Abstract: A semiconductor memory device includes a memory cell array including a plurality of memory cells, a first data latch circuit, a second data latch circuit, an arithmetic circuit, a counter circuit, and a controller. And controller compares the number (N) counted by the counter circuit with a reference number (M), and performs control to output flag information outside if N?M.

Abstract: A light emitting apparatus emits light emitted from a light emitting element (200) mounted on a substrate (300) via a luminous flux control member (100). The luminous flux control member (100) has a bottom surface section (101) opposite to the substrate (300), an input surface section (106) for causing the light emitted from a light emitting element (200) to enter inside the input surface section (106), a light control output surface section (102) for refracting the light having entered from the input surface section (106) and outputting the light outside, and two or more leg sections (103) are formed to project outward from the bottom surface section (101) inside a circle with a circumference on which a position where the amount of light reflected by the light control output surface section (102) and yet reaching the bottom surface section (101) peaks is located, and attached to the substrate (300).

Abstract: According to one embodiment, a semiconductor storage device includes a first cell, a second cell, a bit line, a first buffer, a second buffer, and a controller. The bit line transfers the data to the first cell and the second cell. The first buffer holds write data to the first cell and the second cell. The second buffer holds read data from the first cell. The controller controls first writing and rewriting executed for the first cell and second writing executed for the second cell. The write data in the first buffer is updated each time a second write signal is given. The controller executes the first writing based on the write data held by the first buffer. The controller performs the second writing based on the write data updated in the first buffer. The controller executes the rewriting based on the read data held by the second buffer.

Abstract: A nonvolatile semiconductor memory of the present invention includes a plurality of bit lines and word lines which are arranged to intersect each other; a memory cell array having a plurality of electrically-programmable memory cells arranged in a region in which the bit lines and the word lines intersect; a trimming circuit configured to obtain a parameter of an initial program voltage for each word line of the plurality of word lines; an initial Vpgm parameter register configured to receive the parameter of the initial program voltage from the trimming circuit and to store the parameter; and a control circuit configured to perform programming of data to the memory cell array based on the parameter of the initial program voltage stored in the initial Vpgm parameter register, the trimming circuit being arranged in a part of the control circuit.

Abstract: A light emitting apparatus can prevent unevenness in illuminance from being produced. This light emitting apparatus 5 has: light emitting elements 3 that emit light; and light flux controlling members 4 that control the traveling directions of light emitted from light emitting elements 3, and a plurality of grid convex parts 13 are formed in back surface 12 (i.e. lens bottom surface) of light flux controlling member 4. Grid convex parts 13 vary the incident angles of light incident on back surface 12 of light flux controlling member 4. Therefore, light incident from back surface 12 is scattered without being concentrated, and is emitted from light flux controlling member 4.

Abstract: A semiconductor memory device includes a memory cell array including a plurality of memory cells, a first data latch circuit, a second data latch circuit, an arithmetic circuit, a counter circuit, and a controller. And controller compares the number (N) counted by the counter circuit with a reference number (M), and performs control to output flag information outside if N?M.

Abstract: A resistance change memory device including memory cells arranged, the memory cell having a stable state with a high resistance value and storing in a non-volatile manner such multi-level data that at least three resistance values, R0, R1 and R2 (R0<R1<R2) are selectively set, wherein resistance gaps ?R1(=R1?R0) and ?R2(=R2?R1) are set to satisfy the relationship of ?R1>?R2.

Abstract: A nonvolatile semiconductor memory device comprises a memory cell array of electrically erasable programmable nonvolatile memory cells arranged in matrix, each memory cell using a variable resistor. A pulse generator generates plural types of write pulses for varying the resistance of the variable resistor based on write data. A selection circuit applies write pulses generated by the pulse generator to the memory cell. A sense amplifier executes verify read to the memory cell. A status decision circuit decides the verify result based on the output from the sense amplifier. A control circuit executes additional write to the memory cell based on the verify result from the status decision circuit.

Abstract: A nonvolatile semiconductor memory of the present invention includes a plurality of bit lines and word lines which are arranged to intersect each other; a memory cell array having a plurality of electrically-programmable memory cells arranged in a region in which the bit lines and the word lines intersect; a trimming circuit configured to obtain a parameter of an initial program voltage for each word line of the plurality of word lines; an initial Vpgm parameter register configured to receive the parameter of the initial program voltage from the trimming circuit and to store the parameter; and a control circuit configured to perform programming of data to the memory cell array based on the parameter of the initial program voltage stored in the initial Vpgm parameter register, the trimming circuit being arranged in a part of the control circuit.

Abstract: A nonvolatile semiconductor memory of the present invention includes a plurality of bit lines and word lines which are arranged to intersect each other; a memory cell array having a plurality of electrically-programmable memory cells arranged in a region in which the bit lines and the word lines intersect; a trimming circuit configured to obtain a parameter of an initial program voltage for each word line of the plurality of word lines; an initial Vpgm parameter register configured to receive the parameter of the initial program voltage from the trimming circuit and to store the parameter; and a control circuit configured to perform programming of data to the memory cell array based on the parameter of the initial program voltage stored in the initial Vpgm parameter register, the trimming circuit being arranged in a part of the control circuit.

Abstract: A resistance change memory device including memory cells arranged, the memory cell having a stable state with a high resistance value and storing in a non-volatile manner such multi-level data that at least three resistance values, R0, R1 and R2 (R0<R1<R2) are selectively set, wherein resistance gaps ?R1(=R1?R0) and ?R2(=R2?R1) are set to satisfy the relationship of ?R1>?R2.

Abstract: A nonvolatile semiconductor memory device of the present invention is characterized in that, when data is written to a flag cell area, every other flag cell in the direction of one bit line BL among a plurality of flag cells 15 connected to the bit line BL is written with data and every other flag cell in the direction of one word line WL among a plurality of flag cells 15 connected to the word line WL is written with data. The arrangement as described above prevents a flag cell 15 from being influenced by the capacitive coupling of a neighboring flag cell 15 adjacent to the flag cell 15 in the direction of the word line WL. Thus, data (flag data) memorized by the flag cell 15 can have improved reliability.

Abstract: A light guide plate has an incidence face provided by a side end face, emission face and back face. The incidence face has first and second end edges meeting the emission face and the back face respectively. First range N1 in the emission face is set as to correspond to a reflecting-cover which returns at least a part of light emitted from first range N1 into the light guide plate. The reflecting-cover is disposed along the first end edge, covering a part of the emission face. Most of the returned light is emitted from second range N2, becoming illumination light. First range N1 has emission function weaker than that of second range N2, thereby avoiding the emission from showing abnormal emission in the vicinity of the first end edge. The reflecting-cover may be provided by an end edge portion of a lamp reflector for a primary light source.

Abstract: [PROBLEMS] To provide a probe useful in the detection of HBV or HBs antigen by which an escape mutant of hepatitis B virus (HBV) possibly occurring in a specimen can be detected; and a method of using the same. [MEANS FOR SOLVING PROBLEMS]A probe capable of recognizing an epitope located on a peptide comprising the amino acid sequence of SEQ ID NO:1; and a method of detecting hepatitis B virus or hepatitis B virus s antigen by using this probe.

Abstract: In a control order of non-selected blocks at the time of data erase operation of one or a plurality of blocks, the control gate line is controlled to ground potential at first, then subsequently, a transfer transistor of the non-selected blocks is set to be an off-state. Next, high voltage is supplied to the well region and the data of the selected block is erased. Then, the control gate line is charged to the voltage which is used, for instance, at the time of reading out, or to the voltage (Vcg) which is used at the verification (Vcg). After the control gate line is charged to Vcg, the erase voltage supplied to the well region is discharged. Then, the control gate line is returned to ground potential after completing the discharge of the well region, and thus the data erase operation of the block is completed.

Abstract: A non-volatile semiconductor memory device includes: a cell array having electrically rewritable and non-volatile memory cells arranged therein, the cell array being divided into a plurality of blocks, each the block being divided into a plurality of sub-blocks each having one or plural and continuous pages; and a controller for controlling data erasure of the cell array in a way that each the sub-block serves as a unit of data erasure, wherein each the sub-block in the cell array stores the number of data erasure which is renewed by each data erasure, and the number of data erasure is limited for each the sub-block to a permissible maximum value stored in a certain block in the cell array.

Abstract: A nonvolatile semiconductor memory that have a a plurality of bit lines and word lines disposed crossing each other; a memory cell array having a plurality of electrically-programmable memory cells disposed in a region where the bit lines and the word lines are crossing; a trimming circuit which is operated a parameter of initial program voltage every the word line; an initial programming voltage parameter memory section which is stored receiving the parameter of initial program voltage from the trimming circuit; and a controller which is data program for the memory cell array based on the parameter of initial program voltage stored in the initial programming voltage parameter memory section.

Abstract: In a control order of non-selected blocks at the time of data erase operation of one or a plurality of blocks, the control gate line is controlled to ground potential at first, then subsequently, a transfer transistor of the non-selected blocks is set to be an off-state. Next, high voltage is supplied to the well region and the data of the selected block is erased. Then, the control gate line is charged to the voltage which is used, for instance, at the time of reading out, or to the voltage (Vcg) which is used at the verification (Vcg). After the control gate line is charged to Vcg, the erase voltage supplied to the well region is discharged. Then, the control gate line is returned to ground potential after completing the discharge of the well region, and thus the data erase operation of the block is completed.

Abstract: A nonvolatile semiconductor memory device of the present invention is characterized in that, when data is written to a flag cell area, every other flag cell in the direction of one bit line BL among a plurality of flag cells 15 connected to the bit line BL is written with data and every other flag cell in the direction of one word line WL among a plurality of flag cells 15 connected to the word line WL is written with data. The arrangement as described above prevents a flag cell 15 from being influenced by the capacitive coupling of a neighboring flag cell 15 adjacent to the flag cell 15 in the direction of the word line WL. Thus, data (flag data) memorized by the flag cell 15 can have improved reliability.

Abstract: A non-volatile semiconductor memory device includes: a cell array having electrically rewritable and non-volatile memory cells arranged therein, the cell array being divided into a plurality of blocks, each the block being divided into a plurality of sub-blocks each having one or plural and continuous pages; and a controller for controlling data erasure of the cell array in a way that each the sub-block serves as a unit of data erasure, wherein each the sub-block in the cell array stores the number of data erasure which is renewed by each data erasure, and the number of data erasure is limited for each the sub-block to a permissible maximum value stored in a certain block in the cell array.