Abstract: An apparatus and method capable of effective board inspection. In the board inspection apparatus wherein a pulse signal is applied to one edge of a pattern line on a board, a non-contact probe receives a signal at another edge of the pattern line, and a conduction of the pattern line is inspected in accordance with the received signal, the board inspection method comprising steps of: applying an inspection signal to the one edge of the pattern line at a predetermined time; receiving an applied timing of the inspection signal at a receiving side; and monitoring a variance of a received signal which is detected by the probe after the applied timing.