Patents by Inventor Yasuyuki Momoi
Yasuyuki Momoi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 10296015Abstract: A sinusoidal signal that is frequency-swept so as to have a frequency region in which each frequency has a different number of cycles and/or application duration is applied to a control system in a movement device that moves a movement target, time-series data for transmission characteristics obtained from said control system as a result of the application of the aforementioned sinusoidal signal is acquired, and said time-series data is subjected to spectral analysis. This allows the provision of a positioning control device and a frequency-characteristics measurement method that make it possible to optimize measuring precision while minimizing increases in the amount of time it takes to measure frequency characteristics.Type: GrantFiled: November 15, 2013Date of Patent: May 21, 2019Assignee: Hitachi, Ltd.Inventors: Masaki Odai, Yasuyuki Momoi, Hironori Ogawa
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Publication number: 20160246305Abstract: A sinusoidal signal that is frequency-swept so as to have a frequency region in which each frequency has a different number of cycles and/or application duration is applied to a control system in a movement device that moves a movement target, time-series data for transmission characteristics obtained from said control system as a result of the application of the aforementioned sinusoidal signal is acquired, and said time-series data is subjected to spectral analysis. This allows the provision of a positioning control device and a frequency-characteristics measurement method that make it possible to optimize measuring precision while minimizing increases in the amount of time it takes to measure frequency characteristics.Type: ApplicationFiled: November 15, 2013Publication date: August 25, 2016Inventors: Masaki ODAI, Yasuyuki MOMOI, Hironori OGAWA
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Patent number: 9171695Abstract: In order to provide a stage apparatus with high speed stability in addition to being able to achieve positioning with a high degree of accuracy, and a sample observation apparatus, such as an optical microscope and a scanning electron microscope, including the stage apparatus, the stage apparatus and the sample observation apparatus of the present invention correct a command voltage value of standard waveform data or an output timing of a command voltage value such that a difference between a first time history response and a second time history response is reduced to zero, the first time history response for displacement or speed when the stage mechanism is driven with use of the standard waveform data showing the command voltage value at each predetermined time and the second time history response for displacement or speed when a speed of the stage mechanism is constant, to be set as drive waveform data to be outputted to a drive unit of the stage mechanism.Type: GrantFiled: April 12, 2013Date of Patent: October 27, 2015Assignee: Hitachi High-Technologies CorporationInventors: Yasuyuki Momoi, Shigeru Haneda, Naoki Sakamoto, Masashi Shibahara, Akito Tanokuchi
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Publication number: 20150206704Abstract: In order to provide a stage apparatus with high speed stability in addition to being able to achieve positioning with a high degree of accuracy, and a sample observation apparatus, such as an optical microscope and a scanning electron microscope, including the stage apparatus, the stage apparatus and the sample observation apparatus of the present invention correct a command voltage value of standard waveform data or an output timing of a command voltage value such that a difference between a first time history response and a second time history response is reduced to zero, the first time history response for displacement or speed when the stage mechanism is driven with use of the standard waveform data showing the command voltage value at each predetermined time and the second time history response for displacement or speed when a speed of the stage mechanism is constant, to be set as drive waveform data to be outputted to a drive unit of the stage mechanism.Type: ApplicationFiled: April 12, 2013Publication date: July 23, 2015Inventors: Yasuyuki Momoi, Shigeru Haneda, Naoki Sakamoto, Masashi Shibahara, Akito Tanokuchi
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Patent number: 8907303Abstract: In the present invention, a stage device is configured to: provide a marker on a specimen, a specimen holder or a rotary table that allows measurement of position and direction; perform a rotation and translation movement of a stage according to a predetermined operation pattern; measure the position and direction of the marker there; identify the rotation center position of the rotary table from the results of this measurement; further create a correction value table relative to a rotation angle by calculating rotation-angle correction value for correcting the rotation error, and translation correction value for correcting a positional variation of the rotation center position; obtain from the correction value table the correction values associated with either an inputted rotation-angle command value or an actual rotation angle; and control the stage device by correcting either the rotation-angle and translation-position command values inputted or a rotation-angle and translation-position detected.Type: GrantFiled: June 6, 2012Date of Patent: December 9, 2014Assignee: Hitachi High-Technologies CorporationInventors: Yasuyuki Momoi, Kaname Takahashi, Shigeru Haneda
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Publication number: 20140117251Abstract: In the present invention, a stage device is configured to: provide a marker on a specimen, a specimen holder or a rotary table that allows measurement of position and direction; perform a rotation and translation movement of a stage according to a predetermined operation pattern; measure the position and direction of the marker there; identify the rotation center position of the rotary table from the results of this measurement; further create a correction value table relative to a rotation angle by calculating rotation-angle correction value for correcting the rotation error, and translation correction value for correcting a positional variation of the rotation center position; obtain from the correction value table the correction values associated with either an inputted rotation-angle command value or an actual rotation angle; and control the stage device by correcting either the rotation-angle and translation-position command values inputted or a rotation-angle and translation-position detected.Type: ApplicationFiled: June 6, 2012Publication date: May 1, 2014Inventors: Yasuyuki Momoi, Kaname Takahashi, Shigeru Haneda
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Publication number: 20130082190Abstract: Fluctuation in speed when a stage with a sample mounted thereon is moved at low speed is reduced such that an image to be observed is moved at constant speed when performing high-magnification observation using a scanning electron microscope. A control amount is obtained by compensation means from the deviation between position information obtained from position information detected by position detection means through a first low-pass filter and a command value obtained by integrating a speed command value input from stage operation input means and through a second low-pass filter having the same frequency characteristic as the first low-pass filter, and a driving signal to be output to driving means is generated from the added value of the control amount and the speed command value by waveform output means.Type: ApplicationFiled: June 15, 2011Publication date: April 4, 2013Applicant: HITACHI HIGH-TECHNOLOGIES CORPORATIONInventors: Yasuyuki Momoi, Koichiro Tekeuchi, Kaname Takahashi, Shigeru Haneda
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Patent number: 8092471Abstract: A position measuring apparatus, for use in an assisting apparatus for surgical opertions, includes a position indicating apparatus for indicating a position and a direction of a tool, and three-dimensional position measuring apparatus for measuring a position and a direction of a surgical field and also the position and the direction of the tool. The position indicating apparatus and the three dimensional position measuring apparatus are unified in one body in the relative position thereof, so that a position for assistance of surgical operation is indicated in the form of an intersection line or an intersection point of the laser beams, irrespective of the position of the position measuring apparatus.Type: GrantFiled: November 20, 2003Date of Patent: January 10, 2012Assignee: Hitachi, Ltd.Inventors: Yasuyuki Momoi, Madoka Sugiura, Takahiro Ochi, Kazuo Yonenobu, Nobuhiko Sugano, Yoshinobu Sato, Yoshikazu Nakajima, Toshihiko Sasama, Takeyoshi Dohi, Ichiro Sakuma
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Publication number: 20050015099Abstract: A position measuring apparatus, for use in an assisting apparatus for surgical opertions, comprises a position indicating means for indicating a position and a direction of a tool, and a three-dimensional position measuring means for measuring a position and a direction of a surgical field and also the position and the direction of the tool. The position indicating means and the three-dimensional position measuring means are unified in one body in the relative position thereof, so that a position for assistance of surgical operation is indicated in the form of an intersection line or an intersection point of the laser beams, irrespective of the position of the position measuring apparatus.Type: ApplicationFiled: November 20, 2003Publication date: January 20, 2005Inventors: Yasuyuki Momoi, Madoka Sugiura, Takahiro Ochi, Kazuo Yonenobu, Nobuhiko Sugano, Yoshinobu Sato, Yoshikazu Nakajima, Toshihiko Sasama, Takeyoshi Dohi, Ichiro Sakuma
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Publication number: 20040186347Abstract: A surgical operation assistance system picks up an image of a surgical filed with using an image pick-up device. And, an image produce unit produces a stereographic image of the surgical filed, the image of which is picked up. Reference points of a surgical operation route are inputted upon basis of a kind of the surgical operation and the stereographic image. A surgical operation route calculate unit calculates out a smooth surgical operation route upon basis of the kind of the surgical operation and the reference points inputted, to be displayed on an image displaying apparatus.Type: ApplicationFiled: January 29, 2004Publication date: September 23, 2004Inventors: Ako Shose, Kazutoshi Kan, Yasuyuki Momoi
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Patent number: 6763311Abstract: A calculating device and method provided for a shaking test apparatus for carrying out a shaking test on a structure by using a partial structure and a numerical model which is virtually connected to the partial structure. The calculating device includes a calculation part which identifies a vibration model corresponding to the partial structure on the basis of displacement and reaction force detected in response to shaking and which combines the vibration model and the numerical model with each other to construct a model of the overall system corresponding to the structure and calculates the shaking response of the overall system model.Type: GrantFiled: January 3, 2002Date of Patent: July 13, 2004Assignee: Hitachi, Ltd.Inventors: Masahiko Inoue, Toshihiko Horiuchi, Yasuyuki Momoi, Takao Konno, Wataru Yamagishi
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Patent number: 6721668Abstract: The testing performs a vibration excitation testing of a part of the structure, performs a numerical calculus of vibration response of the other parts of the structure, and calculates the vibration response of a whole of the structure by combining these two methods. Testing includes calculating a position of a point of exciting force on the basis of vibration exciting, and calculating a reaction force on the basis of a load detected and the position of the point of exciting force. Then, a displacement of a numerical model is computed by using the reaction force calculated and a known external force, and calculating a vibration exciting machine displacement command value on the basis of the displacement. A drive drives the vibration exciting on the basis of an output thereof. Vibration excitation is performed in the translational direction as well as the rotational direction.Type: GrantFiled: December 2, 1999Date of Patent: April 13, 2004Assignee: Hitachi, Ltd.Inventors: Yasuyuki Momoi, Toshihiko Horiuchi, Kazuhiro Umekita, Masahiko Inoue, Takao Konno, Masaharu Sugano, Yuuji Tadano
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Patent number: 6629042Abstract: The present invention discloses a testing system and a testing method for a structure which tests a structure made of a test piece structure and a numerical model virtually connected to the structure. A simulated structure including a frame, an actuator and a reaction force measuring device is mounted on a foundation on which a shaking table is also mounted. Only the test piece structure is mounted on the shaking table. The motion of the shaking table 5 which is generated at the time of shaking the test piece structure using the shaking table and the actuator is measured by a shaking table motion measuring device, while the reaction force generated by the test piece structure is measured by a reaction force measuring device. Using these measured values and the numerical model stored in a digital computer, the motion of the test piece structure after a predetermined period for the motion of the simulated structure is calculated.Type: GrantFiled: March 27, 2002Date of Patent: September 30, 2003Assignee: Hitachi, Ltd.Inventors: Wataru Yamagishi, Toshihiko Horiuchi, Masahiko Inoue, Kazuhiro Umekita, Yasuyuki Momoi
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Patent number: 6575037Abstract: The testing performs a vibration excitation testing of a part of the structure, performs a numerical calculus of vibration response of the other parts of the structure, and calculates the vibration response of a whole of the structure by combining these two methods. Testing includes calculating a position of a point of exciting force on the basis of vibration exciting, and calculating a reaction force on the basis of a load detected and the position of the point of exciting force. Then, a displacement of a numerical model is computed by using the reaction force calculated and a known external force, and calculating a vibration exciting machine displacement command value on the basis of the displacement. A drive drives the vibration exciting on the basis of an output thereof. Vibration excitation is performed in the translational direction as well as the rotational direction.Type: GrantFiled: July 25, 2001Date of Patent: June 10, 2003Assignee: Hitachi, Ltd.Inventors: Yasuyuki Momoi, Toshihiko Horiuchi, Kazuhiro Umekita, Masahiko Inoue, Takao Konno, Masaharu Sugano, Yuuji Tadano
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Publication number: 20020116136Abstract: The present invention discloses a testing system and a testing method for a structure which tests a structure made of a test piece structure and a numerical model virtually connected to the structure. A simulated structure including a frame, an actuator and a reaction force measuring device is mounted on a foundation on which a shaking table is also mounted. Only the test piece structure is mounted on the shaking table. The motion of the shaking table 5 which is generated at the time of shaking the test piece structure using the shaking table and the actuator is measured by a shaking table motion measuring device, while the reaction force generated by the test piece structure is measured by a reaction force measuring device. Using these measured values and the numerical model stored in a digital computer, the motion of the test piece structure after a predetermined period for the motion of the simulated structure is calculated.Type: ApplicationFiled: March 27, 2002Publication date: August 22, 2002Applicant: Hitachi, Ltd.Inventors: Wataru Yamagishi, Toshihiko Horiuchi, Masahiko Inoue, Kazuhiro Umekita, Yasuyuki Momoi
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Patent number: 6397153Abstract: The present invention discloses a testing system and a testing method for a structure which tests a structure made of a test piece structure and a numerical model virtually connected to the structure. A simulated structure including a frame, an actuator and a reaction force measuring device is mounted on a foundation on which a shaking table is also mounted. Only the test piece structure is mounted on the shaking table. The motion of the shaking table 5 which is generated at the time of shaking the test piece structure using the shaking table and the actuator is measured by a shaking table motion measuring device, while the reaction force generated by the test piece structure is measured by a reaction force measuring device. Using these measured values and the numerical model stored in a digital computer, the motion of the test piece structure after a predetermined period for the motion of the simulated structure is calculated.Type: GrantFiled: June 25, 1999Date of Patent: May 28, 2002Assignee: Hitachi, Ltd.Inventors: Wataru Yamagishi, Toshihiko Horiuchi, Masahiko Inoue, Kazuhiro Umekita, Yasuyuki Momoi
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Publication number: 20020059034Abstract: A calculating device and method provided for a shaking test apparatus for carrying out a shaking test on a structure by using a partial structure and a numerical model which is virtually connected to the partial structure. The calculating device includes a calculation part which identifies a vibration model corresponding to the partial structure on the basis of displacement and reaction force detected in response to shaking and which combines the vibration model and the numerical model with each other to construct a model of the overall system corresponding to the structure and calculates the shaking response of the overall system model.Type: ApplicationFiled: January 3, 2002Publication date: May 16, 2002Inventors: Masahiko Inoue, Toshihiko Horiuchi, Yasuyuki Momoi, Takao Konno, Wataru Yamagishi
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Publication number: 20020042667Abstract: Vibration excitation testing, e.g. a prototype or actual model, calculates a vibration response of a structure deforming in both of a translational direction and a rotational direction.Type: ApplicationFiled: July 25, 2001Publication date: April 11, 2002Inventors: Yasuyuki Momoi, Toshihiko Horiuchi, Kazuhiro Umekita, Masahiko Inoue, Takao Konno, Masaharu Sugano, Yuuji Tadano
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Patent number: 6341258Abstract: A shaking response is estimated with high precision by performing a shaking test f or combining and estimating a shaking characteristic of a partial structure of an object under test obtained through a shaking test and a shaking response of the whole structure which is numerically modeled. In a shaking test apparatus and method, a structure under test comprises a partial structure and a numerical model which is virtually connected to the partial structure. First, a vibration model corresponding to the partial structure is assumed, the numerical model and the vibration model are combined to construct an overall-system model, and then the vibration response of the overall-system model is calculated. On the basis of the calculation result and the signal input from a waveform oscillator, the partial structure is shaken by using a shaker.Type: GrantFiled: March 15, 2000Date of Patent: January 22, 2002Assignee: Hitachi, Ltd.Inventors: Masahiko Inoue, Toshihiko Horiuchi, Yasuyuki Momoi, Takao Konno, Wataru Yamagishi
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Patent number: 5555179Abstract: A computer-implemented control method and a control apparatus of factory automation system having a cell formed by a plurality of working machines including at least one automated machine to execute a series of works in accordance with a control program. From a cell control program including specifications of working of entire cell that is input to the computer, information relating to working sequence of a plurality of working machines and information about control of inputs and outputs of a plurality of working machines are described, the specifications and informations are extracted by the computer. On the basis of the extracted information, a sequence control program by which control of the working sequence of a plurality of working machines and control of inputs and outputs of a plurality of working machines is generated by the computer are described.Type: GrantFiled: September 2, 1994Date of Patent: September 10, 1996Assignee: Hitachi, Ltd.Inventors: Masahiro Koyama, Norihisa Miyake, Hiroshi Sakairi, Shizuko Hattori, Yasuyuki Momoi, Tsutomu Fujimoto, Tsuyoshi Kai