Patents by Inventor Yasuyuki Momoi

Yasuyuki Momoi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10296015
    Abstract: A sinusoidal signal that is frequency-swept so as to have a frequency region in which each frequency has a different number of cycles and/or application duration is applied to a control system in a movement device that moves a movement target, time-series data for transmission characteristics obtained from said control system as a result of the application of the aforementioned sinusoidal signal is acquired, and said time-series data is subjected to spectral analysis. This allows the provision of a positioning control device and a frequency-characteristics measurement method that make it possible to optimize measuring precision while minimizing increases in the amount of time it takes to measure frequency characteristics.
    Type: Grant
    Filed: November 15, 2013
    Date of Patent: May 21, 2019
    Assignee: Hitachi, Ltd.
    Inventors: Masaki Odai, Yasuyuki Momoi, Hironori Ogawa
  • Publication number: 20160246305
    Abstract: A sinusoidal signal that is frequency-swept so as to have a frequency region in which each frequency has a different number of cycles and/or application duration is applied to a control system in a movement device that moves a movement target, time-series data for transmission characteristics obtained from said control system as a result of the application of the aforementioned sinusoidal signal is acquired, and said time-series data is subjected to spectral analysis. This allows the provision of a positioning control device and a frequency-characteristics measurement method that make it possible to optimize measuring precision while minimizing increases in the amount of time it takes to measure frequency characteristics.
    Type: Application
    Filed: November 15, 2013
    Publication date: August 25, 2016
    Inventors: Masaki ODAI, Yasuyuki MOMOI, Hironori OGAWA
  • Patent number: 9171695
    Abstract: In order to provide a stage apparatus with high speed stability in addition to being able to achieve positioning with a high degree of accuracy, and a sample observation apparatus, such as an optical microscope and a scanning electron microscope, including the stage apparatus, the stage apparatus and the sample observation apparatus of the present invention correct a command voltage value of standard waveform data or an output timing of a command voltage value such that a difference between a first time history response and a second time history response is reduced to zero, the first time history response for displacement or speed when the stage mechanism is driven with use of the standard waveform data showing the command voltage value at each predetermined time and the second time history response for displacement or speed when a speed of the stage mechanism is constant, to be set as drive waveform data to be outputted to a drive unit of the stage mechanism.
    Type: Grant
    Filed: April 12, 2013
    Date of Patent: October 27, 2015
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Yasuyuki Momoi, Shigeru Haneda, Naoki Sakamoto, Masashi Shibahara, Akito Tanokuchi
  • Publication number: 20150206704
    Abstract: In order to provide a stage apparatus with high speed stability in addition to being able to achieve positioning with a high degree of accuracy, and a sample observation apparatus, such as an optical microscope and a scanning electron microscope, including the stage apparatus, the stage apparatus and the sample observation apparatus of the present invention correct a command voltage value of standard waveform data or an output timing of a command voltage value such that a difference between a first time history response and a second time history response is reduced to zero, the first time history response for displacement or speed when the stage mechanism is driven with use of the standard waveform data showing the command voltage value at each predetermined time and the second time history response for displacement or speed when a speed of the stage mechanism is constant, to be set as drive waveform data to be outputted to a drive unit of the stage mechanism.
    Type: Application
    Filed: April 12, 2013
    Publication date: July 23, 2015
    Inventors: Yasuyuki Momoi, Shigeru Haneda, Naoki Sakamoto, Masashi Shibahara, Akito Tanokuchi
  • Patent number: 8907303
    Abstract: In the present invention, a stage device is configured to: provide a marker on a specimen, a specimen holder or a rotary table that allows measurement of position and direction; perform a rotation and translation movement of a stage according to a predetermined operation pattern; measure the position and direction of the marker there; identify the rotation center position of the rotary table from the results of this measurement; further create a correction value table relative to a rotation angle by calculating rotation-angle correction value for correcting the rotation error, and translation correction value for correcting a positional variation of the rotation center position; obtain from the correction value table the correction values associated with either an inputted rotation-angle command value or an actual rotation angle; and control the stage device by correcting either the rotation-angle and translation-position command values inputted or a rotation-angle and translation-position detected.
    Type: Grant
    Filed: June 6, 2012
    Date of Patent: December 9, 2014
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Yasuyuki Momoi, Kaname Takahashi, Shigeru Haneda
  • Publication number: 20140117251
    Abstract: In the present invention, a stage device is configured to: provide a marker on a specimen, a specimen holder or a rotary table that allows measurement of position and direction; perform a rotation and translation movement of a stage according to a predetermined operation pattern; measure the position and direction of the marker there; identify the rotation center position of the rotary table from the results of this measurement; further create a correction value table relative to a rotation angle by calculating rotation-angle correction value for correcting the rotation error, and translation correction value for correcting a positional variation of the rotation center position; obtain from the correction value table the correction values associated with either an inputted rotation-angle command value or an actual rotation angle; and control the stage device by correcting either the rotation-angle and translation-position command values inputted or a rotation-angle and translation-position detected.
    Type: Application
    Filed: June 6, 2012
    Publication date: May 1, 2014
    Inventors: Yasuyuki Momoi, Kaname Takahashi, Shigeru Haneda
  • Publication number: 20130082190
    Abstract: Fluctuation in speed when a stage with a sample mounted thereon is moved at low speed is reduced such that an image to be observed is moved at constant speed when performing high-magnification observation using a scanning electron microscope. A control amount is obtained by compensation means from the deviation between position information obtained from position information detected by position detection means through a first low-pass filter and a command value obtained by integrating a speed command value input from stage operation input means and through a second low-pass filter having the same frequency characteristic as the first low-pass filter, and a driving signal to be output to driving means is generated from the added value of the control amount and the speed command value by waveform output means.
    Type: Application
    Filed: June 15, 2011
    Publication date: April 4, 2013
    Applicant: HITACHI HIGH-TECHNOLOGIES CORPORATION
    Inventors: Yasuyuki Momoi, Koichiro Tekeuchi, Kaname Takahashi, Shigeru Haneda
  • Patent number: 8092471
    Abstract: A position measuring apparatus, for use in an assisting apparatus for surgical opertions, includes a position indicating apparatus for indicating a position and a direction of a tool, and three-dimensional position measuring apparatus for measuring a position and a direction of a surgical field and also the position and the direction of the tool. The position indicating apparatus and the three dimensional position measuring apparatus are unified in one body in the relative position thereof, so that a position for assistance of surgical operation is indicated in the form of an intersection line or an intersection point of the laser beams, irrespective of the position of the position measuring apparatus.
    Type: Grant
    Filed: November 20, 2003
    Date of Patent: January 10, 2012
    Assignee: Hitachi, Ltd.
    Inventors: Yasuyuki Momoi, Madoka Sugiura, Takahiro Ochi, Kazuo Yonenobu, Nobuhiko Sugano, Yoshinobu Sato, Yoshikazu Nakajima, Toshihiko Sasama, Takeyoshi Dohi, Ichiro Sakuma
  • Publication number: 20050015099
    Abstract: A position measuring apparatus, for use in an assisting apparatus for surgical opertions, comprises a position indicating means for indicating a position and a direction of a tool, and a three-dimensional position measuring means for measuring a position and a direction of a surgical field and also the position and the direction of the tool. The position indicating means and the three-dimensional position measuring means are unified in one body in the relative position thereof, so that a position for assistance of surgical operation is indicated in the form of an intersection line or an intersection point of the laser beams, irrespective of the position of the position measuring apparatus.
    Type: Application
    Filed: November 20, 2003
    Publication date: January 20, 2005
    Inventors: Yasuyuki Momoi, Madoka Sugiura, Takahiro Ochi, Kazuo Yonenobu, Nobuhiko Sugano, Yoshinobu Sato, Yoshikazu Nakajima, Toshihiko Sasama, Takeyoshi Dohi, Ichiro Sakuma
  • Publication number: 20040186347
    Abstract: A surgical operation assistance system picks up an image of a surgical filed with using an image pick-up device. And, an image produce unit produces a stereographic image of the surgical filed, the image of which is picked up. Reference points of a surgical operation route are inputted upon basis of a kind of the surgical operation and the stereographic image. A surgical operation route calculate unit calculates out a smooth surgical operation route upon basis of the kind of the surgical operation and the reference points inputted, to be displayed on an image displaying apparatus.
    Type: Application
    Filed: January 29, 2004
    Publication date: September 23, 2004
    Inventors: Ako Shose, Kazutoshi Kan, Yasuyuki Momoi
  • Patent number: 6763311
    Abstract: A calculating device and method provided for a shaking test apparatus for carrying out a shaking test on a structure by using a partial structure and a numerical model which is virtually connected to the partial structure. The calculating device includes a calculation part which identifies a vibration model corresponding to the partial structure on the basis of displacement and reaction force detected in response to shaking and which combines the vibration model and the numerical model with each other to construct a model of the overall system corresponding to the structure and calculates the shaking response of the overall system model.
    Type: Grant
    Filed: January 3, 2002
    Date of Patent: July 13, 2004
    Assignee: Hitachi, Ltd.
    Inventors: Masahiko Inoue, Toshihiko Horiuchi, Yasuyuki Momoi, Takao Konno, Wataru Yamagishi
  • Patent number: 6721668
    Abstract: The testing performs a vibration excitation testing of a part of the structure, performs a numerical calculus of vibration response of the other parts of the structure, and calculates the vibration response of a whole of the structure by combining these two methods. Testing includes calculating a position of a point of exciting force on the basis of vibration exciting, and calculating a reaction force on the basis of a load detected and the position of the point of exciting force. Then, a displacement of a numerical model is computed by using the reaction force calculated and a known external force, and calculating a vibration exciting machine displacement command value on the basis of the displacement. A drive drives the vibration exciting on the basis of an output thereof. Vibration excitation is performed in the translational direction as well as the rotational direction.
    Type: Grant
    Filed: December 2, 1999
    Date of Patent: April 13, 2004
    Assignee: Hitachi, Ltd.
    Inventors: Yasuyuki Momoi, Toshihiko Horiuchi, Kazuhiro Umekita, Masahiko Inoue, Takao Konno, Masaharu Sugano, Yuuji Tadano
  • Patent number: 6629042
    Abstract: The present invention discloses a testing system and a testing method for a structure which tests a structure made of a test piece structure and a numerical model virtually connected to the structure. A simulated structure including a frame, an actuator and a reaction force measuring device is mounted on a foundation on which a shaking table is also mounted. Only the test piece structure is mounted on the shaking table. The motion of the shaking table 5 which is generated at the time of shaking the test piece structure using the shaking table and the actuator is measured by a shaking table motion measuring device, while the reaction force generated by the test piece structure is measured by a reaction force measuring device. Using these measured values and the numerical model stored in a digital computer, the motion of the test piece structure after a predetermined period for the motion of the simulated structure is calculated.
    Type: Grant
    Filed: March 27, 2002
    Date of Patent: September 30, 2003
    Assignee: Hitachi, Ltd.
    Inventors: Wataru Yamagishi, Toshihiko Horiuchi, Masahiko Inoue, Kazuhiro Umekita, Yasuyuki Momoi
  • Patent number: 6575037
    Abstract: The testing performs a vibration excitation testing of a part of the structure, performs a numerical calculus of vibration response of the other parts of the structure, and calculates the vibration response of a whole of the structure by combining these two methods. Testing includes calculating a position of a point of exciting force on the basis of vibration exciting, and calculating a reaction force on the basis of a load detected and the position of the point of exciting force. Then, a displacement of a numerical model is computed by using the reaction force calculated and a known external force, and calculating a vibration exciting machine displacement command value on the basis of the displacement. A drive drives the vibration exciting on the basis of an output thereof. Vibration excitation is performed in the translational direction as well as the rotational direction.
    Type: Grant
    Filed: July 25, 2001
    Date of Patent: June 10, 2003
    Assignee: Hitachi, Ltd.
    Inventors: Yasuyuki Momoi, Toshihiko Horiuchi, Kazuhiro Umekita, Masahiko Inoue, Takao Konno, Masaharu Sugano, Yuuji Tadano
  • Publication number: 20020116136
    Abstract: The present invention discloses a testing system and a testing method for a structure which tests a structure made of a test piece structure and a numerical model virtually connected to the structure. A simulated structure including a frame, an actuator and a reaction force measuring device is mounted on a foundation on which a shaking table is also mounted. Only the test piece structure is mounted on the shaking table. The motion of the shaking table 5 which is generated at the time of shaking the test piece structure using the shaking table and the actuator is measured by a shaking table motion measuring device, while the reaction force generated by the test piece structure is measured by a reaction force measuring device. Using these measured values and the numerical model stored in a digital computer, the motion of the test piece structure after a predetermined period for the motion of the simulated structure is calculated.
    Type: Application
    Filed: March 27, 2002
    Publication date: August 22, 2002
    Applicant: Hitachi, Ltd.
    Inventors: Wataru Yamagishi, Toshihiko Horiuchi, Masahiko Inoue, Kazuhiro Umekita, Yasuyuki Momoi
  • Patent number: 6397153
    Abstract: The present invention discloses a testing system and a testing method for a structure which tests a structure made of a test piece structure and a numerical model virtually connected to the structure. A simulated structure including a frame, an actuator and a reaction force measuring device is mounted on a foundation on which a shaking table is also mounted. Only the test piece structure is mounted on the shaking table. The motion of the shaking table 5 which is generated at the time of shaking the test piece structure using the shaking table and the actuator is measured by a shaking table motion measuring device, while the reaction force generated by the test piece structure is measured by a reaction force measuring device. Using these measured values and the numerical model stored in a digital computer, the motion of the test piece structure after a predetermined period for the motion of the simulated structure is calculated.
    Type: Grant
    Filed: June 25, 1999
    Date of Patent: May 28, 2002
    Assignee: Hitachi, Ltd.
    Inventors: Wataru Yamagishi, Toshihiko Horiuchi, Masahiko Inoue, Kazuhiro Umekita, Yasuyuki Momoi
  • Publication number: 20020059034
    Abstract: A calculating device and method provided for a shaking test apparatus for carrying out a shaking test on a structure by using a partial structure and a numerical model which is virtually connected to the partial structure. The calculating device includes a calculation part which identifies a vibration model corresponding to the partial structure on the basis of displacement and reaction force detected in response to shaking and which combines the vibration model and the numerical model with each other to construct a model of the overall system corresponding to the structure and calculates the shaking response of the overall system model.
    Type: Application
    Filed: January 3, 2002
    Publication date: May 16, 2002
    Inventors: Masahiko Inoue, Toshihiko Horiuchi, Yasuyuki Momoi, Takao Konno, Wataru Yamagishi
  • Publication number: 20020042667
    Abstract: Vibration excitation testing, e.g. a prototype or actual model, calculates a vibration response of a structure deforming in both of a translational direction and a rotational direction.
    Type: Application
    Filed: July 25, 2001
    Publication date: April 11, 2002
    Inventors: Yasuyuki Momoi, Toshihiko Horiuchi, Kazuhiro Umekita, Masahiko Inoue, Takao Konno, Masaharu Sugano, Yuuji Tadano
  • Patent number: 6341258
    Abstract: A shaking response is estimated with high precision by performing a shaking test f or combining and estimating a shaking characteristic of a partial structure of an object under test obtained through a shaking test and a shaking response of the whole structure which is numerically modeled. In a shaking test apparatus and method, a structure under test comprises a partial structure and a numerical model which is virtually connected to the partial structure. First, a vibration model corresponding to the partial structure is assumed, the numerical model and the vibration model are combined to construct an overall-system model, and then the vibration response of the overall-system model is calculated. On the basis of the calculation result and the signal input from a waveform oscillator, the partial structure is shaken by using a shaker.
    Type: Grant
    Filed: March 15, 2000
    Date of Patent: January 22, 2002
    Assignee: Hitachi, Ltd.
    Inventors: Masahiko Inoue, Toshihiko Horiuchi, Yasuyuki Momoi, Takao Konno, Wataru Yamagishi
  • Patent number: 5555179
    Abstract: A computer-implemented control method and a control apparatus of factory automation system having a cell formed by a plurality of working machines including at least one automated machine to execute a series of works in accordance with a control program. From a cell control program including specifications of working of entire cell that is input to the computer, information relating to working sequence of a plurality of working machines and information about control of inputs and outputs of a plurality of working machines are described, the specifications and informations are extracted by the computer. On the basis of the extracted information, a sequence control program by which control of the working sequence of a plurality of working machines and control of inputs and outputs of a plurality of working machines is generated by the computer are described.
    Type: Grant
    Filed: September 2, 1994
    Date of Patent: September 10, 1996
    Assignee: Hitachi, Ltd.
    Inventors: Masahiro Koyama, Norihisa Miyake, Hiroshi Sakairi, Shizuko Hattori, Yasuyuki Momoi, Tsutomu Fujimoto, Tsuyoshi Kai