Patents by Inventor Yasushi Haketa

Yasushi Haketa has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and apparatus for measuring sample by luminescence
    Patent number: 6599712
    Abstract: A method for measuring stains of a test sample by measuring adenosine phosphates. Luminescence of the adenosine phosphates is induced by a luminescent reagent (33) containing an ATP regenerating enzyme. The level or quantity of luminescence is detected by a silicon photodiode (5) to thereby measure the stains.
    Type: Grant
    Filed: July 24, 2001
    Date of Patent: July 29, 2003
    Assignee: Kikkoman Corporation
    Inventors: Tatsuya Sakakibara, Toshinori Igarashi, Seiji Murakami, Yasushi Haketa
  • Measuring instrument with memory
    Patent number: 6173600
    Abstract: According to the present invention, there is provided a measuring instrument with a memory or measuring electrodes each having a memory, which does not require setting of a calibration or correction value at each replacement of the electrode, permits automatic recognition of information such as the model name or the manufacture No. of the electrode in the instrument body, and allows free selection of an appropriate electrode for each use. The measuring instrument 1 has an instrument body 20 and a measuring electrode 10 releasably connected to the instrument body 20. Storage means 15 for storing information regarding the measuring electrode 10 in the measuring electrode 10, or in a cable 12 or a connector 13 for connecting the measuring electrode 10 to the instrument body 20.
    Type: Grant
    Filed: January 4, 1999
    Date of Patent: January 16, 2001
    Assignee: TAO Electronics Ltd.
    Inventors: Yasuyuki Harada, Jiro Murayama, Yasushi Haketa, Tetsuya Sato, Eiji Kato, Akihiko Kato