Abstract: This invention relates to a process and a device of high voltage test with detecting function for short or open circuits comprises carying out test of short or open circuits with low voltage for an object prior to a high voltage test, checking forrner step properly and then carrying out high voltage test to improve the life time of devices and test points, which also can improve the reliability of test.

Abstract: The invention disclosed a method and circuit for conducting an AC offset current compensation and a testing device using the same, capable of providing a high voltage measurement that fulfils a voltage resistance condition of safety regulation, so that it is possible to achieve the requirement of increasing the test accuracy on voltage resistance by controlling the magnitude, phase and offset current compensation of the voltage output.

Abstract: The invention relates to a floating impedance high voltage simultaneously test circuit, using two or more sets of conditions capable of simultaneously outputting different source signals to perform simultaneously the high voltage test and the low voltage DC impedance test, so that it is possible to simplify the test procedure of electric products, to reduce the poor yield of the facility, to reduce the test time, and to greatly increase the production efficiency; and to a method of performing the test.