Patents by Inventor Yasushi Hisaoka

Yasushi Hisaoka has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11828786
    Abstract: An object is to provide a technique capable of creating a precise measurement condition in a facilitated manner relating to an electrical characteristic inspection for a semiconductor device. An electrical characteristic inspection device includes a storage unit configured to store a measurement condition of the semiconductor device being an inspection subject, a control unit configured to read out the measurement condition corresponding to inspection contents to be executed from the storage unit, an inductive inductance control circuit unit configured to set inductive inductance for the semiconductor device, and a floating inductance control circuit unit configured to set floating inductance for the semiconductor device. Based on the measurement condition read out from the storage unit, the control unit is configured to adjust the inductive inductance by controlling the inductive inductance control circuit unit, and adjust the floating inductance by controlling the floating inductance control circuit unit.
    Type: Grant
    Filed: October 12, 2021
    Date of Patent: November 28, 2023
    Assignee: Mitsubishi Electric Corporation
    Inventors: Sumito Ogata, Yasushi Hisaoka, Takaya Noguchi
  • Publication number: 20220306775
    Abstract: Provided is a method for producing a hydrocarbon resin hydride, comprising: hydrogenating a hydrocarbon resin by bringing the hydrocarbon resin into contact with hydrogen in the presence of an antioxidative compound and a hydrogenation catalyst, the antioxidative compound being at least one selected from the group consisting of hindered phenolic antioxidants and antioxidants having a 2,2,6,6-tetraalkyl-4-piperidyl group.
    Type: Application
    Filed: June 22, 2020
    Publication date: September 29, 2022
    Applicant: ZEON CORPORATION
    Inventors: Yasushi HISAOKA, Yoshifumi MARUYAMA
  • Publication number: 20220229103
    Abstract: An object is to provide a technique capable of creating a precise measurement condition in a facilitated manner relating to an electrical characteristic inspection for a semiconductor device. An electrical characteristic inspection device includes a storage unit configured to store a measurement condition of the semiconductor device being an inspection subject, a control unit configured to read out the measurement condition corresponding to inspection contents to be executed from the storage unit, an inductive inductance control circuit unit configured to set inductive inductance for the semiconductor device, and a floating inductance control circuit unit configured to set floating inductance for the semiconductor device. Based on the measurement condition read out from the storage unit, the control unit is configured to adjust the inductive inductance by controlling the inductive inductance control circuit unit, and adjust the floating inductance by controlling the floating inductance control circuit unit.
    Type: Application
    Filed: October 12, 2021
    Publication date: July 21, 2022
    Applicant: Mitsubishi Electric Corporation
    Inventors: Sumito OGATA, Yasushi HISAOKA, Takaya NOGUCHI
  • Patent number: 6318188
    Abstract: A torque detector having a simple structure, high accuracy and high rigidity. The torque detector comprises movable bodies whose both ends are fixed to or supported by the first shaft and the second shaft, which are arched and whose center portions are displaced by a change in the curvature of the arch due to a change in the distance between the fixed both ends of the movable bodies according to a relative torsion angle between the first shaft and the second shaft.
    Type: Grant
    Filed: December 10, 1999
    Date of Patent: November 20, 2001
    Assignee: Mitsubishi Denki Kabushiki Kaisha
    Inventors: Katsuaki Yasui, Masahiko Hasegawa, Yasushi Hisaoka
  • Patent number: 5393255
    Abstract: An inspection method and an inspection apparatus for the component members of the cathode-ray tube are disclosed. An inspection apparatus composed of normal members other than an object of inspection is prepared at the time of inspecting the phosphor screen of the screen panel, the electron gun or the shadow-mask constituting the cathode-ray tube. In advanced to assembling the cathode-ray tube, the object of inspection is mounted on the inspection apparatus, so that the conformance or rejection of the object of inspection is decided from the illuminated condition of the phosphor screen by irradiating electron beams thereon.
    Type: Grant
    Filed: February 28, 1994
    Date of Patent: February 28, 1995
    Assignee: Mitsubishi Denki Kabushiki Kaisha
    Inventors: Yasushi Hisaoka, Yoshio Yamane, Hidenobu Murakami, Yoshimi Kinoshita, Hiroaki Tobuse, Kazuo Yoshida, Takashi Ishii, Hiroshi Koizumi