Patents by Inventor Yatindra NATH

Yatindra NATH has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 12045213
    Abstract: A method or system for monitoring data quality issues in non-native data over disparate computer networks is described. The system may monitor incoming data entries of non-native data over a disparate computer network. The system may generate for display, on a user interface, a recommendation based on a difference between a number of the first plurality of data entries and a dynamic threshold.
    Type: Grant
    Filed: January 20, 2022
    Date of Patent: July 23, 2024
    Assignee: Capital One Services, LLC
    Inventors: Lokesh S. Tulshan, Kukumina Pradhan, Akhil Jain, Mohammad Nayaz Arshad, Yatindra Nath
  • Publication number: 20230169051
    Abstract: A method or system for monitoring data quality issues in non-native data over disparate computer networks is described. The system may monitor incoming data entries of non-native data over a disparate computer network. The system may generate for display, on a user interface, a recommendation based on a difference between a number of the first plurality of data entries and a dynamic threshold.
    Type: Application
    Filed: January 20, 2022
    Publication date: June 1, 2023
    Applicant: Capital One Services, LLC
    Inventors: Lokesh S. TULSHAN, Kukumina PRADHAN, Akhil JAIN, Mohammad Nayaz ARSHAD, Yatindra NATH
  • Publication number: 20210279215
    Abstract: A system for providing data quality management may include a processor configured to execute instructions to: extract a plurality of first data elements from a data source; generate a data profile based on the first data elements; automatically create a first set of rules based on the first data elements and the data profile, the first set of rules assessing data quality according to a threshold; generate a second set of rules based on the first data elements and the first set of rules; extract a plurality of second data elements; assess the second data elements based on a comparison of the second data elements to the second set of rules; detect defects based on the comparison; analyze data quality according to the detected defects; and transmit signals representing the data quality analysis to a client device for display to a user.
    Type: Application
    Filed: May 21, 2021
    Publication date: September 9, 2021
    Applicant: Capital One Services, LLC
    Inventors: Yatindra NATH, Ankur Garg, Rajeev Tiwari, Pranav Vrat, Amit Mohanty
  • Patent number: 11030167
    Abstract: A system for providing data quality management may include a processor configured to execute instructions to: extract a plurality of first data elements from a data source; generate a data profile based on the first data elements; automatically create a first set of rules based on the first data elements and the data profile, the first set of rules assessing data quality according to a threshold; generate a second set of rules based on the first data elements and the first set of rules; extract a plurality of second data elements; assess the second data elements based on a comparison of the second data elements to the second set of rules; detect defects based on the comparison; analyze data quality according to the detected defects; and transmit signals representing the data quality analysis to a client device for display to a user.
    Type: Grant
    Filed: January 18, 2019
    Date of Patent: June 8, 2021
    Assignee: Capital One Services, LLC
    Inventors: Yatindra Nath, Ankur Garg, Rajeev Tiwari, Pranav Vrat, Amit Mohanty
  • Publication number: 20190155797
    Abstract: A system for providing data quality management may include a processor configured to execute instructions to: extract a plurality of first data elements from a data source; generate a data profile based on the first data elements; automatically create a first set of rules based on the first data elements and the data profile, the first set of rules assessing data quality according to a threshold; generate a second set of rules based on the first data elements and the first set of rules; extract a plurality of second data elements; assess the second data elements based on a comparison of the second data elements to the second set of rules; detect defects based on the comparison; analyze data quality according to the detected defects; and transmit signals representing the data quality analysis to a client device for display to a user.
    Type: Application
    Filed: January 18, 2019
    Publication date: May 23, 2019
    Applicant: Capital One Services, LLC
    Inventors: Yatindra Nath, Ankur Garg, Rajeev Tiwari, Pranav Vrat, Amit Mohanty
  • Patent number: 10185728
    Abstract: A system for providing data quality management may include a processor configured to execute instructions to: extract a plurality of first data elements from a data source; generate a data profile based on the first data elements; automatically create a first set of rules based on the first data elements and the data profile, the first set of rules assessing data quality according to a threshold; generate a second set of rules based on the first data elements and the first set of rules; extract a plurality of second data elements; assess the second data elements based on a comparison of the second data elements to the second set of rules; detect defects based on the comparison; analyze data quality according to the detected defects; and transmit signals representing the data quality analysis to a client device for display to a user.
    Type: Grant
    Filed: December 19, 2017
    Date of Patent: January 22, 2019
    Assignee: CAPITAL ONE SERVICES, LLC
    Inventors: Yatindra Nath, Ankur Garg, Rajeev Tiwari, Pranav Vrat, Amit Mohanty
  • Publication number: 20180173733
    Abstract: A system for providing data quality management may include a processor configured to execute instructions to: extract a plurality of first data elements from a data source; generate a data profile based on the first data elements; automatically create a first set of rules based on the first data elements and the data profile, the first set of rules assessing data quality according to a threshold; generate a second set of rules based on the first data elements and the first set of rules; extract a plurality of second data elements; assess the second data elements based on a comparison of the second data elements to the second set of rules; detect defects based on the comparison; analyze data quality according to the detected defects; and transmit signals representing the data quality analysis to a client device for display to a user.
    Type: Application
    Filed: December 19, 2017
    Publication date: June 21, 2018
    Inventors: Yatindra NATH, Ankur Garg, Rajeev Tiwari, Pranav Vrat, Amit Mohanty