Patents by Inventor Yasumoto Mori

Yasumoto Mori has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20170146971
    Abstract: A user can cause a servo motor to perform desired operation without occurrence of overshoot and hunting while being unconscious of a maximum torque that can be output from the servo motor. A control device that implements model following control includes a feedforward controller that implements sliding mode control.
    Type: Application
    Filed: November 3, 2016
    Publication date: May 25, 2017
    Applicant: OMRON Corporation
    Inventors: Yasushi ONO, Mamoru EGI, Yasutomo KAWANISHI, Yasumoto MORI
  • Publication number: 20140372075
    Abstract: A measurement target is captured using two types of illumination patterns set such that only color features of specular objects change, the two images that are obtained are compared, and objects are identified as being specular objects or diffuse objects depending on whether the color features change markedly. At this time, the emission intensity distribution of each illumination pattern is devised such that specular lobe components that are included in reflected light are canceled out.
    Type: Application
    Filed: September 3, 2014
    Publication date: December 18, 2014
    Inventors: Takeshi KOJIMA, Yasumoto MORI, Yasuhiro OHNISHI
  • Patent number: 8615125
    Abstract: A surface state inspection apparatus has a lighting device that irradiates an inspection target placed on a stage with light, an imaging device that images the inspection target, and a detection device that detects a surface defect of the inspection target by analyzing a first inspection image obtained by the imaging device. The lighting device is a surface light source that includes a light emission region having a predetermined size and, in the lighting device, portions of light emitted from positions in the light emission region differ from each other in a spectral distribution. The detection device detects a portion in which a hue is different from that of its surrounding portion in the inspection target surface as a flaw. The detection device detects a portion in which the hue is substantially equal to that of its surrounding portion while brightness is different from that of its surrounding portion as a stain.
    Type: Grant
    Filed: October 8, 2010
    Date of Patent: December 24, 2013
    Assignee: Omron Corporation
    Inventors: Yasumoto Mori, Daisuke Mitsumoto, Yasuhiro Ohnishi, Shree Nayar
  • Patent number: 8363929
    Abstract: The shape measurement apparatus calculates a characteristic amount for a plurality of points of interest on a surface of a measurement target object, based on an image obtained by image capturing with a camera, calculates an orientation of a normal line based on a value of the characteristic amount by referencing data stored in advance in a storage device, and restores the three-dimensional shape of the surface of the measurement target object based on a result of the calculation. The storage device stores a plurality of data sets generated respectively for a plurality of reference positions arranged in a field of view of the camera, and the data set to be referenced is switched depending on a position of a point of interest.
    Type: Grant
    Filed: April 18, 2011
    Date of Patent: January 29, 2013
    Assignee: OMRON Corporation
    Inventors: Takeshi Kojima, Daisuke Mitsumoto, Yasuhiro Ohnishi, Tuo Zhuang, Yasumoto Mori
  • Patent number: 8334985
    Abstract: A shape measuring apparatus that measures a three-dimensional shape of a measuring target has a lighting device that irradiates the measuring target placed on a stage with light, an imaging device that takes an image of the measuring target, a shape calculating device that calculates orientations of normals at a plurality of points on a surface of the measuring target from an image, the image being obtained by performing imaging with the imaging device while the lighting device irradiates the measuring target with the light, the shape calculating device calculating the three-dimensional shape of the surface of the measuring target from the calculation result of the orientations of the normals, a ranging device that measures a distance from a predetermined reference position with respect to at least one point on the surface of the measuring target, and a determination device that determines a spatial position of the three-dimensional shape of the surface of the measuring target, the three-dimensional shape bei
    Type: Grant
    Filed: October 8, 2010
    Date of Patent: December 18, 2012
    Assignee: OMRON Corporation
    Inventors: To Sho, Takashi Sakai, Daisuke Mitsumoto, Yasuhiro Ohnishi, Takeshi Kojima, Yasumoto Mori, Shree Nayar
  • Publication number: 20120086950
    Abstract: A shape measuring apparatus that measures a three-dimensional shape of a measuring target has a lighting device that irradiates the measuring target placed on a stage with light, an imaging device that takes an image of the measuring target, a shape calculating device that calculates orientations of normals at a plurality of points on a surface of the measuring target from an image, the image being obtained by performing imaging with the imaging device while the lighting device irradiates the measuring target with the light, the shape calculating device calculating the three-dimensional shape of the surface of the measuring target from the calculation result of the orientations of the normals, a ranging device that measures a distance from a predetermined reference position with respect to at least one point on the surface of the measuring target, and a determination device that determines a spatial position of the three-dimensional shape of the surface of the measuring target, the three-dimensional shape bei
    Type: Application
    Filed: October 8, 2010
    Publication date: April 12, 2012
    Applicant: OMRON CORPORATION
    Inventors: To Sho, Takashi Sakai, Daisuke Mitsumoto, Yasuhiro Ohnishi, Takeshi Kojima, Yasumoto Mori, Shree Nayar
  • Publication number: 20120087566
    Abstract: A surface state inspection apparatus has a lighting device that irradiates an inspection target placed on a stage with light, an imaging device that images the inspection target, and a detection device that detects a surface defect of the inspection target by analyzing a first inspection image obtained by the imaging device. The lighting device is a surface light source that includes a light emission region having a predetermined size and, in the lighting device, portions of light emitted from positions in the light emission region differ from each other in a spectral distribution. The detection device detects a portion in which a hue is different from that of its surrounding portion in the inspection target surface as a flaw. The detection device detects a portion in which the hue is substantially equal to that of its surrounding portion while brightness is different from that of its surrounding portion as a stain.
    Type: Application
    Filed: October 8, 2010
    Publication date: April 12, 2012
    Applicant: OMRON CORPORATION
    Inventors: Yasumoto Mori, Daisuke Mitsumoto, Yasuhiro Ohnishi, Shree Nayar
  • Publication number: 20110262007
    Abstract: The shape measurement apparatus calculates a characteristic amount for a plurality of points of interest on a surface of a measurement target object, based on an image obtained by image capturing with a camera, calculates an orientation of a normal line based on a value of the characteristic amount by referencing data stored in advance in a storage device, and restores the three-dimensional shape of the surface of the measurement target object based on a result of the calculation. The storage device stores a plurality of data sets generated respectively for a plurality of reference positions arranged in a field of view of the camera, and the data set to be referenced is switched depending on a position of a point of interest.
    Type: Application
    Filed: April 18, 2011
    Publication date: October 27, 2011
    Applicant: OMRON CORPORATION,
    Inventors: Takeshi KOJIMA, Daisuke MITSUMOTO, Yasuhiro OHNISHI, Tuo ZHUANG, Yasumoto MORI