Abstract: The present invention is directed to an integrated circuit having multilayer structure. In the present invention, dummy elements having no relation to the operation of an integrated circuit are formed on the upper surface of a substrate provided with the integrated circuit by the same material as that for the substrate, to thereby prevent the integrated circuit provided on the substrate from direct and correct observation. As the result, formation arrangement etc. of the integrated circuit cannot be easily analyzed, whereby interests of those contributing to technology development can be sufficiently protected.

Abstract: A detector for detecting the direction of incidence of ionized radiation comprises a laminated structure radiation detector which includes a plurality of planar structure detectors, each detector having a planar structure detector means constructed of a plurality of unit detectors arranged regularly on a plane and responsive to the ionized radiation. The planar detector further has position detector means which detects the position of the unit detector which has responded to ionized radiation. These planar structure detectors are arranged with a predetermined distance between them. The radiation detector further comprises direction of incidence calculating means for obtaining the direction of incidence of the ionized radiation from the outputs of the respective position detectors of the respective planar structure detectors.