Abstract: There is provided a vibration test support network system that connects a plurality of vibration test devices via a network and supports maintenance of vibration test devices and stabilization of accuracy of the vibration test through analysis of self-diagnosis information by the vibration test devices. A vibration test support network system 300 includes a plurality of vibration test devices 200, a network 210 connecting the plurality of vibration test devices 200, and an analysis device 220 connected to the network 210 and configured to transmit and receive information to and from the plurality of vibration test devices 200 via the network 210.

Abstract: The present invention relates to a mascara brush for applying a mascara liquid to eyelashes and a manufacturing method thereof, including a first step to fix to a core member many first brush bristles and many second brush bristles having softening point temperatures lower than those of the first brush bristles in a state where the first brush bristles and the second brush bristles are mixed with each other and extend radially, where while bending at least a partial area in a direction encircling the core member of the first brush bristles and the second brush bristles at intermediate positions in extending from the core member, subjecting the first brush bristles and the second brush bristles to an atmosphere of a temperature lower than the softening point temperatures of the first brush bristles and higher than the softening point temperatures of the second brush bristles.

Abstract: The present invention relates to a mascara brush for applying a mascara liquid to eyelashes and a manufacturing method thereof, including a first step to fix to a core member many first brush bristles and many second brush bristles having softening point temperatures lower than those of the first brush bristles in a state where the first brush bristles and the second brush bristles are mixed with each other and extend radially, where while bending at least a partial area in a direction encircling the core member of the first brush bristles and the second brush bristles at intermediate positions in extending from the core member, subjecting the first brush bristles and the second brush bristles to an atmosphere of a temperature lower than the softening point temperatures of the first brush bristles and higher than the softening point temperatures of the second brush bristles.

Abstract: The object of the present invention is to provide a therapeutic agent for osteoporosis with a good bone mass-increasing effect, but almost no blood calcium-increasing effect.

Abstract: An apparatus for detecting defects in patterns, particularly defects in chip patterns of photomasks for use in manufacturing semiconductor integrated circuits comprising optically scanning means for scanning in a raster scan mode identical portions of the two patterns to be compared with each other by means of a pair of lens systems to produce a pair of picture signals each corresponding to a respective one of the scanned pattern portions and a defect signal producing means for receiving said pair of picture signals and producing a defect signal as a difference between the two picture signals. A variable delay circuit is provided between the optically scanning means and defect signal producing means to correct or compensate for deviations in the two picture signals due to differences in optical characteristics between the two lens system such as distortion and magnification. The variable delay circuit delays the picture signals for a delay time which is varied as a function of a position on the raster.

Abstract: An apparatus for detecting defects in patterns, particularly defects in chip patterns of photomasks for use in manufacturing semiconductor integrated circuits comprising an optically scanning means for scanning identical portions of the two patterns to be compared with each other with a pair of scanning light spots to produce a pair of picture signals each corresponding to a respective one of the scanned pattern portions; and a defect detecting section for receiving said pair of picture signals and producing a defect signal as a difference between the two picture signals.

Abstract: An apparatus for detecting defects in patterns, particularly defects in chip patterns of photomasks used for manufacturing semi-conductor integrated circuits comprises means such as a flying spot scanner for producing a scanning light spot, an optical system for projecting said scanning light spot simultaneously on to identical portions of two patterns to be compared with each other, said patterns being placed on a carrier stage, first and second photoelectric converters, each converter receiving the light spot passing through or reflected from a respective pattern to produce an output electrical signal; and an electric circuit for receiving the output signals from said first and second photoelectric converters and subtracting one of them from the other to produce a difference signal which represents detected defects in the patterns.

Abstract: An apparatus for automatically adjusting a microscope in focus, said microscope comprising a stage on which a specimen is to be placed, an objective, an objective tube and a driving member for relatively moving said stage and objective tube. Said apparatus comprises a nozzle member mechanically coupled to said objective tube and being opposed to the specimen, said nozzle being connected to an air pump so as to blow or suck an air stream from said nozzle member, a pressure detector for detecting pressure variations of said air stream to produce an electric signal which varies as a function of a distance between said objective and specimen and an electric motor energized with a signal related to said electric signal and mechanically coupled to said driving member of the microscope.