Patents by Inventor Yasutomo Doi

Yasutomo Doi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7961933
    Abstract: Reference data for automatically inspecting shapes of fillets formed on a substrate are set to an inspection device that illuminates the substrate from specified directions to generate an image. For each type of components mounted to the substrate, a database is prepared, registering sets of reference data corresponding to different fillet shapes in correlation with heights of solder for forming fillets having these shapes. After components to be an object of inspection are identified, specified steps are carried out on each of these components, including the step of obtaining data on the height of solder for forming the fillet related to a land for which a target area for inspection has been set and reading out reference data corresponding to the data obtained from the reference data registered in the database.
    Type: Grant
    Filed: July 20, 2007
    Date of Patent: June 14, 2011
    Assignee: OMRON Corporation
    Inventors: Yoshiki Fujii, Yasutomo Doi, Akira Nakajima, Toshihiro Moriya, Yasuaki Nakajima
  • Publication number: 20080040058
    Abstract: Reference data for automatically inspecting shapes of fillets formed on a substrate are set to an inspection device that illuminates the substrate from specified directions to generate an image. For each type of components mounted to the substrate, a database is prepared, registering sets of reference data corresponding to different fillet shapes in correlation with heights of solder for forming fillets having these shapes. After components to be an object of inspection are identified, specified steps are carried out on each of these components, including the step of obtaining data on the height of solder for forming the fillet related to a land for which a target area for inspection has been set and reading out reference data corresponding to the data obtained from the reference data registered in the database.
    Type: Application
    Filed: July 20, 2007
    Publication date: February 14, 2008
    Inventors: Yoshiki Fujii, Yasutomo Doi, Akira Nakajima, Toshihiro Moriya, Yasuaki Nakajima