Patents by Inventor Yasuyuki Ikeda

Yasuyuki Ikeda has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240128144
    Abstract: The present disclosure provides a sealing material suitable for a compound having a non-stoichiometric composi263tion. The present disclosure is related to a sealing material for a compound having a non-stoichiometric composition, the sealing material including a polymer layer and an inorganic oxide insulator layer, wherein the polymer layer includes a first polymer layer containing an organic solvent soluble polymer.
    Type: Application
    Filed: February 24, 2022
    Publication date: April 18, 2024
    Applicants: THE UNIVERSITY OF TOKYO, DAICEL CORPORATION
    Inventors: Junichi TAKEYA, Shunichiro WATANABE, Shouhei KUMAGAI, Xiaozhu WEI, Daiji IKEDA, Hiroki SATO, Yasuyuki AKAI
  • Publication number: 20240118778
    Abstract: There are provided a display panel with a touch detector that allows the touch detection electrodes to be less visible, a touch panel, and an electronic unit having the display panel with a touch detector. The display panel with a touch detector includes: a display layer including a plurality of display elements arranged side by side; and an electrode layer alternately segmented into first regions and second regions along a first direction, the electrode layer including a plurality of first slits arranged side by side to extend in a second direction, and a plurality of second slits each allowing an adjacent pair of the plurality of first slits in the second regions to be in communication with one another.
    Type: Application
    Filed: December 20, 2023
    Publication date: April 11, 2024
    Inventors: Koji ISHIZAKI, Koji NOGUCHI, Masanobu IKEDA, Yasuyuki MATSUI
  • Publication number: 20240120581
    Abstract: The present invention provides steel foil for battery containers, the steel foil being characterized in that the maximum value of the maximum principal strain in uniaxial deformation is not less than 0.25 and the maximum value of the maximum principal strain in planar strain deformation is not less than 0.1. The present invention is able to provide steel foil for battery containers that is capable of restraining cracking of a base material when subjected to a severe forming process for battery containers.
    Type: Application
    Filed: January 27, 2022
    Publication date: April 11, 2024
    Inventors: Nobuhiro IWAMOTO, Yasuyuki IKEDA, Shinichi TAKEMATSU, Shinichirou HORIE, Koh YOSHIOKA
  • Patent number: 11955403
    Abstract: A header for a semiconductor package includes: an eyelet having an upper surface and a lower surface; a first metal block molded integrally with the eyelet, protruding at the upper surface, and having a substantially U shape; a first lead sealed in a first through hole penetrating the eyelet; a first substrate having a front surface formed with a first signal pattern electrically connected to the first lead and having a back surface fixed to a first end surface of the first metal block; a second lead sealed in a second through hole penetrating the eyelet; and a second substrate having a front surface formed with a second signal pattern electrically connected to the second lead and having a back surface fixed to a second end surface of the first metal block.
    Type: Grant
    Filed: March 19, 2021
    Date of Patent: April 9, 2024
    Assignee: SHINKO ELECTRIC INDUSTRIES CO., LTD.
    Inventors: Yasuyuki Kimura, Takumi Ikeda
  • Publication number: 20240101235
    Abstract: Provided with a weight release device capable of being operated in deep sea same as the conventional weight release device without accompanying a mechanical operation at all to avoid troubles of mechanical operation occurred in the conventional weight release device. The weight release device includes a housing fixed to the underwater observation device; a thread made of thermoplastic resin; electric heater portions; a weight support plate; a locking member of the thread made of the thermoplastic resin; and a ring for hanging the weight. The thread made of the thermoplastic resin is arranged from a start point housed in the housing, arranged to pass through the first electric heater portion, locked to the locking member of the thread made of the thermoplastic resin, arranged to pass through the second electric heater portion housed in the housing, and returned to an end point housed in the housing. The ring for hanging the weight is fixed to a lower surface of the weight support plate.
    Type: Application
    Filed: March 3, 2022
    Publication date: March 28, 2024
    Inventors: Tetsuya MIWA, Kazumasa IKEDA, Takahiro KUBOTA, Atsushi ARAI, Yasuyuki MURAKAMI
  • Patent number: 11923652
    Abstract: A header for a semiconductor package, includes an eyelet having an upper surface, and a lower surface on an opposite side from the upper surface, a metal block having a side surface, and configured to protrude from the upper surface of the eyelet, a lead sealed in a through hole which penetrates the eyelet from the upper surface to the lower surface of the eyelet, and a substrate having a front surface formed with a signal pattern electrically connected to the lead, and a back surface on an opposite side from the front surface. The back surface of the substrate is fixed to the side surface of the metal block. A portion of the back surface of the substrate is exposed from the metal block, and this portion of the substrate is formed with a ground pattern.
    Type: Grant
    Filed: March 10, 2021
    Date of Patent: March 5, 2024
    Assignee: SHINKO ELECTRIC INDUSTRIES CO., LTD.
    Inventors: Yasuyuki Kimura, Takumi Ikeda
  • Publication number: 20240025764
    Abstract: An iridium-containing oxide having a total pore volume of 0.20 cm3/g or more, calculated by a BJH method from nitrogen adsorption/desorption isotherm measurement, and a pore distribution having an average pore diameter of 7.0 nm or more.
    Type: Application
    Filed: December 14, 2021
    Publication date: January 25, 2024
    Applicant: FURUYA METAL CO., LTD.
    Inventors: Yasuyuki Ikeda, Kenji Terada, Hiroaki Suzuki, Junichi Watanabe, Takashi Ito
  • Patent number: 11830174
    Abstract: A defect inspecting device including an acquisition unit, an image generating unit, an inspection unit, and a setting unit. The image generating unit generates one or more feature extraction images by applying to an inspection image a learned classifier. The inspection unit identifies a region corresponding to a defect based on one or more determination parameters and a binarized image generated based on the feature extraction image. The setting unit provisionally sets the determination parameters on premise of a post-adjustment from a user when a number of image data for learning corresponding to the features is less than a threshold value in a case where the region corresponding to the defect is identified based on the pre-learned features, and sets the determination parameters according to designation from the user in a case where the region corresponding to the defect is identified based on a feature other than the pre-learned features.
    Type: Grant
    Filed: November 13, 2019
    Date of Patent: November 28, 2023
    Assignee: OMRON Corporation
    Inventors: Yasuyuki Ikeda, Masashi Kurita
  • Patent number: 11769248
    Abstract: This image processing device, by superimposing a defect image 52 on a background image 51, with the original image of an inspection subject as the background image 51, and performing image processing in which the display format of the defect image 52 or the display format of the background image 51 is altered, a plurality of composite images 50 having different ways of seeing the defect image 52 with respect to the background image 51 are generated (step 403), the advisability of detecting the defect image 52 from each of the plurality of composite images 50 is verified (step 404), the detectable range 60 of the defect image 52 is estimated on the basis of the detection advisability verification results (step 405), and the detectable range 60 is displayed (step 406).
    Type: Grant
    Filed: October 23, 2019
    Date of Patent: September 26, 2023
    Assignee: OMRON Corporation
    Inventors: Masashi Kurita, Yasuyuki Ikeda, Sakon Yamamoto
  • Publication number: 20230252616
    Abstract: An inspection system includes: a light emitting device configured to illuminate a target object; a collimator lens arranged between the light emitting device and the target object; and an imaging device configured to image the target object. The light emitting device is capable of changing a light emission position. The inspection system further includes an image analysis unit configured to generate an analysis image in which a value of each pixel corresponds to a normal direction of a surface of the target object appearing in the pixel, by analyzing a plurality of captured images obtained individually from a plurality of times of imaging where the light emission positions are different from each other. As a result, time and effort in adjustment for inspection can be reduced, and defect detection accuracy is improved.
    Type: Application
    Filed: March 8, 2021
    Publication date: August 10, 2023
    Applicant: OMRON CORPORATION
    Inventor: Yasuyuki IKEDA
  • Patent number: 11574397
    Abstract: A convolutional neural network performs: a first masking process of masking a pixel region not to be inspected, by computing pixel values of corresponding pixels of an inspection image and of a mask image; an intermediate process for extracting a feature image from the inspection image that has been subjected to the first masking process; and a second masking process of masking the pixel region not to be inspected, by computing the pixel values of corresponding pixels of the inspection image that has been subjected to the intermediate process and of the mask image that has been subjected to a process identical to the intermediate process.
    Type: Grant
    Filed: October 10, 2019
    Date of Patent: February 7, 2023
    Assignee: OMRON Corporation
    Inventors: Yasuyuki Ikeda, Masashi Kurita
  • Publication number: 20220347669
    Abstract: The supported catalyst synthesis device according to the present disclosure includes a first source for a liquid containing a reducing agent; a second source for a liquid containing elements to constitute single-metal fine particles or solid solution fine particles to be supported; a third source for a liquid containing support particles; a reaction unit that joins flows of these liquids; a liquid feed route connecting between the first source and the reaction unit; a liquid feed route connecting between the second source and the reaction unit; a liquid feed route connecting between the third source and the reaction unit; and a collection unit, connected to the reaction unit via a pipe, to collect a produced reaction product, and further includes a pressure adjustment mechanism connected to the collection unit.
    Type: Application
    Filed: June 16, 2020
    Publication date: November 3, 2022
    Applicant: FURUYA METAL CO., LTD.
    Inventors: Yasuyuki Ikeda, Kenji Terada
  • Patent number: 11301978
    Abstract: An image generating part generating feature extraction images by applying an identification part, which has completed learning, that has executed learning in advance to extract features using learning image data to an inspection image, an inspection part specifying an area corresponding to a defect on the basis of judgment parameters for judging presence/absence of a defect in the inspection target object and a binary image generated on the basis of the feature extraction images, and a setting part calculating an image score based on a density of a color of pixels of a setting image using the setting image that is the binary image in which an area corresponding to the defect is specified and updating the judgment parameters such that a difference between an image score of the inside of the area and an image score of the outside of the area becomes relatively large are included.
    Type: Grant
    Filed: January 17, 2019
    Date of Patent: April 12, 2022
    Assignee: OMRON Corporation
    Inventors: Yasuyuki Ikeda, Masashi Kurita
  • Publication number: 20210233231
    Abstract: A convolutional neural network performs: a first masking process of masking a pixel region not to be inspected, by computing pixel values of corresponding pixels of an inspection image and of a mask image; an intermediate process for extracting a feature image from the inspection image that has been subjected to the first masking process; and a second masking process of masking the pixel region not to be inspected, by computing the pixel values of corresponding pixels of the inspection image that has been subjected to the intermediate process and of the mask image that has been subjected to a process identical to the intermediate process.
    Type: Application
    Filed: October 10, 2019
    Publication date: July 29, 2021
    Applicant: OMRON Corporation
    Inventors: Yasuyuki IKEDA, Masashi KURITA
  • Publication number: 20210183037
    Abstract: This image processing device, by superimposing a defect image 52 on a background image 51, with the original image of an inspection subject as the background image 51, and performing image processing in which the display format of the defect image 52 or the display format of the background image 51 is altered, a plurality of composite images 50 having different ways of seeing the defect image 52 with respect to the background image 51 are generated (step 403), the advisability of detecting the defect image 52 from each of the plurality of composite images 50 is verified (step 404), the detectable range 60 of the defect image 52 is estimated on the basis of the detection advisability verification results (step 405), and the detectable range 60 is displayed (step 406).
    Type: Application
    Filed: October 23, 2019
    Publication date: June 17, 2021
    Applicant: OMRON Corporation
    Inventors: Masashi KURITA, Yasuyuki IKEDA, Sakon YAMAMOTO
  • Publication number: 20210183052
    Abstract: A defect inspecting device including an acquisition unit, an image generating unit, an inspection unit, and a setting unit. The image generating unit generates one or more feature extraction images by applying to an inspection image a learned classifier. The inspection unit identifies a region corresponding to a defect based on one or more determination parameters and a binarized image generated based on the feature extraction image. The setting unit provisionally sets the determination parameters on premise of a post-adjustment from a user when a number of image data for learning corresponding to the features is less than a threshold value in a case where the region corresponding to the defect is identified based on the pre-learned features, and sets the determination parameters according to designation from the user in a case where the region corresponding to the defect is identified based on a feature other than the pre-learned features.
    Type: Application
    Filed: November 13, 2019
    Publication date: June 17, 2021
    Applicant: OMRON Corporation
    Inventors: Yasuyuki IKEDA, Masashi KURITA
  • Patent number: 10885620
    Abstract: Provided is an image processing system which determines at least one object using a low function device and a high function device having higher calculation capacity than the low function device. The low function device includes a part configured to output a first determination result which identifies the objects by applying a first convolution neural network to captured images of the objects, and a part configured to output the captured image to the high function device when the first determination result meets a predetermined condition. The high function device includes a part configured to apply a second convolution neural network preliminarily learned from a sample which is at least partially common to the first neural network to the captured image and to output a second determination result which identifies the object.
    Type: Grant
    Filed: February 11, 2018
    Date of Patent: January 5, 2021
    Assignee: OMRON Corporation
    Inventors: Jaewook Hwang, Shiro Fujieda, Yasuyuki Ikeda, Kazushi Yoshioka
  • Patent number: 10824906
    Abstract: An image processing device includes: a feature detection image generating unit that generates multiple feature detection images corresponding to multiple classes by applying a convolutional neural network having the classes learned previously to an input image; a post-processing unit that generates a measurement result by performing a post-process on at least some feature detection images of the multiple feature detection images on the basis of a setting parameter; and a user interface unit that receives an input of the setting parameter while presenting a user at least one of at least some of the feature detection images which are generated by the feature detection image generating unit and the measurement result which is generated by causing the post-processing unit to perform the post-process using at least some of the feature detection images which are generated by the feature detection image generating unit.
    Type: Grant
    Filed: February 8, 2018
    Date of Patent: November 3, 2020
    Assignee: OMRON Corporation
    Inventor: Yasuyuki Ikeda
  • Patent number: 10776909
    Abstract: The disclosure includes: a memory section, storing a learned model and an internal parameter set in the learned model; an acquisition section, acquiring an image of an inspection object photographed under predetermined conditions; a preprocessing section, generating a predetermined preprocessing filter according to a feature value in a preprocessing image being an image of the inspection object that is acquired by the acquisition section and that includes a defect, and a feature value corresponding to the internal parameter, and generating a preprocessed image by applying the generated preprocessing filter to an inspection image being an image of the inspection object that is acquired by the acquisition section and converting the inspection image; and an inspection section, inspecting the preprocessed image for presence or absence of the defect of the inspection object by using the stored learned model.
    Type: Grant
    Filed: September 13, 2018
    Date of Patent: September 15, 2020
    Assignee: OMRON Corporation
    Inventors: Yasuyuki Ikeda, Masashi Kurita
  • Patent number: 10460570
    Abstract: The present disclosure provides an automatic transaction device including: a device casing that is formed at side faces of the device; a door that can be opened and closed to form a device opening at one face of the device; and a device base plate that is formed at a base of the device, a first gap is present between an internal unit of the device and the device casing, the device base plate includes plural fixing member holes disposed in the first gap for fixing the device to a floor, and the fixing member holes are disposed at the device opening side with respect to a backmost position as viewed from the device opening.
    Type: Grant
    Filed: November 25, 2016
    Date of Patent: October 29, 2019
    Assignee: Oki Electric Industry Co., Ltd.
    Inventor: Yasuyuki Ikeda