Patents by Inventor Yasuo Inada
Yasuo Inada has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 6797626Abstract: The method of polishing a copper layer of a substrate is capable of improving a stock removal rate, etc. The method comprises the steps of: supplying a substrate onto an polishing pad of an polishing plate with a copper layer facing the polishing pad; pressing the substrate onto the polishing pad, with a backing pad, by a press head; relatively rotating the press head with respect to the polishing plate, with supplying polishing slurry onto the polishing pad. The backing pad is made of a material whose Asker C hardness is 75-95 and whose compressibility is 10% or less. The polishing slurry includes a chelating agent for chelating copper, an etching agent for etching the surface of copper layer, an oxidizing agent for oxidizing the surface of copper layer, and water.Type: GrantFiled: December 27, 2002Date of Patent: September 28, 2004Assignees: Fujikoshi Machinery Corp., Fujimi IncorporatedInventors: Noriko Miyairi, Yasuo Inada, Tsuyoshi Hasegawa, Yuji Terashima, Kenji Sakai, Tadahiro Kitamura, Takahiro Umeda
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Publication number: 20030124862Abstract: The method of polishing a copper layer of a substrate is capable of improving a stock removal rate, etc. The method comprises the steps of: supplying a substrate onto an polishing pad of an polishing plate with a copper layer facing the polishing pad; pressing the substrate onto the polishing pad, with a backing pad, by a press head; relatively rotating the press head with respect to the polishing plate, with supplying polishing slurry onto the polishing pad. The backing pad is made of a material whose Asker C hardness is 75-95 and whose compressibility is 10% or less. The polishing slurry includes a chelating agent for chelating copper, an etching agent for etching the surface of copper layer, an oxidizing agent for oxidizing the surface of copper layer, and water.Type: ApplicationFiled: December 27, 2002Publication date: July 3, 2003Applicant: Fujikoshi Machinery Corp.Inventors: Noriko Miyairi, Yasuo Inada, Tsuyoshi Hasegawa, Yuji Terashima, Kenji Sakai, Tadahiro Kitamura, Takahiro Umeda
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Patent number: 6361418Abstract: The abrasive system of the present invention is capable of automatically and efficiently feeding and discharging work pieces. In the abrasive system, an upper abrasive plate and a lower abrasive plate pinch the work pieces, which are provided in through-holes of a carrier and abrade both faces of each work piece. A carrier driving mechanism moves the carrier, along a circular orbit, without spinning, together with the work pieces. Stopping means stops the movement of the carrier at a predetermined position. The feeding-and-discharging means includes: an arm robot having a work holding unit, which is provided to a front end and capable of holding and releasing the work piece; and an image processing unit for recognizing shapes and positions of the through-holes of the carrier and the work pieces.Type: GrantFiled: April 12, 2000Date of Patent: March 26, 2002Assignee: Fujikoshi Kikai Kogyo Kabushiki KaishaInventor: Yasuo Inada
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Patent number: 6332828Abstract: A method for chamfer mirror-like polishing a wafer having an orientation flat by rotating the wafer in a state of being pressed by a rotating buffering wheel with a predetermined pressure, is disclosed. Mirror-surface polishing a stable wafer chamfer can be obtained with a relatively simple control system. The invention is predicated in the fact that the wafer rotation speed Ns has low inertial mass and low rotation speed so that the wafer rotation speed control can be obtained with high response property and high accuracy compared to pressing pressure control and buffering wheel control, and it features detecting intrinsic peripheral part, corners and orientation flat part of wafer according to a detection signal of detection means for detecting the wafer mirror-like polishing position and controlling the wafer rotation speed Ns according to the detected wafer mirror-like polishing position.Type: GrantFiled: July 11, 2000Date of Patent: December 25, 2001Assignees: Shin-Etsu Handotai Co., Ltd., Fujikoshi Machinery Corp.Inventors: Fumihiko Hasegawa, Yasuyoshi Kuroka, Toshihiro Tsuchiya, Koichiro Ichikawa, Yasuo Inada
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Patent number: 6330776Abstract: In the structure for reinforcing a concrete member and the reinforcing method of the present invention, a reinforcing sheet is arranged and joined to a various kinds of concrete member, such as column, beam, wall, floor, and the like, by applying the reinforcing sheet to the surface of the concrete member and attaching to the fixing anchors joined to the concrete member or the other concrete member surrounding the concrete member. The fixing anchor comprises a large amount of reinforcing fiber, and is obtained by bundling a part of the reinforcing fiber. The unbundled portion of the fixing anchor is spread along the surface of the concrete member. The reinforcing sheet is over-lapped to the unbundled portion using resin adhesives. In addition, reinforcing fibers, such as carbon fiber, aramid fiber, glass fiber, and the like are preferably used as the material comprising the fixing anchor and reinforcing sheet. Thereby, the reinforcing member can be joined via the fixing anchor to the concrete members.Type: GrantFiled: March 2, 2000Date of Patent: December 18, 2001Assignee: Nippon Steel CorporationInventors: Yasuo Jinno, Hideto Saito, Hideo Tsukagoshi, Jun′ichi Iketani, Tadao Fujita, Minoru Sawaide, Yasuo Inada, Yoshihiko Shimizu
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Patent number: 6113463Abstract: A method for chamfer mirror-like polishing a wafer having an orientation flat by rotating the wafer in a state of being pressed by a rotating buffering wheel with a predetermined pressure, is disclosed. Mirror-surface polishing a stable wafer chamfer can be obtained with a relatively simple control system. The invention is predicated in the fact that the wafer rotation speed N.sub.s has low inertial mass and low rotation speed so that the wafer rotation speed control can be obtained with high response property and high accuracy compared to pressing pressure control and buffering wheel control, and it features detecting intrinsic peripheral part, corners and orientation flat part of wafer according to a detection signal of detection means for detecting the wafer mirror-like polishing position and controlling the wafer rotation speed N.sub.s according to the detected wafer mirror-like polishing position.Type: GrantFiled: March 29, 1996Date of Patent: September 5, 2000Assignees: Shin-Etsu Handotai Co., Ltd., Fujikoshi Machinery Corp.Inventors: Fumihiko Hasegawa, Yasuyoshi Kuroka, Toshihiro Tsuchiya, Koichiro Ichikawa, Yasuo Inada
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Patent number: 5928066Abstract: A polishing apparatus of a peripheral chamfered portion of a semiconductor wafer is disclosed. The polishing apparatus comprises: a rotary drum around the periphery of which a tape having an abrasive layer thereon is wound; a first motor for rotating the rotary drum; a wafer holding mechanism which comprises a wafer holding member for holding a wafer, a second motor for rotating the wafer holding member, a supporting member for supporting the wafer holding member and the second motor, and a wafer inclining member for changing the tilt angle of the wafer with respect to the rotary drum by reciprocally rotating the supporting member on a first axis which is substantially parallel with the main surface of the wafer; and a moving member for bringing the wafer held on the supporting member into contact with or separating it from the tape wound around the rotary drum.Type: GrantFiled: December 18, 1997Date of Patent: July 27, 1999Assignees: Shin-Etsu Handotai Co., Ltd., Fujikoshi MachineryInventors: Fumihiko Hasegawa, Yasuyoshi Kuroda, Toshihiro Tsuchiya, Koichiro Ichikawa, Yasuo Inada
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Patent number: 5879225Abstract: A polishing machine of the present invention is capable of uniformly polishing a member to be polished with high flatness, and polishing cloth, which is employed in the polishing machine, is uniformly abraded. In the polishing machine, a polishing plate is capable of rotating. A supporting table rotatably supports the polishing plate. A rotary driving mechanism is mounted on the supporting table, and it rotates the polishing plate. A base supports the supporting table. An orbital driving mechanism moves the supporting table along a circular orbit without spinning about its own axis.Type: GrantFiled: April 14, 1997Date of Patent: March 9, 1999Assignee: Fujikoshi Kikai Kogyo Kabushiki KaishaInventors: Michio Kudo, Yasuo Inada, Makoto Nakajima, Masanori Fukushima
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Patent number: 5766065Abstract: A polishing apparatus of a peripheral chamfered portion of a semiconductor wafer is disclosed. The polishing apparatus comprises: a rotary drum around the periphery of which a tape having an abrasive layer thereon is wound; a first motor for rotating the rotary drum; a wafer holding mechanism which comprises a wafer holding member for holding a wafer, a second motor for rotating the wafer holding member, a supporting member for supporting the wafer holding member and the second motor, and a wafer inclining member for changing the tilt angle of the wafer with respect to the rotary drum by reciprocally rotating the supporting member on a first axis which is substantially parallel with the main surface of the wafer; and a moving member for bringing the wafer held on the supporting member into contact with or separating it from the tape wound around the rotary drum.Type: GrantFiled: December 5, 1995Date of Patent: June 16, 1998Assignees: Shin-Etsu Handotai Co., Ltd., Fujikoshi Machinery Corp.Inventors: Fumihiko Hasegawa, Yasuyoshi Kuroda, Koichiro Ichikawa, Yasuo Inada
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Patent number: 5733181Abstract: An apparatus for polishing the notch of a wafer in an effective and efficient way, which comprises: a flexible tape carrying abrasive grains in the working face thereof; an infeed reel for feeding the tape stored thereon: a take-up reel for taking up the tape fed from the infeed reel; a motor for driving to rotate the take-up reel; a means for blowing a fluid to the backside surface to the edge portion of the notch to be in direct contact along the full periphery of the notch; and a means for oscillating the tape sideways.Type: GrantFiled: October 27, 1994Date of Patent: March 31, 1998Assignee: Shin-Etsu Handotai Co., Ltd.Inventors: Fumihiko Hasegawa, Tatsuo Ohtani, Yasuyoshi Kuroda, Koichiro Ichikawa, Yasuo Inada
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Patent number: 5727990Abstract: A method and an apparatus, which enable mirror-polishing a peripheral chamfered portion of a semiconductor wafer effectively, are disclosed. Mirror-polishing a peripheral side surface of the chamfered portion of the wafer, beveled surfaces thereof, and rounded edges formed between the peripheral side surface and each of the beveled surfaces, are individually carried out.Type: GrantFiled: January 6, 1997Date of Patent: March 17, 1998Assignees: Shin-Etsu Handotai Co., Ltd., Fujikoshi Machinery Corp.Inventors: Fumihiko Hasegawa, Tatsuo Ohtani, Yasuyoshi Kuroda, Koichiro Ichikawa, Yasuo Inada
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Patent number: 5549502Abstract: A grinding method and apparatus having a position aligning mechanism to correctly achieve the centering of each work on a work table and locate an orientation flat part of each work at a predetermined position, and a displacing mechanism for reciprocally slidably displacing a top ring and the work table in order to assure that the center of each work is positionally aligned with the center of each top ring at an original position after completion of the centering of each work on the work table and the locating of the orientation flat part, and subsequently, centering each top ring with the gravitational center of each work so as to cancel a positional offset state prior to holding the work with the top ring to thrust the work against the grinding or polishing surface. The invention also includes a polishing method and apparatus in which both of a top ring and a rotary disc are reciprocally slidably displaced to improve the polishing efficiency of the device.Type: GrantFiled: December 6, 1993Date of Patent: August 27, 1996Assignees: Fujikoshi Machinery Corp., Shin-Etsu Handotai Co., Ltd.Inventors: Kohichi Tanaka, Hiromasa Hashimoto, Yasuo Inada, Makoto Nakajima
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Patent number: 5476413Abstract: An apparatus for polishing the periphery portion of a wafer, by which improvement on the polishing velocity may be effected and besides a more efficient spatial usage of the working layer of an abrasive tape is capable, comprising a tape holding fixed abrasive grains thereon; a feed reel for feeding the tape stored by winding itself; a take-up reel for taking up the tape by winding itself; a rotary drum inside of which both of the reels are equipped in such a manner that they are mountable or demountable, where a portion of the tape in the way from the feed reel to the take-up reel is adaptive to wind the rotary drum around the outer cylindrical surface thereof in close contact in the shape of a helicoid and one of the main faces of the wafer is positioned to be in a plane intersecting the central axis of the rotary drum at an angle.Type: GrantFiled: September 19, 1994Date of Patent: December 19, 1995Assignees: Shin-Etsu Handotai Co., Ltd., Fujikoshi Machinery Corp.Inventors: Fumihiko Hasegawa, Tatsuo Ohtani, Yasuyoshi Kuroda, Koichiro Ichikawa, Yasuo Inada
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Patent number: 4876143Abstract: A rob material includes an elongated matrix made of synthetic resin, a plurality of first elongated textile elements, and a plurality of second elongated textile elements, the first and second elements being embeded within the matrix, parallel to each other along the matrix, each of the first elements being composed of a plurality of yarns braided together, the second elements having a lower breaking elongation rate than said first elements. In such a rod material, the second elements have a substantially complete elasticity, and the first elements have such an elongation rate as to elongate further after the fracture of the second elements. Therefore, the stress-strain curve of the rod material shows a high elastic modulus in the elastic region and a high breaking elongation rate. In other words, the stress-strain behavior is similar to that of steel rods.Type: GrantFiled: July 3, 1986Date of Patent: October 24, 1989Assignees: Shimizu Construction Co., Ltd., Dainihon Glass Industry Co., Ltd., Kyojin Rope Manufacturing Co., Ltd.Inventors: Minoru Sugita, Teruyuki Nakatsuji, Tadashi Fujisaki, Minoru Sawaide, Noboru Ishikawa, Yasuo Inada
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Patent number: 4664333Abstract: An occupant restraining webbing employed in a seatbelt system for a vehicle includes warp which has a dry tenacity of 8.8 gr/De or more, a thickness of 1,700 De or less and a twist multiplier of 3,100 to 5,500. Thus, it is possible to reduce the extra amount by which the webbing is undesirably wound off after the rotation of a takeup shaft for winding off the webbing from a webbing retractor has ceased.Type: GrantFiled: September 26, 1985Date of Patent: May 12, 1987Assignee: Kabushiki Kaisha Toka-rika-denki-seisakushoInventors: Yasuo Inada, Koki Sato, Takazo Fujii, Hideo Yokoyama, Shoichi Takahashi, Kiyoshi Mizutani, Takayoshi Kawashima, Akira Nagawa