee: Murata Mfg. Co., Ltd.
    Inventors: Wataru Kakinoki, Masanobu Okada, Yasumasa Ueda