Patents by Inventor Yasushi Okawa

Yasushi Okawa has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7535246
    Abstract: A coefficient indicating the relationship between a measurement voltage of voltage measuring unit and a voltage drop in a drain bias voltage due to drain current is determined based on at least an S parameter of a measuring system and an input impedance of the measuring unit. A voltage drop at the drain is determined from the coefficient. Based on the determined voltage drop, a drain bias voltage actually applied to the drain of an FET is determined. Also, a coefficient for converting the measurement voltage of the measuring unit into a drain current is determined based on at least an S parameter of a measuring system and the input impedance of the voltage measuring unit and an electrical length of the measuring system if necessary. Based on the determined coefficient, a drain current actually flowing in the FET is determined.
    Type: Grant
    Filed: December 28, 2006
    Date of Patent: May 19, 2009
    Assignee: Agilent Technologies, Inc.
    Inventor: Yasushi Okawa
  • Patent number: 7429869
    Abstract: A coefficient indicating the relationship between a measurement voltage of voltage measuring unit and a voltage drop in a drain bias voltage due to drain current is determined based on an S parameter of a bias tee and an input impedance of the measuring unit. A voltage drop at the drain is determined from the coefficient. Based on the determined voltage drop, a drain bias voltage actually applied to the drain of an FET is determined. Also, a coefficient for converting the measurement voltage of the measuring unit into a drain current is determined based on an S parameter of a two-terminal-pair network of the bias tee and the input impedance of the voltage measuring unit. Based on the determined coefficient, a drain current actually flowing in the FET is determined.
    Type: Grant
    Filed: June 14, 2006
    Date of Patent: September 30, 2008
    Assignee: Agilent Technologies, Inc.
    Inventor: Yasushi Okawa
  • Patent number: 7406889
    Abstract: A gear selection position displaying device includes a path display portion (56) which displays a movement path of a gearshift lever, lever position display portions (circled portions of 51c, 53b, 53c, 53d and 55b) which display the position of the gearshift lever, and gear range display portions (51a, 52a, 54a and 55a, and symbol imparted portions of 51c, 53b, 53c, 53d and 55b) which display gear ranges which are selected at the gear selection positions, respectively. When a momentary area where the gearshift lever is automatically restored to a home position is selected, a display on the gear range display portions (52a, 54a) which corresponds to the momentary area so selected is deleted (52b, 54b), whereas a gear range corresponding to the selected momentary area is displayed (53c, 53d) on the gear range display portions (53c, 53d).
    Type: Grant
    Filed: June 14, 2006
    Date of Patent: August 5, 2008
    Assignee: Honda Motor Co., Ltd.
    Inventor: Yasushi Okawa
  • Patent number: 7403031
    Abstract: A measurement apparatus for FET characteristics comprises a divider connected to a pulse generator for dividing pulses from the pulse generator into first and second pulses; a first SMU; a first switch for selecting pulses from the divider or voltage from the first SMU; a terminal resistor for applying signals from the first switch and supplying the signals to the first terminal of the device under test; a second and a third SMU; a bias-T connected to the third SMU; a second switch for selecting to connect the second terminal of the device under test to the second SMU or to connect the second terminal to signals of the bias-T obtained by multiplexing the voltage from the third SMU; and voltage measurement unit connected to the divider and the bias-T.
    Type: Grant
    Filed: April 26, 2007
    Date of Patent: July 22, 2008
    Assignee: Agilent Technologies, Inc.
    Inventor: Yasushi Okawa
  • Publication number: 20070279081
    Abstract: A measurement apparatus for FET characteristics comprises a divider connected to a pulse generator for dividing pulses from the pulse generator into first and second pulses; a first SMU; a first switch for selecting pulses from the divider or voltage from the first SMU; a terminal resistor for applying signals from the first switch and supplying the signals to the first terminal of the device under test; a second and a third SMU; a bias-T connected to the third SMU; a second switch for selecting to connect the second terminal of the device under test to the second SMU or to connect the second terminal to signals of the bias-T obtained by multiplexing the voltage from the third SMU; and voltage measurement unit connected to the divider and the bias-T.
    Type: Application
    Filed: April 26, 2007
    Publication date: December 6, 2007
    Inventor: Yasushi Okawa
  • Publication number: 20070182439
    Abstract: A coefficient indicating the relationship between a measurement voltage of voltage measuring unit and a voltage drop in a drain bias voltage due to drain current is determined based on at least an S parameter of a measuring system and an input impedance of the measuring unit. A voltage drop at the drain is determined from the coefficient. Based on the determined voltage drop, a drain bias voltage actually applied to the drain of an FET is determined. Also, a coefficient for converting the measurement voltage of the measuring unit into a drain current is determined based on at least an S parameter of a measuring system and the input impedance of the voltage measuring unit and an electrical length of the measuring system if necessary. Based on the determined coefficient, a drain current actually flowing in the FET is determined.
    Type: Application
    Filed: December 28, 2006
    Publication date: August 9, 2007
    Inventor: Yasushi Okawa
  • Patent number: 7242200
    Abstract: An FET-characteristic measuring system applies a pulse output from a pulse generator to the gate of an FET in order to measure drain current flowing through the FET. The pulse has a voltage based on a set voltage. The measuring system includes a divider for dividing the pulse output from the pulse generator into a first pulse applied to the gate of the FET and a second pulse for voltage measurement; a voltage measuring device for measuring a voltage of the second pulse; and a set-voltage adjusting device for determining, based on the voltage of the second pulse, a target set voltage for the pulse generator to apply a pulse having a desired gate application voltage to the FET and for adjusting the set voltage to the target set voltage so that a voltage of the first pulse is equal to the desired gate application voltage.
    Type: Grant
    Filed: April 27, 2006
    Date of Patent: July 10, 2007
    Assignee: Agilent Technologies, Inc.
    Inventor: Yasushi Okawa
  • Publication number: 20070013407
    Abstract: A coefficient indicating the relationship between a measurement voltage of voltage measuring unit and a voltage drop in a drain bias voltage due to drain current is determined based on an S parameter of a bias tee and an input impedance of the measuring unit. A voltage drop at the drain is determined from the coefficient. Based on the determined voltage drop, a drain bias voltage actually applied to the drain of an FET is determined. Also, a coefficient for converting the measurement voltage of the measuring unit into a drain current is determined based on an S parameter of a two-terminal-pair network of the bias tee and the input impedance of the voltage measuring unit. Based on the determined coefficient, a drain current actually flowing in the FET is determined.
    Type: Application
    Filed: June 14, 2006
    Publication date: January 18, 2007
    Inventor: Yasushi Okawa
  • Publication number: 20060288812
    Abstract: A gear selection position displaying device includes a path display portion (56) which displays a movement path of a gearshift lever, lever position display portions (circled portions of 51c, 53b, 53c, 53d and 55b) which display the position of the gearshift lever, and gear range display portions (51a, 52a, 54a and 55a, and symbol imparted portions of 51c, 53b, 53c, 53d and 55b) which display gear ranges which are selected at the gear selection positions, respectively. When a momentary area where the gearshift lever is automatically restored to a home position is selected, a display on the gear range display portions (52a, 54a) which corresponds to the momentary area so selected is deleted (52b, 54b), whereas a gear range corresponding to the selected momentary area is displayed (53c, 53d) on the gear range display portions (53c, 53d).
    Type: Application
    Filed: June 14, 2006
    Publication date: December 28, 2006
    Applicant: HONDA MOTOR CO., LTD.
    Inventor: Yasushi Okawa
  • Publication number: 20060279298
    Abstract: A measurement method for compensation for short-circuit compensation or load compensation or a measurement method for verification uses a device for measuring impedance by probing an impedance standard substrate using contact probes, and comprises a step whereby contact sites for probing the impedance standard substrate are input and an alarm is displayed when the number of contacts with the contact sites exceeds a predetermined limit.
    Type: Application
    Filed: April 3, 2006
    Publication date: December 14, 2006
    Inventors: Eiji Tsuchida, Yasushi Okawa
  • Publication number: 20060273807
    Abstract: An FET-characteristic measuring system applies a pulse output from a pulse generator to the gate of an FET in order to measure drain current flowing through the FET. The pulse has a voltage based on a set voltage. The measuring system includes a divider for dividing the pulse output from the pulse generator into a first pulse applied to the gate of the FET and a second pulse for voltage measurement; voltage measuring means for measuring a voltage of the second pulse; and set-voltage adjusting means for determining, based on the voltage of the second pulse, a target set voltage for the pulse generator to apply a pulse having a desired gate application voltage to the FET and for adjusting the set voltage to the target set voltage so that a voltage of the first pulse is equal to the desired gate application voltage.
    Type: Application
    Filed: April 27, 2006
    Publication date: December 7, 2006
    Inventor: Yasushi Okawa
  • Publication number: 20060226860
    Abstract: A compensation board having a pattern for load compensation, which comprises a resistor of 500? or higher and first and second pads for making contact with a probe needle, each of which are connected to a terminal of the resistor.
    Type: Application
    Filed: February 9, 2006
    Publication date: October 12, 2006
    Inventor: Yasushi Okawa
  • Patent number: 6443025
    Abstract: A shift control system is arranged such that a shift lever 201 is movable to a “P” position, an “R” position, an “N” position, a “D5” position and a “D4” position along a first shift guide path 211, it is movable also from the “D4” position to a “3/M” position along a connection shift guide path 212, and it is movable also along a second shift guide path 213, from the “3/M” position into a direction different from that of the connection shift guide path 212. When the shift lever is shifted to the “D5” position, the transmission is set into an automatic shift control with forward drive speed ratios up to the FIFTH speed ratio. When the shift lever is shifted to the “D4” position, the transmission is set into an automatic shift control with forward drive speed ratios up to the FOURTH speed ratio.
    Type: Grant
    Filed: March 5, 2001
    Date of Patent: September 3, 2002
    Assignee: Honda Giken Kogyo Kabushiki Kaisha
    Inventors: Tatsuyuki Ohashi, Koichiro Inukai, Satoru Sunada, Yasushi Okawa, Takamichi Shimada
  • Publication number: 20010029799
    Abstract: A shift control system is arranged such that a shift lever 201 is movable to a “P” position, an “R” position, an “N” position, a “D5” position and a “D4” position along a first shift guide path 211, it is movable also from the “D4” position to a “3/M” position along a connection shift guide path 212, and it is movable also along a second shift guide path 213, from the “3/M” position into a direction different from that of the connection shift guide path 212. When the shift lever is shifted to the “D5” position, the transmission is set into an automatic shift control with forward drive speed ratios up to the FIFTH speed ratio. When the shift lever is shifted to the “D4” position, the transmission is set into an automatic shift control with forward drive speed ratios up to the FOURTH speed ratio.
    Type: Application
    Filed: March 5, 2001
    Publication date: October 18, 2001
    Inventors: Tatsuyuki Ohashi, Koichiro Inukai, Satoru Sunada, Yasushi Okawa, Takamichi Shimada
  • Patent number: 5814728
    Abstract: A nondestructive inspection method of inspecting a securing defect of a polymer insulator having an FRP core, an outer cover portion arranged around the FRP core, and at least one metal member secured to at least one end of the FRP core, includes the steps of; measuring an acoustic emission signal generated when the metal member is secured to the FRP core by using compression dies; and determining whether or not the securing defect is generated on the basis of the acoustic emission signal in process. Moreover, the disclosed apparatus performs the nondestructive inspection method mentioned above.
    Type: Grant
    Filed: March 27, 1997
    Date of Patent: September 29, 1998
    Assignee: NGK Insulators, Ltd.
    Inventors: Yasushi Okawa, Itsushi Nakamura, Tomio Suzuki, Masahiro Hori
  • Patent number: 5591906
    Abstract: The present invention is directed to a device for and a method of detecting a tire pressure drop for a four-wheel vehicle. When F1, F2, F3 and F4 are respectively taken as the rotational angular velocities of four tires, a judged value dF given by the following equation (A) is found:dF=(F1+F4)/(F2+F3) (A)The judged value dF is the ratio of the sum of the rotational angular velocities (F1+F4) of a pair of tires on a diagonal line to the sum of the rotational angular velocities (F2+F3) of the other pair of tires. If the pneumatic pressures of the four tires are all normal, (F1+F4)=(F2+F3), so that dF=1. On the other hand, if the pneumatic pressure of any one of the tires drops, dF.noteq.1. Accordingly, it is judged that the pneumatic pressure of a tire drops by comparing the judged value with a predetermined value.
    Type: Grant
    Filed: May 12, 1994
    Date of Patent: January 7, 1997
    Assignee: Sumitomo Electric Industries, Ltd.
    Inventors: Yasushi Okawa, Isao Isshiki