Abstract: Microscope images are easily browsed even with a terminal, such as a tablet terminal, whose transmission speed is low. Provided is a microscope system that includes: a microscope that acquires a plurality of microscope images of a specimen; a system main unit provided with a storage section that sequentially stores the microscope images acquired by the microscope; and a terminal that is connected to the system main unit via a network, in which the system main unit delivers the microscope images stored in the storage section, via the network, in response to a request from the terminal; and the terminal sequentially displays the microscope images delivered from the system main unit.

Abstract: A microscope image desired for observation is specified in a shorter time while playing back microscope images. Provided is a microscope-image display control method including a displaying step of displaying, of a plurality of microscope images acquired by moving a focal position of an objective optical system of a microscope in an optical-axis direction, one of the microscope images on a display screen; a top-bottom instructing step of giving an instruction for one of top and bottom directions on the display screen; and Z-direction image switching steps of switching the microscope image displayed on the display screen to another microscope image acquired at a focal position of the objective optical system, which is adjacent to the displayed microscope image in the optical-axis direction, based on the direction instructed in the top-bottom instructing step.

Abstract: Image viewing systems, such as clinical medical image viewing systems, can be equipped for image browsing. Such systems may benefit from synchronized image browsing. A method can include displaying a plurality of related images at a same time. The method can also include synchronizing the related images with respect to an operation performed on one of the images. Likewise, an apparatus can include a user interface configured to display a plurality of related images at a same time. The apparatus also includes a synchronizer configured to synchronize the related images with respect to an operation performed on one of the images.

Abstract: Systems that include user interfaces for handling images may deal with large amounts of image data, such as magnified medical images. Such systems may benefit by workspace interfaces, methods, and systems. For example, a method can include providing a workspace in a graphical user interface by a machine. The workspace can be located in a fixed location with respect to a plurality of applications. The method can also include sharing, by the workspace, content between or among the plurality of applications. The content can include at least one of a set of predefined functions or dynamically generated data.

Abstract: An image scan is performed by obtaining a protocol identifier, determining scan conditions from the protocol identifier, and generating an image of a specimen according to the scan conditions. An image scan system has a computer to determine scan conditions from a protocol assigned to a specimen, and a scan assembly to conduct an image scan of the specimen according the scan conditions. A computer readable medium has instructions to obtain a protocol identifier, instructions to determine scan conditions from the protocol identifier, and instructions to generate an image of a specimen according to the scan conditions.

Abstract: Image viewing systems, such as clinical medical image viewing systems, can be equipped for image browsing. Such systems may benefit from synchronized image browsing. A method can include displaying a plurality of related images at a same time. The method can also include synchronizing the related images with respect to an operation performed on one of the images. Likewise, an apparatus can include a user interface configured to display a plurality of related images at a same time. The apparatus also includes a synchronizer configured to synchronize the related images with respect to an operation performed on one of the images.

Abstract: Systems, devices, and methods can present images that can be viewed at higher and lower levels of resolution, a feature that can be referred to as zooming. Zooming can be enhanced by, for example providing blending of resolution layers for fractional zoom layers. A method can include determining, by a machine, a fractional zoom level to provide based on an input. The method can also include combining at least two integer zoom levels to provide the fractional zoom level. The method can further include providing the fractional zoom level in response to the input.

Abstract: Virtual microscopy and other system may benefit from a system that can build the large mosaic by stitching images, and overcoming positioning error of stages used to provide the images. In particular, these systems may benefit from scan order optimization and virtual slide stitching techniques. A method can include analyzing, by a machine, a low resolution image of a sample. The method can also include determining, by the machine, a scan pattern for the sample based on analysis of the low resolution image of the sample. The method can further include controlling, by the machine, the scan based on the scan pattern, wherein the scan pattern is configured to minimize an amount of back-stitching of scans in the scan pattern.

Abstract: Imaging systems, such as optical microscopes, can benefit from automatic focus enhancements including sample detection. For example, systems that use a charge coupled device (CCD) video camera to capture a field of view for making focus determinations can benefit from automatic focus and sample detection. A method according to certain embodiments can include obtaining, by a machine, a high level image of a sample. The method can also include determining, by the machine, whether a plurality of auto-focus areas of a plurality of fields of view are aligned with a portion of the sample. The method can further include obtaining, by the machine, a low level image of the sample when the plurality of auto-focus areas are aligned.

Abstract: It is an object of the present invention to provide a substrate processing apparatus, comprising a housing body mounting unit that is capable of mounting a plurality of housing bodies which can house a plurality of substrates, a processing apparatus main body for processing a substrate extracted from the housing body, a transportation unit for transporting the substrate between the housing body and the processing apparatus main body, a processing control unit for controlling the transportation unit and making it transport the substrate between the housing body and the processing apparatus main body, and a transportation control unit for controlling the transportation unit and making it transport the substrate from one housing body to another housing body without passing through the processing apparatus main body.

Abstract: A substrate inspection apparatus includes a recipe preparation unit that batch-allocates a plurality of slots containing substrates of each type with a corresponding one of a plurality of original recipes to the each type, the plurality of original recipes corresponding to different types of substrates respectively, so as to prepare an actual recipe based on the plurality of original recipes, and to inspect the different types of substrates according to the actual recipe.

Abstract: A semiconductor wafer inspection apparatus is provided with a rotatable table on which a semiconductor wafer is held by suction, an illuminating device which illuminates at least an edge portion of the semiconductor wafer held on the rotatable table, an imaging device which captures an image of the edge portion of the semiconductor wafer when the edge portion is illuminated by the illuminating device, an image processing device which detects at least an edge cut amount or a crack by acquiring the image of the edge portion which is captured by the imaging device, and a display section which displays an image of the edge portion subjected to image processing by the image processing device.

Abstract: A substrate inspection apparatus includes a recipe preparation unit that batch-allocates a plurality of slots containing substrates of each type with a corresponding one of a plurality of original recipes to the each type, the plurality of original recipes corresponding to different types of substrates respectively, so as to prepare an actual recipe based on the plurality of original recipes, and to inspect the different types of substrates according to the actual recipe.

Abstract: It is an object of the present invention to provide a substrate processing apparatus, comprising a housing body mounting unit that is capable of mounting a plurality of housing bodies which can house a plurality of substrates, a processing apparatus main body for processing a substrate extracted from the housing body, a transportation unit for transporting the substrate between the housing body and the processing apparatus main body, a processing control unit for controlling the transportation unit and making it transport the substrate between the housing body and the processing apparatus main body, and a transportation control unit for controlling the transportation unit and making it transport the substrate from one housing body to another housing body without passing through the processing apparatus main body.

Abstract: A semiconductor wafer inspection apparatus is provided with a rotatable table on which a semiconductor wafer is held by suction, an illuminating device which illuminates at least an edge portion of the semiconductor wafer held on the rotatable table, an imaging device which captures an image of the edge portion of the semiconductor wafer when the edge portion is illuminated by the illuminating device, an image processing device which detects at least an edge cut amount or a crack by acquiring the image of the edge portion which is captured by the imaging device, and a display section which displays an image of the edge portion subjected to image processing by the image processing device.

Abstract: A semiconductor wafer inspection apparatus of the present invention is provided with the following a rotatable table on which a semiconductor wafer is sucked and held, an illuminating device which illuminates at least an edge portion of the semiconductor wafer held on the rotatable table, an imaging device which captures an image of the edge portion of the semiconductor wafer when the edge portion is illuminated by the illuminating device, an image processing device which detects at least an edge cut amount or a crack by acquiring the image of the edge portion which is captured by the imaging device, and a display section which displays an image of the edge portion subjected to image processing by the image processing device.

Abstract: A switch includes a repetitive call detection unit which detects a repetitive call which occupies channels in an identical channel group. A release unit releases the channels occupied by the repetitive call when the repetitive call is detected. A restriction unit stores information concerning the repetitive call and imposes a restriction on a connection of a call having information identical to the information concerning the repetitive call. A test unit determines whether a cause of the repetitive call has been removed. A restriction release unit releases the above restriction in accordance with a result of determination by the test unit.