Patents by Inventor Yasunari Nagaike

Yasunari Nagaike has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Apparatus for measuring a surface profile
    Patent number: 6758085
    Abstract: An apparatus for measuring a surface profile of an object to be measured includes a measuring probe positioned to contact the surface of the object to be measured, a guide mechanism for supporting and guiding the measuring probe in an axial direction of the measuring probe, a tilt angle adjustment mechanism for tilting the guide mechanism at a predetermined tilt angle with respect to a horizontal direction so that the measuring probe contacts the surface of the object to be measured with a predetermined contact force, and a drive mechanism for relatively driving at least one of the measuring probe and the object to scan the surface of the object to be measured with the measuring probe. The contact force is derived from a tilt direction component of the gravity of the measuring probe generated when the measuring probe is tilted.
    Type: Grant
    Filed: June 17, 2003
    Date of Patent: July 6, 2004
    Assignee: Olympus Corporation
    Inventors: Yasunari Nagaike, Yasushi Nakamura, Yoshiaki Ito
  • Apparatus for measuring a surface profile
    Publication number: 20030217592
    Abstract: An apparatus for measuring a surface profile of an object to be measured includes a measuring probe positioned to contact the surface of the object to be measured, guide mechanism for supporting and guiding the measuring probe in an axis direction of the measuring probe, tilt angle adjustment mechanism for tilting the guide mechanism at a predetermined tilt angle to a horizontal direction so that the measuring probe contact the surface of the object to be measured with a predetermined contact force, and drive mechanism for relatively driving at least one of the measuring probe and the object to scan the surface of the object to be measured with the measuring probe. The contact force is derived from a tilt direction component of the gravity of the measuring probe generated when the measuring probe is tilted.
    Type: Application
    Filed: June 17, 2003
    Publication date: November 27, 2003
    Applicant: OLYMPUS OPTICAL CO., LTD.
    Inventors: Yasunari Nagaike, Yasushi Nakamura, Yoshiaki Ito