Patents by Inventor Yasushi Aono

Yasushi Aono has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11935339
    Abstract: Provided are a vehicle inspection system and a vehicle inspection method that can align a vehicle with a constant location of a bench testing machine. The present invention comprises: a bench testing machine that rotatably supports wheels of a vehicle, using rollers that are provided for each of the wheels; and a monitor device that is positioned in a fixed location with regard to the bench testing machine and displays, toward a camera, an image resembling an exterior environment, wherein the bench testing machine has a location adjustment device (turning mechanism, test bench control device) that adjusts the location of the vehicle in the vehicle width direction such that the relative location of the camera in the vehicle width direction with regard to the monitor device is constant.
    Type: Grant
    Filed: September 10, 2019
    Date of Patent: March 19, 2024
    Assignee: HONDA MOTOR CO., LTD.
    Inventors: Kento Aono, Tatsuya Jitsui, Kenichiro Kurai, Yuichi Fukuda, Yasushi Watanabe
  • Patent number: 7405875
    Abstract: A system microscope has a specimen mounting part which mounts a specimen, an inverted microscope including an illumination path which radiates illumination light from under the specimen mounting part, and an observation optical path which acquires detection light emitted from the specimen to which the illumination light is radiated, a microscope with upright frame including an illumination path which radiates illumination light from above the specimen mounting part, and an observation optical path which acquires detection light emitted from the specimen to which the illumination light is radiated, and a driving unit which moves at least one of the inverted microscope and the microscope with upright frame in a plane perpendicular to the observation optical path of the inverted microscope or the microscope with upright frame.
    Type: Grant
    Filed: April 12, 2005
    Date of Patent: July 29, 2008
    Assignee: Olympus Corporation
    Inventors: Susumu Honda, Yasushi Aono
  • Patent number: 7385758
    Abstract: A condenser lens is disposed in a position facing an objective lens via a specimen, a reflection mirror is movably disposed in the vicinity of an outermost part of a transmitted illuminative light path on the side of a transmitted illuminative light source from the condenser lens, and a laser beam output from a laser oscillation unit is reflected by the reflection mirror and is incident upon the condenser lens.
    Type: Grant
    Filed: March 31, 2004
    Date of Patent: June 10, 2008
    Assignee: Olympus Corporation
    Inventors: Yasushi Aono, Tsuyoshi Mochizuki, Kazuhiko Osa
  • Patent number: 7359117
    Abstract: A illumination device for microscope, which has a illumination axis, includes illumination unit, which emits rays of illumination light, for illuminating a specimen, a field stop projection lens, which is located on the illumination axis between the illumination unit and specimen, a light deflector array, which is located on the illumination axis between the illumination unit and field stop projection lens in conjugation with the specimen, the light deflector array having micro optical deflection portions, which individually deflect the rays of illumination light from the illumination unit, and switch unit for switching between a state in which the rays of illumination light is applied to the specimen and a state in which the rays of illumination light is not applied to the specimen.
    Type: Grant
    Filed: March 26, 2004
    Date of Patent: April 15, 2008
    Assignee: Olympus Corporation
    Inventors: Keiji Shimizu, Yasushi Aono
  • Patent number: 7315413
    Abstract: An illumination apparatus for a microscope includes a light source portion that projects a light beam, two splitting elements that split the light beam into three, wavelength selection elements that independently select transmission wavelengths of the three light beams, shutters that independently shield or guide the three light beams, a first combining element that combines optical paths of two light beams, a second combining element that combines an optical path of the remaining light beam with a combined optical path, a pinhole that is located on an optical path between the first and second combining elements and has an aperture that selectively transmits only part of a light beam, and a projection optical system that applies a light beam from the second combining element to a sample and, when applying a light beam from the pinhole to the sample, projects the aperture of the pinhole onto the sample.
    Type: Grant
    Filed: November 8, 2005
    Date of Patent: January 1, 2008
    Assignees: Riken, Olympus Corporation
    Inventors: Atsushi Miyawaki, Takashi Fukano, Yasushi Aono
  • Patent number: 7265363
    Abstract: While carrying out microscope examination, it is possible to specify a position to be irradiated with optical stimulus light and to accurately apply an optical stimulus to the specified irradiation position. A microscope examination method includes a step of introducing into a specimen a substance in which a structural change is caused by irradiation with light of a first wavelength; a step of specifying an optical stimulation site in the specimen by irradiating the specimen with visible light of a second wavelength that does not cause a structural change in the substance, while examining the specimen in which the substance is introduced using a microscope examination apparatus; and a step of irradiating the specified optical stimulus site with the light of the first wavelength.
    Type: Grant
    Filed: May 16, 2005
    Date of Patent: September 4, 2007
    Assignee: Olympus Corporation
    Inventors: Hirofumi Takatsuka, Yoshiharu Saito, Yasushi Aono
  • Publication number: 20070183030
    Abstract: A fluorescent microscope comprises a light source, an optical illumination system which forms an optical path to irradiate a specimen with a light beam from the light source, an objective lens which condenses the light beam of the optical illumination system onto the specimen, an optical device which is disposed on the optical path of the optical illumination system and which decenters the light beam by decentering an optical axis of the optical path, and a slit which passes the light beam decentered by the optical device through a total reflection illumination region on an emission pupil surface of the objective lens.
    Type: Application
    Filed: April 11, 2007
    Publication date: August 9, 2007
    Applicant: OLYMPUS CORPORATION
    Inventors: Atsuhiro TSUCHIYA, Kenichi Kusaka, Yasushi Aono
  • Patent number: 7245426
    Abstract: A total internal reflection illumination apparatus applied to a microscope which illuminates a sample through an objective having a numerical aperture enabling total internal reflection illumination, comprises a first total internal reflection mirror which is arranged in the vicinity of an outermost peripheral part of an observation optical path of the microscope to reflect an incident illumination light in a direction of the objective, a second total internal reflection mirror which is arranged at a symmetrical position with the first total internal reflection mirror to sandwich an observation optical axis and reflects return light reflected on a surface of the sample in a direction different from the illumination optical path, and a return light dimming part configured to dim the return light reflected by the second total internal reflection mirror.
    Type: Grant
    Filed: May 11, 2006
    Date of Patent: July 17, 2007
    Assignee: Olympus Optical Co., Ltd.
    Inventors: Yasushi Aono, Tsuyoshi Mochizuki
  • Patent number: 7236298
    Abstract: An illumination apparatus for a microscope and an image processing apparatus using the illumination apparatus include a light source, a semi-transmissive mirror splitting a light beam from the light source into two beams of the first and second irradiation light, two excitation filters selecting the wavelengths of the first and second irradiation light, a semi-transmissive mirror synthesizing individual beams of the first and second irradiation light whose wavelengths are selected, into a single beam, a dichroic mirror directing a light beam synthesized by the semi-transmissive mirror toward a specimen and transmitting light from the specimen, an objective lens, cameras imaging fluorescent light from the specimen after being separated into fluorescent light excited by the first and second wavelengths, and an image processing section processing fluorescent images formed by imaging elements.
    Type: Grant
    Filed: September 13, 2006
    Date of Patent: June 26, 2007
    Assignees: The Institute of Physical & Chemical Research, Olympus Corporation
    Inventors: Atsushi Miyawaki, Takashi Fukano, Yasushi Aono
  • Patent number: 7224524
    Abstract: A fluorescent microscope comprises a light source, an optical illumination system which forms an optical path to irradiate a specimen with a light beam from the light source, an objective lens which condenses the light beam of the optical illumination system onto the specimen, an optical device which is disposed on the optical path of the optical illumination system and which decenters the light beam by decentering an optical axis of the optical path, and a slit which passes the light beam decentered by the optical device through a total reflection illumination region on an emission pupil surface of the objective lens.
    Type: Grant
    Filed: May 18, 2004
    Date of Patent: May 29, 2007
    Assignee: Olympus Corporation
    Inventors: Atsuhiro Tsuchiya, Kenichi Kusaka, Yasushi Aono
  • Patent number: 7170676
    Abstract: The optical path used is switched between a first optical path and second optical path. The first optical path is used to make illumination light, output from a light source, transmits along the optical axis of an objective via an illumination system. The second optical path is used to guide the illumination light, output from the light source, to a transmits via the illumination system and the objective, thereby illuminating the target in a total reflection observation mode.
    Type: Grant
    Filed: March 10, 2004
    Date of Patent: January 30, 2007
    Assignee: Olympus Corporation
    Inventor: Yasushi Aono
  • Publication number: 20070008615
    Abstract: An illumination apparatus for a microscope and an image processing apparatus using the illumination apparatus include a light source, a semi-transmissive mirror splitting a light beam from the light source into two beams of the first and second irradiation light, two excitation filters selecting the wavelengths of the first and second irradiation light, a semi-transmissive mirror synthesizing individual beams of the first and second irradiation light whose wavelengths are selected, into a single beam, a dichroic mirror directing a light beam synthesized by the semi-transmissive mirror toward a specimen and transmitting light from the specimen, an objective lens, cameras imaging fluorescent light from the specimen after being separated into fluorescent light excited by the first and second wavelengths, and an image processing section processing fluorescent images formed by imaging elements.
    Type: Application
    Filed: September 13, 2006
    Publication date: January 11, 2007
    Applicants: THE INSTITUTE OF PHYSICAL AND CHEMICAL RESEARCH, OLYMPUS CORPORATION
    Inventors: Atsushi Miyawaki, Takashi Fukano, Yasushi Aono
  • Patent number: 7126752
    Abstract: An illumination apparatus for a microscope and an image processing apparatus using the illumination apparatus include a light source, a semi-transmissive mirror splitting a light beam from the light source into two beams of the first and second irradiation light, two excitation filters selecting the wavelengths of the first and second irradiation light, a semi-transmissive mirror synthesizing individual beams of the first and second irradiation light whose wavelengths are selected, into a single beam, a dichroic mirror directing a light beam synthesized by the semi-transmissive mirror toward a specimen and transmitting light from the specimen, an objective lens, cameras imaging fluorescent light from the specimen after being separated into fluorescent light excited by the first and second wavelengths, and an image processing section processing fluorescent images formed by imaging elements.
    Type: Grant
    Filed: November 20, 2003
    Date of Patent: October 24, 2006
    Assignees: The Institute of Physical and Chemical Research, Olympus Corporation
    Inventors: Atsushi Miyawaki, Takashi Fukano, Yasushi Aono
  • Publication number: 20060203331
    Abstract: A total internal reflection illumination apparatus applied to a microscope which illuminates a sample through an objective having a numerical aperture enabling total internal reflection illumination, comprises a first total internal reflection mirror which is arranged in the vicinity of an outermost peripheral part of an observation optical path of the microscope to reflect an incident illumination light in a direction of the objective, a second total internal reflection mirror which is arranged at a symmetrical position with the first total internal reflection mirror to sandwich an observation optical axis and reflects return light reflected on a surface of the sample in a direction different from the illumination optical path, and a return light dimming part configured to dim the return light reflected by the second total internal reflection mirror.
    Type: Application
    Filed: May 11, 2006
    Publication date: September 14, 2006
    Applicant: OLYMPUS OPTICAL CO., LTD.
    Inventors: Yasushi Aono, Tsuyoshi Mochizuki
  • Publication number: 20060098418
    Abstract: An illumination apparatus for a microscope includes a light source portion that projects a light beam, two splitting elements that split the light beam into three, wavelength selection elements that independently select transmission wavelengths of the three light beams, shutters that independently shield or guide the three light beams, a first combining element that combines optical paths of two light beams, a second combining element that combines an optical path of the remaining light beam with a combined optical path, a pinhole that is located on an optical path between the first and second combining elements and has an aperture that selectively transmits only part of a light beam, and a projection optical system that applies a light beam from the second combining element to a sample and, when applying a light beam from the pinhole to the sample, projects the aperture of the pinhole onto the sample.
    Type: Application
    Filed: November 8, 2005
    Publication date: May 11, 2006
    Applicants: RIKEN, Olympus Corporation
    Inventors: Atsushi Miyawaki, Takashi Fukano, Yasushi Aono
  • Publication number: 20060066942
    Abstract: An inverted microscope includes a stage on which a sample is disposed, a support which supports the stage, a base which holds the support from below the support, an objective lens which is arranged under the sample and the stage, an imaging lens which is arranged inside the base and which forms an optical image of the sample in cooperation with the objective lens, and an optical path combining/splitting unit which is arranged on a main optical path between the objective lens and the imaging lens and which detachably holds the optical path combining/splitting element that combines/splits the main optical path inside the base.
    Type: Application
    Filed: September 15, 2005
    Publication date: March 30, 2006
    Applicant: Olympus Corporation
    Inventors: Takayuki Kouno, Yasushi Aono
  • Publication number: 20050258376
    Abstract: While carrying out microscope examination, it is possible to specify a position to be irradiated with optical stimulus light and to accurately apply an optical stimulus to the specified irradiation position. A microscope examination method includes a step of introducing into a specimen a substance in which a structural change is caused by irradiation with light of a first wavelength; a step of specifying an optical stimulation site in the specimen by irradiating the specimen with visible light of a second wavelength that does not cause a structural change in the substance, while examining the specimen in which the substance is introduced using a microscope examination apparatus; and a step of irradiating the specified optical stimulus site with the light of the first wavelength.
    Type: Application
    Filed: May 16, 2005
    Publication date: November 24, 2005
    Inventors: Hirofumi Takatsuka, Yoshiharu Saito, Yasushi Aono
  • Publication number: 20050231798
    Abstract: A system microscope has a specimen mounting part which mounts a specimen, an inverted microscope including an illumination path which radiates illumination light from under the specimen mounting part, and an observation optical path which acquires detection light emitted from the specimen to which the illumination light is radiated, a microscope with upright frame including an illumination path which radiates illumination light from above the specimen mounting part, and an observation optical path which acquires detection light emitted from the specimen to which the illumination light is radiated, and a driving unit which moves at least one of the inverted microscope and the microscope with upright frame in a plane perpendicular to the observation optical path of the inverted microscope or the microscope with upright frame.
    Type: Application
    Filed: April 12, 2005
    Publication date: October 20, 2005
    Applicant: Olympus Corporation
    Inventors: Susumu Honda, Yasushi Aono
  • Publication number: 20050219687
    Abstract: A system microscope includes a microscope body, a stage which is provided on an upper portion of the microscope body and on which a sample is placed, a lower objective lens provided below the stage, an upper objective lens provided above the stage, a portal support member which is provided on the upper portion of the microscope body so as to straddle the stage, a lower illumination device which is provided for the microscope body and illuminates the sample from below, an upper illumination device which is provided on the portal support member and illuminates the sample from above, a lower eyepiece lens which is provided for the microscope body and acquires an observation image of the sample from the lower objective lens, and an upper eyepiece lens which is provided on the portal support member and acquires an observation image of the sample from the upper objective lens.
    Type: Application
    Filed: March 9, 2005
    Publication date: October 6, 2005
    Applicant: Olympus Corporation
    Inventors: Yasushi Aono, Tatsuo Nakata, Atsuhiro Tsuchiya
  • Patent number: RE38847
    Abstract: Caged reagent release experiments are carried out by introducing laser light of a laser light source for the Caged reagent release of a first reflected illumination optical system light path into a sample side through a first dichroic mirror on a cube turret and also introducing excitation light of a mercury lamp for the excitation light irradiation of a third reflected illumination optical system light path into the sample side through a first dichroic mirror on a slider. Laser trap experiments are carried out by introducing excitation light of a mercury lamp for the excitation light irradiation of a second reflected illumination optical system light path into the sample side through a second dichroic mirror on the cube turrent and also introducing laser light from the laser light source for the laser trap of the third reflected illumination optical system light path into the sample side through a second dichroic mirror on the slider.
    Type: Grant
    Filed: June 13, 2002
    Date of Patent: October 25, 2005
    Assignee: Olympus Optical Co., Ltd.
    Inventors: Yukio Nonoda, Yasushi Aono, Katsuyuki Abe