Patents by Inventor Yasunobu Tominaga

Yasunobu Tominaga has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7107182
    Abstract: A test support process and a test support program for producing a post-update test pattern when a program under test is updated. When a program under development is updated, a post-update operation description defining details of an operation of a function included in the program under development after the update is acquired. Next, a pre-update operation description having high commonality with the post-update operation description is selected from among pre-update operation descriptions defining details of operations of functions included in the program under development before the update. A pre-update test pattern for an operational test of the selected pre-update operation description is extracted from among pre-update test patterns prepared for operational tests of the program under development before the update. A post-update test pattern for an operational test of the post-update operation description is generated by inheriting at least a portion of the extracted pre-update test pattern.
    Type: Grant
    Filed: September 25, 2003
    Date of Patent: September 12, 2006
    Assignee: Fujitsu Limited
    Inventors: Ryoko Fujikawa, Goro Ito, Tetsuya Katayama, Yasunobu Tominaga, Satoru Kawashima, Hitoshi Saito, Masanori Hasegawa
  • Publication number: 20040060039
    Abstract: A test support process and a test support program for producing a post-update test pattern when a program under test is updated. When a program under development is updated, a post-update operation description defining details of an operation of a function included in the program under development after the update is acquired. Next, a pre-update operation description having high commonality with the post-update operation description is selected from among pre-update operation descriptions defining details of operations of functions included in the program under development before the update. A pre-update test pattern for an operational test of the selected pre-update operation description is extracted from among pre-update test patterns prepared for operational tests of the program under development before the update. A post-update test pattern for an operational test of the post-update operation description is generated by inheriting at least a portion of the extracted pre-update test pattern.
    Type: Application
    Filed: September 25, 2003
    Publication date: March 25, 2004
    Applicant: FUJITSU LIMITED
    Inventors: Ryoko Fujikawa, Goro Ito, Tetsuya Katayama, Yasunobu Tominaga, Satoru Kawashima, Hitoshi Saito, Masanori Hasegawa