Abstract: This is to provide a photometric apparatus improved in measurement precision by improving the state of light incident to a sensor, which photometric apparatus 1 comprises a photometric sensor 30 into which light which is an object to be measured is incident, a signal processing means for processing a sensor output by the photometric sensor, and optical systems 50, 100, 92, 93 and 150 which introduces external light into the photometric sensor, wherein a columnar fiber rod 100 in which a center axis is provided along a direction perpendicular to a light receiving surface of the photometric sensor is provided at a part of the optical system.

Abstract: Disclosed is a photometric apparatus improved in measurement precision by improving the state of light incident to a sensor. The photometric apparatus 1 includes a photometric sensor 30 into which light which is an object to be measured is incident, a signal processing element for processing a sensor output by the photometric sensor, and optical systems 50, 100, 92, 93 and 150 which introduces external light into the photometric sensor, wherein a columnar fiber rod 100 in which a center axis is provided along a direction perpendicular to a light receiving surface of the photometric sensor is provided at a part of the optical system.

Abstract: [Problems to be Solved] A phoswich radiation detector, which can easily discriminate between detection signals on gamma rays and thermal neutrons, and which can selectively acquire signals on thermal neutrons, is provided. [Means to Solve the Problems] In a phoswich radiation detector having two scintillators and discriminating between thermal neutrons and gamma rays, the detector comprises a scintillator for detecting thermal neutrons, such as LiCaAlF6:Eu, which has a light yield of more than 1500 photons/neutron, and a scintillator for detecting gamma rays, which has a permeable end on a shorter wavelength than the light emission wavelength of the thermal neutron scintillator.

Abstract: [Problems to be Solved] A radiation detector, which is improved in the detection efficiency of a photodetector for light emitted by a scintillator, which has excellent long-term operational stability, and which is excellent in time resolution and count rate characteristics, is provided with the use of the scintillator with a short fluorescence lifetime. [Means to Solve the Problems] A radiation detector is constructed by installing an optical wavelength conversion layer, which is composed of, for example, an organic fluorescent substance using polyvinyltoluene as a base material, between a scintillator composed of a fluoride single crystal, such as a Ce-containing LiCaAlF6 crystal, and a photodetector having a light entrance window material composed of a transparent glass material such as borosilicate glass. In the radiation detector, the peak wavelength of light emitted by the scintillator is 360 nm or less, and the peak wavelength of light after conversion by the optical conversion layer is 400 nm or more.

Abstract: An exposure meter for incident- and reflected-light photometry includes an incident-light receiving section, a finder for reflected-light photometry, an arithmetical element for calculating various exposure values on the basis of photometric results obtained by incident- and reflected-light receiving elements, a finder optical system for displaying information on the exposure values obtained by the arithmetical element in the finder, and a display window provided on an exposure meter body. The incident-light receiving section is constructed so that it is can be mounted to or dismounted from the exposure meter body and allows incident-light photometry and lighting setting photometry. The exposure meter further includes a transmitting unit, mountable in or dismountable from the exposure meter body, in which flashlight is emitted and the amount of flashlight can be adjusted in accordance with the information on the exposure values displayed on the display window.

Abstract: An exposure meter for incident- and reflected-light photometry includes an incident-light receiving section, a finder for reflected-light photometry, an arithmetical element for calculating various exposure values on the basis of photometric results obtained by incident- and reflected-light receiving elements, a finder optical system for displaying information on the exposure values obtained by the arithmetical element in the finder, and a display window provided on an exposure meter body. The incident-light receiving section is constructed so that it is can be mounted to or dismounted from the exposure meter body and allows incident-light photometry and lighting setting photometry. The exposure meter further includes a transmitting unit, mountable in or dismountable from the exposure meter body, in which flashlight is emitted and the amount of flashlight can be adjusted in accordance with the information on the exposure values displayed on the display window.

Abstract: A substrate supporting apparatus having a plurality of support plates positioned in parallel for supporting a plurality of substrates to be treated. The plates (13), (23) and (33) have respectively central openings (14), (24) and (34) which differ in size, and have respectively a plurality of clips (15), (25) and (35) along the periphery of the opening to support a substrate above the opening. The sizes of said openings (14, 24, 34) are determined depending upon reactive gas condition (e.g., temperature, pressure, flow characteristics of reactive gas) so that a uniform thin film can be formed on each substrate and an impurity introduced into the thin film can have a suitable concentration.