Patents by Inventor Yasuyuki Saguchi
Yasuyuki Saguchi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
-
Patent number: 8928749Abstract: A position measuring system includes a marker set having three or more basic markers that are known in positional relation and attached to a second area of an object which contains a first area having an acting portion and the second area continuous with the first area, an image-taking device having a two-dimensional image-taking element that takes an image of the marker set, a recording device that records the coordinate of the acting portion with respect to the marker set, and a processing device that calculates the three-dimensional position of the acting portion by using the position and angle of the marker set determined on the basis of the image of the marker set taken by the image-taking device and the coordinate of the acting portion with respect to the marker set that is recorded in the recording device.Type: GrantFiled: November 16, 2009Date of Patent: January 6, 2015Assignee: Fuji Xerox Co., Ltd.Inventors: Hiroyuki Hotta, Kazutoshi Yatsuda, Yasuyuki Saguchi
-
Publication number: 20120268363Abstract: An image processing apparatus includes an imaged image acquiring unit, an identifying unit, an acquiring unit, and a display control unit. The imaged image acquiring unit acquires an imaged image. The identifying unit identifies an object imaged in the imaged image. The acquiring unit acquires image information on the object stored in association with the object identified by the identifying unit. The display control unit displays at least part of an image area of an object image based on the image information on the object.Type: ApplicationFiled: November 4, 2011Publication date: October 25, 2012Applicant: FUJI XEROX CO., LTD.Inventors: Tetsuya KIMURA, Kengo SHINOZAKI, Shoji SAKAMOTO, Yasuyuki SAGUCHI, Hideki BABA
-
Patent number: 8170329Abstract: A position measuring system includes: an image capturing unit that captures reference points provided on an object, the reference points composed of at least four first reference points provided respectively at vertices of a polygon or at vertices and a barycenter of a polygon and at least one second reference point provided so as to have a specific positional relationship with respect to the first reference points; an identification unit that identifies images of the first reference points and the second reference point captured by the image capturing unit, on the basis of positional relationships between the images of the first reference points and the second reference point; and a calculation unit that calculates a three-dimensional position and three-axial angles of the object on the basis of positional relationships of the images of the first reference points identified by the identification unit.Type: GrantFiled: March 5, 2009Date of Patent: May 1, 2012Assignee: Fuji Xerox Co., Ltd.Inventors: Yasuji Seko, Hiroyuki Hotta, Yasuyuki Saguchi
-
Publication number: 20100328451Abstract: A position measuring system includes a marker set having three or more basic markers that are known in positional relation and attached to a second area of an object which contains a first area having an acting portion and the second area continuous with the first area, an image-taking device having a two-dimensional image-taking element that takes an image of the marker set, a recording device that records the coordinate of the acting portion with respect to the marker set, and a processing device that calculates the three-dimensional position of the acting portion by using the position and angle of the marker set determined on the basis of the image of the marker set taken by the image-taking device and the coordinate of the acting portion with respect to the marker set that is recorded in the recording device.Type: ApplicationFiled: November 16, 2009Publication date: December 30, 2010Applicant: FUJI XEROX Co., Ltd.Inventors: Hiroyuki HOTTA, Kazutoshi Yatsuda, Yasuyuki Saguchi
-
Publication number: 20100332182Abstract: An operation determining system includes: a position measuring unit that measures a position of a moving object with time; and an operation determining unit that determines that there is an operation of the object in a detection area when an intersecting angle between entering and exiting vectors of the object with respect to the detection area, the intersecting angle being calculated based on the position of the object measured by the position measuring unit, is equal to or higher than a certain value.Type: ApplicationFiled: December 4, 2009Publication date: December 30, 2010Applicant: FUJI XEROX Co., Ltd.Inventors: Kazutoshi YATSUDA, Hiroyuki Hotta, Yasuyuki Saguchi
-
Publication number: 20100231709Abstract: A position measurement system includes a marker set attached to an object, a camera and a computing apparatus. The marker set includes three or more directed basic markers each having a shape indicating a direction. The directed basic markers are oriented in directions toward a specific point. A positional relationship among the directed basic markers is known. The camera includes a two-dimensional imaging device configured to take an image of the marker set. The computing apparatus computes at least one of a position of the object and an angle of the object based on an image, taken by the camera, of the directed basic markers, which are oriented in the directions toward the specific point.Type: ApplicationFiled: August 21, 2009Publication date: September 16, 2010Applicant: Fuji Xerox Co., Ltd.Inventors: Yasuji Seko, Hiroyuki Hotta, Yasuyuki Saguchi
-
Patent number: 7791736Abstract: A position measurement system for measuring positional coordinates of a point under measurement includes a first noise removal unit, a parameter determination unit and a second noise removal unit. The first noise removal unit removes noise from the measured positional coordinates to acquire first positional coordinate values. The parameter determination unit determines a noise removal parameter on a basis of the first positional coordinate values. The second noise removal unit again removes noise from the first positional coordinate values with using the noise removal parameter, to acquire second positional coordinate values.Type: GrantFiled: July 24, 2009Date of Patent: September 7, 2010Assignee: Fuji Xerox Co., Ltd.Inventors: Yasuji Seko, Yoshinori Yamaguchi, Yasuyuki Saguchi
-
Patent number: 7742895Abstract: The position measurement system includes: an image capturing unit capturing first reference points which are three reference points on a plane arranged on a target and whose positional relation with each other is specified, and a second reference point which is a single reference point at a distance away from the plane and whose positional relation with the first reference points is specified; an identifying unit identifying images of the first and second reference points based on the positional relation among the images; and a calculating unit calculating a three-dimensional position and triaxial angles of the target based on the positional relation between the images of the first and second reference points. The calculating unit specifies the plane including the first reference points on the target from the images of the first reference points and a normal direction of the plane according to the image of the second reference point.Type: GrantFiled: April 8, 2008Date of Patent: June 22, 2010Assignee: Fuji Xerox Co., Ltd.Inventors: Yasuji Seko, Hiroyuki Hotta, Yasuyuki Saguchi
-
Publication number: 20100014750Abstract: A position measuring system includes: an image capturing unit that captures reference points provided on an object, the reference points composed of at least four first reference points provided respectively at vertices of a polygon or at vertices and a barycenter of a polygon and at least one second reference point provided so as to have a specific positional relationship with respect to the first reference points; an identification unit that identifies images of the first reference points and the second reference point captured by the image capturing unit, on the basis of positional relationships between the images of the first reference points and the second reference point; and a calculation unit that calculates a three-dimensional position and three-axial angles of the object on the basis of positional relationships of the images of the first reference points identified by the identification unit.Type: ApplicationFiled: March 5, 2009Publication date: January 21, 2010Applicant: Fuji Xerox Co., Ltd.Inventors: Yasuji SEKO, Hiroyuki Hotta, Yasuyuki Saguchi
-
Publication number: 20090310142Abstract: A position measurement system for measuring positional coordinates of a point under measurement includes a first noise removal unit, a parameter determination unit and a second noise removal unit. The first noise removal unit removes noise from the measured positional coordinates to acquire first positional coordinate values. The parameter determination unit determines a noise removal parameter on a basis of the first positional coordinate values. The second noise removal unit again removes noise from the first positional coordinate values with using the noise removal parameter, to acquire second positional coordinate values.Type: ApplicationFiled: July 24, 2009Publication date: December 17, 2009Applicant: Fuji Xerox Co., Ltd.Inventors: Yasuji Seko, Yoshinori Yamaguchi, Yasuyuki Saguchi
-
Patent number: 7583388Abstract: A position measurement system for measuring positional coordinates of a point under measurement includes a first noise removal unit, a parameter determination unit and a second noise removal unit. The first noise removal unit removes noise from the measured positional coordinates to acquire first positional coordinate values. The parameter determination unit determines a noise removal parameter on a basis of the first positional coordinate values. The second noise removal unit again removes noise from the first positional coordinate values with using the noise removal parameter, to acquire second positional coordinate values.Type: GrantFiled: June 12, 2006Date of Patent: September 1, 2009Assignee: Fuji Xerox Co., Ltd.Inventors: Yasuji Seko, Yoshinori Yamaguchi, Yasuyuki Saguchi
-
Publication number: 20090070065Abstract: The position measurement system includes: an image capturing unit capturing first reference points which are three reference points on a plane arranged on a target and whose positional relation with each other is specified, and a second reference point which is a single reference point at a distance away from the plane and whose positional relation with the first reference points is specified; an identifying unit identifying images of the first and second reference points based on the positional relation among the images; and a calculating unit calculating a three-dimensional position and triaxial angles of the target based on the positional relation between the images of the first and second reference points. The calculating unit specifies the plane including the first reference points on the target from the images of the first reference points and a normal direction of the plane according to the image of the second reference point.Type: ApplicationFiled: April 8, 2008Publication date: March 12, 2009Applicant: FUJI XEROX CO., LTD.Inventors: Yasuji Seko, Hiroyuki Hotta, Yasuyuki Saguchi
-
Publication number: 20070133006Abstract: A position measurement system for measuring positional coordinates of a point under measurement includes a first noise removal unit, a parameter determination unit and a second noise removal unit. The first noise removal unit removes noise from the measured positional coordinates to acquire first positional coordinate values The parameter determination unit determines a noise removal parameter on a basis of the first positional coordinate values. The second noise removal unit again removes noise from the first positional coordinate values with using the noise removal parameter, to acquire second positional coordinate values.Type: ApplicationFiled: June 12, 2006Publication date: June 14, 2007Applicant: FUJI XEROX CO., LTD.Inventors: Yasuji Seko, Yoshinori Yamaguchi, Yasuyuki Saguchi