Patents by Inventor Yasuo Ebizuka

Yasuo Ebizuka has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Electromagnetic noise measurement apparatus, electromagnetic noise measurement method and recording medium
    Patent number: 6509742
    Abstract: The object of the present invention is to provide an electromagnetic noise measurement apparatus, electromagnetic noise measurement method and recording medium capable of preventing erroneous measurement of electromagnetic noise and of enhancing measurement efficiency. An electromagnetic noise measurement apparatus includes a PC, a field intensity meter, a spectrum analyzer, a preamplifier, a controller, a printer and the like. The controller is connected to a turn table for turning an electromagnetic noise measurement target, e.g., a copying machine, and to an antenna elevator for elevating an antenna for measuring electromagnetic noise radiated from the copying machine. The controller controls the turn table and the antenna elevator according to command of the PC. The PC compares a QP value acquired by the field intensity meter with a peak level acquired by the spectrum analyzer, and displays an error message if the difference between the QP value and the peak level is large.
    Type: Grant
    Filed: November 24, 2000
    Date of Patent: January 21, 2003
    Assignee: Fuji Xerox Co., Ltd.
    Inventors: Yasuo Ebizuka, Masayuki Hirata, Kazunori Yamada, Haruo Shinozaki, Toru Matsuzaki, Takaji Morita